• Macromolecular Research
• /
• 제14권2호
• /
• pp.166-172
• /
• 2006

This is a short review article of our recent studies on the ATP-induced, allosteric conformational transition of the chaperonin GroEL complex by solution X-ray scattering. We used synchrotron X-ray scattering with a two-dimensional, charge-coupled, device-based X-ray detector to study (1) the specificity of the chaperonin GroEL for its ligand that induced the allosteric transition, and (2) the identification of the allosteric transition of GroEL in its complicated kinetics induced by ATP. Due to the dramatically increased sensitivity of the X-ray scattering technique based on the use of the two dimensional X-ray detector and synchrotron radiation, different allosteric conformational states of GroEL populated under different conditions were clearly distinguished from each other. It was concluded that solution X-ray scattering is an extremely powerful tool for investigating the equilibrium and kinetics of cooperative conformational transitions of oligomeric protein complex, especially when combined with other spectroscopic techniques such as fluorescence spectroscopy.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2009년도 제38회 동계학술대회 초록집
• /
• pp.377-377
• /
• 2010

FINEMET type nanocrystalline materials synthesized by controlled crystallization of amorphous ribbons[1] exhibit excellent soft magnetic properties making them attractive for technological applications. Present work reports the electronic structure studies of Co-substituted FINEMET to get information on the effect of successive Co substitution on local environment around Fe and Co atom by using near edge x-ray absorption fine structure (NEXAFS) and x-ray magnetic circular dichroism (XMCD) measurements. NEXAFS spectroscopy and XMCD measurements have been carried out at Fe $L_{3,2}$ and Co $L_{3,2}$-edges to investigate the chemical states and electronic structure of FINEMET [$(Fe_{100-x}Co_x)_{78}Si_9Nb_3Cu_1Ba$](0$L_{3,2}$-edge reveal that Fe is in 2+ state and in tetrahedral symmetry with other elements. The magnetic properties exhibiting soft magnetic behavior[2] are discussed on the basis of the electronic structure studied through XMCD.

• 한국자기학회지
• /
• 제17권1호
• /
• pp.18-21
• /
• 2007

Pulsed laser deposition(PLD) 박막 증착법을 이용하여 hexagonal $HoMn_{1-x}-Fe_xO_3$(x=0.0, 0.05) 물질을 박막으로 $Pt/Ti/SiO_2/Si$ 기판 위에 증착하였다. 또한 x-ray diffraction(XRD), atomic force microscopy(AFM), scanning electron microscope(SEM), 및 x-ray photoelectron spectroscopy(XPS)를 통하여 박막의 결정학적 및 미세 구조를 분석하였고, conversion electron $M\"{o}ssbauer$ spectroscopy(CEMS)를 이용하여 자기적 특성에 관해 연구하였다. 결정구조는 hexagonal 구조로써 space group이 $P6_3cm$로 분석되었고, single crystal과는 달리 (110) 방향으로 우선 배향성을 가지고 증착되었다. $HoMn_{0.95}Fe_{0.05}O_3$ 박막의 경우 single crystal과 비교했을 때 hexagonal unit cell의 $c_0$ 축은 일정하나 $a_0$ 축은 다소 감소함으로 분석되었다. 이는 박막 증착에 사용된 $Pt/Ti/SiO_2/Si$ 기판과의 lattice mismatch 때문으로 해석된다. Fe가 미량 치환된 $HoMn_{0.95}Fe_{0.05}O_3$ 박막을 상온에서 CEMS 측정을 수행한 결과, $HoMn_{0.95}^{57}Fe_{0.05}O_3$ 분말의 경우 magnetic $T_N$이 72K 부근이므로, 상온에서 doublet absorption spectrum이 관측되었고, 전기사중극자 분열값(quadrupole splitting; ${\Delta}E_Q$)이 $1.62{\pm}0.01mm/s$로 비교적 큰 값을 가짐을 확인하였다.

• 폴리머
• /
• 제33권3호
• /
• pp.263-267
• /
• 2009

d-PMMA(deuterated poly(methyl methacrylate)) 박막 표면의 친수성을 향상시키기 위해 산소 플라즈마에 노출시켰다. 이 때 모든 조건은 동일하며, 플라즈마에 대한 노출 시간만을 0초에서 180초까지 변화를 주어 노출 시간에 대한 영향을 접촉각과 X-ray 반사율 장치, 중성자 반사율 장치, XPS(X-ray photoelectron spectroscopy)를 이용해 조사하였다. 노출 시간이 증가할수록 물 접촉각은 작아지며, 산소의 조성은 커짐을 확인함으로써 산소의 조성이 친수성 향상에 큰 영향을 미치는 것을 확인할 수 있었다. 또한, X-ray 반사율 장치를 이용해 얻은 에칭률을 통해서 d-PMMA 박막에 대한 산소 플라즈마의 노출 시간에 따른 물리적 특성을 연구하였으며, X-ray 반사율과 중성자 반사율, 그리고 XPS 측정 결과로부터 산소와 탄소의 조성뿐만 아니라 수소의 조성까지도 얻음으로써 플라즈마 처리된 박막의 화학적 성질을 보다 자세히 연구할 수 있었다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2009년도 제38회 동계학술대회 초록집
• /
• pp.384-384
• /
• 2010

