• Title/Summary/Keyword: barrier films

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Breakdown Characteristics for Insulation Design of HTS Transformer in Liquid Nitrogen

  • J.M. Joung;S.M. Baek;Kim, S.H.
    • Progress in Superconductivity and Cryogenics
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    • v.5 no.3
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    • pp.38-42
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    • 2003
  • HTS transformer is promising one of HTS power applications to be commercialized in the near future. To realize the applications, insulation technology in the coolant, liquid nitrogen, should be established. So breakdown characteristics should be considered at insulation components; turn-to-turn, layer-to-layer, winding-to-winding, were investigated. Firstly breakdown strengths of Kapton films were compared with Kraft paper these are as turn insulator. And next the characteristics of surface flashover on FRP were measured and the influence on breakdown strength of bubble generated with joule heat was discussed with the shape of cooling channel between layers. Finally barrier effect at winding-to-winding was discussed.

Current-voltage characteristics change of n-type Si films by electric field effect (전장 효과에 의한 n-Si 박막의 전류-전압 특성 변화)

  • 김윤석;김성관;홍승범;노광수
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2003.11a
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    • pp.133-133
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    • 2003
  • 최근에 강유전체 매체와 원자력 현미경 (Atomic Force Microscopy, AFM)을 이용한 초고밀도 정보 저장 장치에 대한 연구가 활발히 진행되고 있다. 이와 아울러 나도 크기의 도메인에 대하 연구에 있어서 PZT 박막의 분극 방향에 따른 SrRuO$_3$의 저항 변화를 AFM 탐침을 이용하여 감지하는 방법을 제안하였다. 본 연구에서는 Metal tip/semiconductor/barrier oxide/ferroelectric 구조에서 강유전체 분극에 의한 저항 변화의 가능성을 실험하고자, 이와 등가 구조인 Pt tip/n-Si/SiO$_2$ 구조에서 Pt 탐침과 반도체 층 사이의 I-V 특성을 측정함으로써, 게이트 전압에 따른 반도체 층의 저항변화에 대해서 분석해 보았다. 그 결과 게이트 전압에 따라서 과밀 지역 (accumulation layer)과 공핍 지역 (depletion layer)이 형성됨에 따라서 반도체 층의 정항이 변하여 I-V 특성이 변하게 됨을 관찰하였으며, 이 결과로부터 분극 방향에 따라서도 반도체 층의 저항이 변할 수 있음을 알 수 있었다.

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Effects of Heterostructure Electrodes on the Reliability of Ferroelectric PZT Thin Film (강유전체 PZT박막의 신뢰도에 미치는 헤테로구조 전극의 영향에 대한 연구)

  • Lee, Byoung-Soo;Lee, Bok-Hee;Lee, Duch-Chool
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.52 no.1
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    • pp.14-19
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    • 2003
  • The effect of the Pt electrode and the $Pt-IrO_2$ hybrid electrode on the performance of ferroelectric device was investigated. The modified Pt thin films with non-columnar structure significantly reduced the oxidation of TiN diffusion barrier layer, which rendered it possible to incorporate the simple stacked structure of Pt/TiN/poly-Si plug. When a $Pt-IrO_2$ hybrid electrode is applied, PZT thin film properties are influenced by the thickness and the partial coverage of the electrode layers. The optimized $Pt-IrO_2$ hybrid electrode significantly enhanced the fatigue properties of the PZT thin film with minimal leakage current.

On the Characteristics of Oxide Film on Gap (GaP 산화막 특성에 관하여)

  • Park, J.W.;Moon, D.C.;Kim, S.T.
    • Proceedings of the KIEE Conference
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    • 1988.11a
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    • pp.193-195
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    • 1988
  • The native oxide films were thermally and anodically formed on the n-GaP substrates grown by SSD method and measured this oxide thickness and the chemical composition and the electrical properties with formation condition. The chemical composition of themally oxidized GaP film was composed of mostly $GaPO_4$ at temperature below $800^{\circ}C$ and mostly $\beta-Ga_{2}O_{3}$ above $800^{\circ}C$. But The chemical composition of anodically oxidized GaPfilm was composed of the mixture of $Ga_{2}O_{3}$ and $P_{2}O_{5}$. The barrier height of Al/oxide/n-Gap which was formed at $700^{\circ}C$ by thermal oxidation method were 1.10eV, 1.03eV in Current-Voltage measurement. Interface charge density were $4{\times}10^{12}q(C/cm^2)$ and $3{\times}10^{12}q(C/cm^2)$ in Capacitance-Voltage measurement respectively.

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Study on permeability improved multi-layer encapsulation on Ethylene Terephthalate(PET) (PET 기판위의 투습율 향상을 위한 다층 보호막에 관한 연구)

  • Han, Jin-Woo;Kang, Hee-Jin;Kim, Jong-Yeon;Kang, Dong-Hun;Han, Jung-Min;Oh, Yong-Cheul;Seo, Dae-Shik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.313-314
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    • 2006
  • In this paper, the inorganic-organic thin film encapsulation layer was newly adopted to protect the organic layer from moisture and oxygen. Using the electron beam, Sputter and Spin-Coater system, the various kinds of inorganic and organic thin-films were deposited onto the Ethylene Terephthalate(PET) and their interface properties between organic and inorganic layer were investigated Results indicates that the SiON/PI/SiON/PI/PET barrier coatings have high potential for flexible organic light-emitting diode(OLED) application.

