• Journal of the Optical Society of Korea
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• v.13 no.3
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• pp.330-334
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• 2009

A simple and compact frequency swept laser is demonstrated at $1.3{\mu}m$ using a wavelength scanning filter based on a rotating slit disk. The laser is comprised of a pigtailed semiconductor optical amplifier, a circulator, and a wavelength scanning filter in an extended cavity configuration. The wavelength scanning filter is composed of a collimator, a diffraction grating, a rotating slit disk, and a mirror. The instantaneous laser output power is more than 5 mW. The scanning range of the laser is extended to 80 nm at the maximum level, and 55 nm in the full width at half maximum at a scanning rate of 2 kHz.

• Korean Journal of Optics and Photonics
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• v.25 no.2
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• pp.61-66
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• 2014

We report the characterization of a wavelength-swept laser (WSL) using a polygon-based wavelength scanning filter and two semiconductor optical amplifiers (SOAs). The output intensity and scanning bandwidth of the WSL depend on the position of the two SOAs in the laser cavity and the coupling ratio of the output fiber coupler. The outputs of the WSL are characterized for coupling ratios of 10%, 30%, 50%, 70%, and 90% for the output fiber coupler. In the setup in which the output fiber coupler is located between the two SOAs, high output power and wide scanning bandwidth can be achieved with an optimized configuration. Using the optimized configuration of the WSL, the intensity increases with the coupling ratio. These results can be used to construct an optimized WSL using the polygon-based wavelength scanning filter.

• Korean Journal of Optics and Photonics
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• v.27 no.1
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• pp.32-40
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• 2016

The characteristics of an optical system vary depending on wavelength and ambient temperature. Based on the thin-lens approximation, we investigate the conditions for stabilizing an optical system against wavelength and temperature variations at the same time. The conditions are applied to designing a laser scanning system consisting of two lenses. The change in the effective focal length of the scanning system against wavelength and temperature variations is very small, as expected.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2011.06a
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• pp.863-864
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• 2011

• Korean Journal of Optics and Photonics
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• v.20 no.3
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• pp.189-194
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• 2009

We demonstrate a ring type wavelength swept laser incorporating a fiber Fabry-Perot tunable filter in a laser cavity using 1300 nm semiconductor optical amplifier as a gain medium. The output characteristics of the wavelength swept laser according to the applied scanning frequencies are analyzed in the temporal and spectral domain. The output of the wavelength swept laser decreases dramatically as the scanning frequency increases. And there is a significant peak power imbalance between the forward scan and the backward scan as the scanning frequency increases. Its use in practical applications might be limited.

• Journal of Institute of Control, Robotics and Systems
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• v.9 no.7
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• pp.507-514
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• 2003

Inspection and shape measurement of three-dimensional objects are widely needed in industries for quality monitoring and control. Recently the shape measurement using interferometric principle is found to be a successful methodology among other visual or optical technologies. Especially, the measuring method using wavelength scanning interferometer(WSI) has a great advantage in comparison with other conventional jnterferometric methods in that the absolute distance from the reference surface can be directly obtained from the amount of jnterferometric phase change. However, the measurement methods using WSI proposed by other researchers have low measurement resolution so far because they can't measure fractional phase change. To avoid this shortcoming we propose a new algorithm in this paper, which can obtain a small amount of even fractional phase change by sinusoidal function fitting. To evaluate the effectiveness of the proposed sinusoidal function fitting algorithm, a series of measuring experiments are conducted for discontinuously shaped specimens which have various height. The proposed algorithm shows much more enhanced measurement resolution than other existing conventional algorithms such as zero crossing algorithm and Fourier transform algorithm.

• Current Optics and Photonics
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• v.5 no.3
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• pp.229-237
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• 2021

The capabilities of the near-field scanning optical microscope (NSOM) for obtaining high resolution lateral topographical images as well as for mapping the spectroscopic and optical properties of a sample below the diffraction limit of light have made it an attractive research field for most researchers dealing with optical characteristics of materials in nano scales. The apertured NSOM technique involves confining light into an aperture of sub-wavelength size and using it to illuminate a sample maintained at a distance equal to a fraction of the sub-wavelength aperture (near-field region). In this article, we present a setup for developing NSOM using a cantilever with a sub-wavelength aperture at the tip. A single laser is used for both cantilever deflection measurement and near-field sample excitation. The laser beam is focused at the apex of the cantilever where a portion of the beam is reflected and the other portion goes through the aperture and causes local near-field optical excitation of the sample, which is then raster scanned in the near-field region. The reflected beam is used for an optical beam deflection technique that yields topographical images by controlling the probe-sample in nano-distance. The fluorescence emissions signal is detected in far-field by the help of a silicon avalanche photodiode. The images obtained using this method show a good correlation between the topographical image and the mapping of the fluorescence emissions.

• Bulletin of the Korean Chemical Society
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• v.25 no.6
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• pp.801-805
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• 2004

In this work, the fundamental study of on-line monitoring of $SiO_2$ particles in the size range of 40 nm to 725 nm was carried out using turbidimetry. The size of particle was measured using a field emission scanning electron microscope (FE-SEM). The factors affecting on the turbidity were discussed, for example, wavelength, size, and concentration. In order to observe the dependence of turbidity on the wavelength, a turbidimetric system equipped with charged coupled detector (CCD) was built. The shape of the transmitted peak was changed and the peak maximum was shifted to the red when the concentration of particle was increased. This result indicates that the turbidity is related to the wavelength, which corresponds to the characteristic of the Mie extinction coefficient, Q, that is a function of not only particle diameter and refractive index but also wavelength. It is clear that a linear calibration curve for each particle in different size can be obtained at an optimized wavelength.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.28 no.9
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• pp.1270-1275
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• 2004

Standard positive photoresist techniques were adapted to generate nano-scale patterns of gold substrate using self-assembled monolayers (SAMs) and femtosecond laser. SAMs formed by the adsorption of alkanethiols onto gold substrate are employed as very thin photoresists, Alkanethiolates formed by the adsorption of alkanethiols are oxidized on exposure to UV light in the presence of air to alkylsulfonates. Specifically, it is known that deep UV light of wavelength less than 200nm is necessary for oxidation to occur. In this study, ultrafast laser of wavelength 800nm and pulse width 200fs is applied for photolithography. Results show that ultrafast laser of visible range wavelength can replace deep UV laser source for photo patterning using thin organic films. Femtosecond laser coupled near-field scanning optical microscopy facilitates not only the patterning of surface chemical structure, but also the creation of three-dimensional nano-scale structures by combination with suitable etching methods.

• The Journal of the Acoustical Society of Korea
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• v.15 no.1E
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• pp.70-76
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• 1996

We proposed to use shear waves instead of longitudinal waves in a STAM (scanning tomographic acoustic microscope system) in which the specimens are solid. For any specimen with a shear modulus, mode conversion will take place at the water-solid interface. Some of the energy of the insonifying longitudinal waves in the water will convert to shear wave energy within the specimen. The shear wave energy is detectable and can be used for tomographic reconstruction. The resolution limitation of STAM depends on the available angular view and the acoustic wavelength. While wave transmission in most solid specimens is limited to about 20°for longitudinal waves, we show that it is about twice that high for shear waves. Since the wavelength of the shear wave is shorter than that of the longitudinal wave, we are able to achieve the high resolution. In order to compare the operation of a shear-wave STAM with that of the conventional longitudinal-wave STAM we have simulated tomographic reconstruction for each. Our simulation results with aluminum specimen and back-and-forth propagation algorithm showed resolution of a shear-wave STAM is better than that of a longitudinal-wave STAM.