• 한국정보기술학회 영문논문지
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• 제8권2호
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• pp.59-67
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• 2018

The minimum power supply voltage of a typical bandgap current reference (BGCR) is limited by operating temperature and input common mode range (ICMR) of a feedback amplifier. A new BGCR using a bandgap voltage generator (BGVG) is proposed to minimize the effect of temperature, supply voltage, and process variation. The BGVG is designed with proportional to absolute temperature (PTAT) characteristic, and a feedback amplifier is designed with weak-inversion transistors for low voltage operation. It is verified with a $0.18-{\mu}m$ CMOS process with five corners for MOS transistors and three corners for BJTs. The proposed circuit is superior to other reported current references under temperature variation from $-40^{\circ}C$ to $120^{\circ}C$ and power supply variation from 1.2 V to 1.8 V. The total power consumption is $126{\mu}W$ under the conditions that the power supply voltage is 1.2 V, the output current is $10{\mu}A$, and the operating temperature is $20^{\circ}C$.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.186-187
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• 2007

In this work, a temperature stable PWM(Pulse width modulation) circuit is proposed. The designed PWM circuit has a temperature dependent current source and a temperature independent voltage to compensate electrical characteristics with operating temperature. The variation of driving current is from about 4% to -6% in the temperature range $0^{\circ}C\;to\;70^{\circ}C$ compared to the current at the room temperature. The variation of bandgap voltage reference is from about 1.3% to -0.2% with temperature when the supply voltage is 3.3 volts. From simulation results, the variation of output pulse width is less than from 0.86% to -0.38% in the temperature range $0^{\circ}C\;to\;70^{\circ}C$.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제52권10호
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• pp.425-430
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• 2003

A CMOS Voltage-Controlled Oscillator(VCO) for application at temperature stable system is designed. The VCO consists of bandgap voltage reference circuit, comparator, and voltage-to-current converter and the VCO has a temperature stable characteristics. The difference between simulated and calculated values is less than about 5% in output characteristics when the input voltage range is from 1V to 3.25V. The CMOS VCO has error less than about $\pm$0.85% in the temperature range from $-25^{\circ}C$ to $75^{\circ}C$.

• 한국통신학회:학술대회논문집
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• 한국통신학회 2004년도 추계종합학술대회 논문 초록집
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• pp.229-229
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• 2004

• JSTS:Journal of Semiconductor Technology and Science
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• 제17권4호
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• pp.568-576
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• 2017

This paper presents a clock and data recovery circuit with an adaptive loop bandwidth calibration scheme and the idle power saved frequency acquisition. The loop bandwidth calibration adaptively controls injection currents of the main loop with a trimmable bandgap reference circuit and trains the VCO to operate in the linear frequency control range. For stand-by power reduction of the phase detector, a clock gating circuit blocks 8-phase clock signals from the VCO and cuts off the current paths of current mode D-flip flops and latches during the frequency acquisition. 77.96% reduction has been accomplished in idle power consumption of the phase detector. In the jitter experiment, the proposed scheme reduces the jitter tolerance variation from 0.45-UI to 0.2-UI at 1-MHz as compared with the conventional circuit.

• Transactions on Electrical and Electronic Materials
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• 제5권2호
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• pp.71-75
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• 2004

This paper proposes a new bandgap reference (BGR) circuit which takes advantage of a cascode current mirror biasing to reduce the V$\_$ref/ variation, and sizing technique, which utilizes two related ratio numbers k and N, to reduce the PNP BJT area. The proposed BGR is designed and fabricated on a test chip with a goal to provide a reference voltage to the 10 bit A/D(4-4-4 pipeline architecture) converter of the CMOS Active Pixel Sensor (APS) imager to be used in X-ray imaging. The basic temperature variation effect on V$\_$ref/ of the BGR has a maximum delta of 6 mV over the temperature range of 25$^{\circ}C$ to 70$^{\circ}C$. To verify that the proposed BGR has radiation hardness for the X-ray imaging application, total ionization dose (TID) effect under Co-60 exposure conditions has been evaluated. The measured V$\_$ref/ variation under the radiation condition has a maximum delta of 33 mV over the range of 0 krad to 100 krad. For the given voltage, temperature, and radiation, the BGR has been satisfied well within the requirement of the target 10 bit A/D converter.

