• Journal of the Korean Data and Information Science Society
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• v.15 no.4
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• pp.935-943
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• 2004

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. A accelerated life test is extended to M-level stress accelerated life test with k-stress variables. The optimal design for Weibull distribution is studied with k-stress variables.

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.21-49
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• 2016

Many mechanical, electrical and electronic products have more than one performance characteristics (PCs). For example the performance degradation of rubidium discharge lamps can be characterized by the rubidium consumption or the decreasing intensity the lamp. The product may degrade due to all the PCs which may be independent or dependent. This paper deals with the design of optimal bivariate step-stress partially accelerated degradation test (PADT) with degradation paths modelled by gamma process. The dependency between PCs has been modelled through Frank copula function. In partial step-stress loading, the unit is tested at usual stress for some time, and then the stress is accelerated. This helps in preventing over-stressing of the test specimens. Failure occurs when the performance characteristic crosses the critical value the first time. Under the constraint of total experimental cost, the optimal test duration and the optimal number of inspections at each intermediate stress level are obtained using variance optimality criterion.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.6
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• pp.67-74
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• 1995

This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.

• Proceedings of the KSR Conference
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• 2006.11b
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• pp.624-630
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• 2006

This paper studies a modeling to demonstrate predicted reliability of the train control system components by performing an accelerated stress test. There are two tests for demonstrating predicted reliability; test run at the whole system level, and accelerated life test and accelerated stress test at the component level. In this paper, we imposed accelerated stress on the system and studied the train control system modeling for the accelerated stress test, which demonstrates predicted reliability according to whether or not the equipment is operating. Reliability of train control system consisting of electronic components varies drastically according to temperature so we considered the Arrhenius equation and the activation energy of electronic components. We also used reliability modeling with weighted average and calculated time necessary to complete the accelerated stress test on train control system.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.129-135
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• 2017

Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.85-105
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• 2016

In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

• Journal of Applied Reliability
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• v.7 no.2
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• pp.57-72
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• 2007

This paper suggests an approach for using ALTA 7 PRO to design accelerated life test plans. Conducting a accelerated life test requires finding life distributions at different stress levels and determining an appropriate life-stress relationship. Moreover, a test plan needs to be developed. In its optimal test plan, stress levels are determined and the proportions of test units are assigned at each stress level so that asymptotic variance of the maximum likelihood estimate of a (log) percentile of the life distribution at the design stress is minimized. Examples are presented for usage.

• The Korean Journal of Applied Statistics
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• v.9 no.1
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• pp.53-73
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• 1996

This paper compares two accelerated life for Weibull distribution. One is the optimum constant stress accelerated life test which minimizes the asymptotic variance of maximum likelihood estimator of a specified quantile at design stress, and the other is corresponding simple step stress test. The models and optimum designs of constant stress and step stress tests are reviewed. Behaviors of asymptotic variances, effects of design parameters to optimum tests, and expected numbers of failures and expected test times of the two tests are investigated. The efficiency of step stress test relative to constant stress test is studied in terms of variance ratio, and robustness to preestimates of design parameters are investigated.

• International Journal of Reliability and Applications
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• v.15 no.1
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.129-137
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• 2004

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.