Nuclear Engineering and Technology

Korean Nuclear Society (한국원자력학회)
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MATERIAL INVESTIGATION AND ANALYSIS USING CHARACTERISTIC X-RAY

  • Oh, Gyu-Bum (Department of Radiologic Science, Korea University) ;
  • Lee, Won-Ho (Department of Radiologic Science, Korea University)
  • Received : 2009.12.30
  • Accepted : 2010.05.19
  • Published : 2010.08.31
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Abstract

The characteristic X-rays emitted from materials after gamma ray exposure was simulated and measured. A CdTe semiconductor detector and a $^{57}Co$ radiation source were used for energy spectroscopy. The types of materials could be identified by comparing the measured energy spectrum with the theoretical X-ray transition energy of the material. The sample composition was represented by the $K_{\alpha1}$-line (Siegbahn notations), which has the highest intensity among the characteristic X-rays of each atom. The difference between the theoretic prediction and the experimental result of K-line measurement was < 0.61% even if the characteristic X-rays from several materials were measured simultaneously. 2D images of the mixed materials were acquired with very high selectivity.

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References

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