• 한국정보통신학회논문지
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• 제12권1호
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• pp.137-142
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• 2008

본 논문에서는 $Low-V_T$ 트랜지스터가 필요 없는 로직공정으로 Parasitic NPN BJT를 이용하여 저 전압에서 동작 가능한 밴드갭 기준전압 발생기 회로를 제안하였다. $0.18{\mu}m$ triple-well 공정을 사용한 BGR회로를 측정 한 결과 VREF의 평균전압은 0.72V $3{\sigma}$는 45.69mV로 양호하게 측정되었다.

• 한국정보통신학회:학술대회논문집
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• 한국정보통신학회 2013년도 추계학술대회
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• pp.375-378
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• 2013

본 논문에서는 EEPROM이나 MTP 등의 NVM 메모리 IP 설계에 필요로 하는 PVT(Process-Voltage-Temperature) 변동에 둔감한 기준전압(Reference Voltage) 회로를 설계하였다. 매그나칩반도체 $0.18{\mu}m$ EEPROM 공정을 이용하여 설계된 BGR(Bandgap Reference Voltage) 회로는 wide swing을 갖는 캐스코드 전류거울 (cascode current-mirror) 형태의 저전압 밴드갭 기준전압발생기 회로를 사용하였으며, PVT 변동에 둔감한 기준전압 특성을 보이고 있다. 최소 동작 전압은 1.43V이고 VDD 변동에 대한 VREF 민감도(sensitivity)는 0.064mV/V이다. 그리고 온도 변동에 대한 VREF 민감도는 $20.5ppm/^{\circ}C$이다. 측정된 VREF 전압은 평균 전압이 1.181V이고 $3{\sigma}$는 71.7mV이다.

• 전자공학회논문지
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• 제52권2호
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• pp.106-111
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• 2015

일반적으로 기준전압 생성기는 쌍안정성을 가지므로 이를 올바른 상태에서 동작시키기 위해서는 적절한 시동회로가 필요하다. 본 논문에서는 저전압 기준전압 발생기를 위한 새로운 시동회로를 제안한다. 제안한 시동회로는 기준전압발생기의 상태를 결정하기 위하여 기준전압 발생기의 BJT에 흐르는 전류를 측정한다. 기준전압발생기가 올바른 상태에 있을 때 이 전류가 가지는 값은 잘 정의되므로 이를 통하여 회로의 상태를 신뢰성 있게 결정할 수 있다. 전류는 내부에 오프셋 전압을 갖는 비교기를 이용하여 측정하였다. 130nm CMOS 공정을 이용하여 설계를 하였으며, 레이아웃에서 추출한 기생 성분을 포함하는 Monte-Carlo 시뮬레이션을 통해 회로의 성능을 검증 하였다. 제안된 시동회로를 사용하는 기준전압발생기에 850mV 이상의 전원 전압이 가해질 경우, 소자에 미스매치가 있더라도 안정적으로 기준전압 생성기가 시동하는 것을 확인하였다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제16권6호
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• pp.728-735
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• 2016

A 70 MHz temperature-compensated on-chip CMOS relaxation oscillator for mobile display driver ICs is proposed to reduce frequency variations. The proposed oscillator compensates for frequency variation with respect to temperature by adjusting the bias currents to control the change in delay of comparators with temperature. A bandgap reference (BGR) is used to stabilize the bias currents with respect to temperature and supply voltages. Additional temperature compensation for the generated frequency is achieved by optimizing the resistance in the BGR after measuring the output frequency. In addition, a trimming circuit is implemented to reduce frequency variation with respect to process. The proposed relaxation oscillator is fabricated using 45 nm CMOS technology and occupies an active area of $0.15mm^2$. The measured frequency variations with respect to temperature and supply voltages are as follows: (i) ${\pm}0.23%$ for changes in temperature from -30 to $75^{\circ}C$, (ii) ${\pm}0.14%$ for changes in $V_{DD1}$ from 2.2 to 2.8 V, and (iii) ${\pm}1.88%$ for changes in $V_{DD2}$ from 1.05 to 1.15 V.