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Protein-based bio-plastics: formulation, processing, properties and applications

  • Guilbert Stephane;Gontard Nathalie;Morel Marie Helene
    • Proceedings of the Polymer Society of Korea Conference
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    • 2006.10a
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    • pp.357-357
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    • 2006
  • Many industrial sources of proteins can be used as raw materials to produce films, molded materials, and various hollow items either by "casting" techniques or by "thermoplastic processing". Combining proteins with natural fibbers, paper or biodegradable polyesters is very promising to form biodegradable composites witch take advantage of the barrier and mechanical properties of each component. Using nano-fillers to form nanocomposites has also been shown to be interesting to improve properties. Production, with low transformation cost, of protein based materials to form biodegradable materials with controlled functional properties for food uses, medical uses, packaging, agriculture, controlled release systems, etc. is discussed.

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ZnO/ITO anode for organic electro-luminescence devices

  • Jeong, S.H.;Kho, S.;Jung, D.;Boo, J.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.885-886
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    • 2003
  • A bilayer is used as an anode electrode for organic electroluminescent devices. The bilayer consist of an ultrathjn ZnO layer adjacent to an hole-transporting layer and an Indium tin oxide(ITO) outerlayer. We tried to bring low the barrier between the devices as deposited ZnO films on ITO substrates. We fabricated the organic EL structure consisted of Al as cathode, $Al_{2}O_{3}$ as electro transport layer, Alq3 as luminously layer, triphenyl diamine(TPD) as hole transport layer and ZnO(l nm )/ITO(l50 nm) as anode. The result of this experiment was not good compared with the case of using ITO, Nevertheless, at this structure we obtained the lowest turn-on voltage as the value of 19 V and the good brightness (6200 $cd/m^{2}$) of the emission light from the devices. Then the quantum efficiency was to be 1.0%.

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Study on the Oxidation Resistance of Ti-Al-N Coating Layer (Ti-Al-N코팅층의 내산화 특성에 관한 연구)

  • 김충완;김광호
    • Journal of the Korean Ceramic Society
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    • v.34 no.5
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    • pp.512-518
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    • 1997
  • The high temperature oxidation behaviors of titanium nitride films prepared by PACVD technique were studied in the temperature range of from 50$0^{\circ}C$ to 80$0^{\circ}C$ under air atmosphere. Ti0.88Al0.12N film, which showed the excellent microhardness from the previous work, was investigated on its oxidation resistance compared with pure TiN film. Ti-Al-N film showed superior oxidation resistance up to $700^{\circ}C$, whereas TiN film was fast oxidized into rutile TiO2 crystallites from at 50$0^{\circ}C$. It was found that an amorphous layer having AlxTiyOz formula was formed on the surface region due to outward diffusion of Al ions at the initial stage of oxidation. The amorphous oxide layer played a role as a barrier against oxygen diffusion, protected the remained nitride layer from further oxidation, and thus, resulted in the high oxidation resistive characteristics of Ti-Al-N film.

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Electrical Characteristics of Devices with Material Variations of PMD-1 Layers (PMD-1 층의 물질변화에 따른 소자의 전기적 특성)

  • Seo, Yonq-Jin;Kim, Sang-Yong;Yu, Seok-Bin;Kim, Tae-Hyung;Kim, Chang-Il;Chang, Eui-Goo
    • Proceedings of the KIEE Conference
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    • 1998.07d
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    • pp.1327-1329
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    • 1998
  • It is very important to select superior inter-layer PMD(Pre Metal Dielectric) materials which can act as penetration barrier to various impurities created by CMP processes. In this paper, hot carrier degradation and device characteristics were studied with material variation of PMD-1 layers, which were split by LP-TEOS, SR-Oxide, PE-Oxynitride, PE-Nitride, PE-TEOS films. It was observed that the oxynitride and nitride using plasma was greatly decreased in hot carrier effect in comparison with silicon oxide. Consequently, silicon oxide turned out to be a better PMD-1 material than PE-oxynitride and PE-nitride. Also, LP-TEOS film was the best PMD-1 material Among the silicon oxides.

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Dry Etching Characteristic of TiN Thin Films using Inductively Coupled Plasma (TiN 박막의 건식 식각 특성)

  • Park, Jung-Soo;Kim, Chang-Il
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.383-383
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    • 2010
  • TiN is one of the mostly used barrier materials in copper metallization because of low friction coefficient and superior electrical properties. We need to investigate for the etching characteristic of TiN. In this study, we investigated about etching characteristic of TiN using $BCl_3$/Ar inductively coupled plasma system. The etch rate was measured by a depth pro filer. The chemical etching reactions of the TiN surface was investigated X-ray photoelectron spectroscopy.

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