Zirconium oxynitride films were obtained by r.f. reactive magnetron sputtering of a zirconium target with nitrogen flow rate ranging from 0 to 60 sccm. The phases present in the films were determined by X-ray diffraction (XRD). Measurements of the oxidation state $ZrON_x$ films were investigated by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Thickness of these samples was estimated by spectroscopic ellipsometry (SE) and scanning electron microscopy (SEM). We found that the surface morphology of $ZrON_x$ films measured by atomic force microscopy (AFM) was also depended on the nitrogen gas flow.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
• /
• pp.86-86
• /
• 2016

최근 포항가속기연구소 10A 빔라인에 Scanning Transmission X-ray Microscopy (STXM)가 완성되어 운영 중이다. Soft x-ray imaging 장치로서 기술적으로 Sample scanning 기법이 활용된다. 이는 Zone plate를 통해 집속된 빔이 샘플에 조사되고 검출되는 방식이다. 이러한 Scanning 기법을 활용하고 있는 10A STXM은 기본적으로 흡수분광기법 (x-ray absorption spectroscopy)을 이용하고 있다. 특히, 10A 빔라인 STXM은 최고 20 nm까지 공간분해능이 가능하다는 장점이 있다. 따라서 수십에서 수백 나노미터 크기의 시료들 또는 나노구조에 대한 물리화학적 상태 분석이 쉽게 이루어지고 있다. 주로 시료를 투과하면서 흡수되는 X-선 세기 대비를 맵핑하는 형식의 이미지 데이터와 더불어 X-선의 에너지를 조정함으로써 각 에너지에 해당하는 이미지스택을 결과로 얻게 된다. 이러한 이미지 결과로부터 시료의 나노크기에서 오는 물리화학적 상태를 분석하고 물리에서 바이오까지 다양한 분야의 실험 활용이 가능한 상태다.

• Nuclear Engineering and Technology
• /
• 제42권4호
• /
• pp.426-433
• /
• 2010

The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a $^{57}Co$ radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the $K_{\alpha1}$-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.

• 한국전기전자재료학회논문지
• /
• 제14권8호
• /
• pp.634-639
• /
• 2001

We investigated the etching characteristics of chromium films by using Cl$_2$/O$_2$ gas mixtures with electron cyclotron resonance plasma. In order to examine the chemical etch characteristics of Cr films by using Cl$_2$/O$_2$ gas plasma, we obtained the etch rate with various gas mixing ratios. By X-ray photoelectron spectroscopy, the surface reaction on the chromium films during the etch was examined. From narrow scan analyses of Cr, Cl, and O, it was confirmed that a chromium oxychlorie (CrCl$_{x}$O$_{y}$) layer was formed on the surface by the etch using Cl$_2$/O$_2$ gas mixtures. We observed a new characteristic emission line during the etch of chromium films using Cl$_2$/O$_2$ gas mixtures by an optical emission spectroscopy. It was found that the peak intensity of this emission line had a tendency compatible with the etch rate. The origin of this emission line was discussed in detail. At the same time, the etched profile was also examined by scanning electron microscope.e.e.

• Applied Science and Convergence Technology
• /
• 제24권5호
• /
• pp.151-155
• /
• 2015

The interfacial electronic structure between zinc phthalocyanine (ZnPc) and aluminumdoped zinc oxide (AZO) substrates has been evaluated by ultraviolet photoemission spectroscopy and angle-dependent x-ray absorption spectroscopy to understanding the molecular orientation of a ZnPc layer on the performance of small molecule organic photovoltaics (OPVs). We find that the ZnPc tilt angle improves the ${\pi}-{\pi}$ interaction on the AZO substrate, thus leading to an improved short-circuit current in OPVs based on phthalocyanine. Furthermore, the molecular orientation-dependent energy level alignment has been analyzed in detail using ultraviolet photoemission spectroscopy. We also obtained complete energy level diagrams of ZnPc/AZO and ZnPc/indium thin oxide.

• 한국근적외분광분석학회:학술대회논문집
• /
• 한국근적외분광분석학회 2001년도 NIR-2001
• /
• pp.1288-1288
• /
• 2001

X-ray powder diffraction (XRD) is utilized for determination of polymorphism in crystalline organic materials. Though convenient to use in a laboratory setting, XRD is not easily adapted to in situ monitoring of synthetic chemical production applications. Near-Infrared spectroscopy (NIR) can be adapted to in situ manufacturing schemes by use of a source/detector probe. Conversely, NIR is unable to conclusively define the existence of polymorphism in crystalline materials. By combining the two techniques, a novel simultaneous NIR/XRD instrument has been developed. During material's analysis, results from XRD allow for defining the polymorphic phase present, and NIR data are collected as a fingerprint for each of the observed polymorphs. These NIR fingerprints will allow for the development of a library, which can be referenced during the use of a NIR probe in manufacturing settings.