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Developing a Cantilever-type Near-field Scanning Optical Microscope Using a Single Laser for Topography Detection and Sample Excitation

  • Ng'ang'a, Douglas Kagoiya (Department of Mechanical Engineering, Kyungpook National University) ;
  • Ali, Luqman (Department of Mechanical Engineering, Kyungpook National University) ;
  • Lee, Yong Joong (Department of Mechanical Engineering, Kyungpook National University) ;
  • Byeon, Clare Chisu (Department of Mechanical Engineering, Kyungpook National University)
  • Received : 2020.12.12
  • Accepted : 2021.03.02
  • Published : 2021.06.25

Abstract

The capabilities of the near-field scanning optical microscope (NSOM) for obtaining high resolution lateral topographical images as well as for mapping the spectroscopic and optical properties of a sample below the diffraction limit of light have made it an attractive research field for most researchers dealing with optical characteristics of materials in nano scales. The apertured NSOM technique involves confining light into an aperture of sub-wavelength size and using it to illuminate a sample maintained at a distance equal to a fraction of the sub-wavelength aperture (near-field region). In this article, we present a setup for developing NSOM using a cantilever with a sub-wavelength aperture at the tip. A single laser is used for both cantilever deflection measurement and near-field sample excitation. The laser beam is focused at the apex of the cantilever where a portion of the beam is reflected and the other portion goes through the aperture and causes local near-field optical excitation of the sample, which is then raster scanned in the near-field region. The reflected beam is used for an optical beam deflection technique that yields topographical images by controlling the probe-sample in nano-distance. The fluorescence emissions signal is detected in far-field by the help of a silicon avalanche photodiode. The images obtained using this method show a good correlation between the topographical image and the mapping of the fluorescence emissions.

Keywords

Acknowledgement

This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2018R1D1A1B07050153).

References

  1. D. W. Pohl, W. Denk, and M. Lanz, "Optical stethoscopy: image recording with resolution λ/20," Appl. Phys. Lett. 44, 651-653 (1984). https://doi.org/10.1063/1.94865
  2. E. H. Synge, "XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region," Philos. Mag. 6, 356-362 (1928). https://doi.org/10.1080/14786440808564615
  3. F. Marinello, P. Schiavuta, M. Balcon, S. Carmignato, and E. Savio, "Quantitative cantilever near-field scanning optical microscopy," In Proc. 11th euspen International Conference (Como, Italy, May. 2011).
  4. F. Marinello, P. Schiavuta, R. Cavalli, A. Pezzuolo, S. Carmignato, and E. Savio, "Critical factors in cantilever near-field scanning optical microscopy," IEEE Sensors J. 14, 3236-3244 (2014). https://doi.org/10.1109/JSEN.2014.2325817
  5. D. W. Pohl, "Near-field optics: light for the world of nanoscale science," Thin Solid Films 264, 250-254 (1995). https://doi.org/10.1016/0040-6090(95)05822-2
  6. S. Shalom, K. Lieberman, A. Lewis, and S. R. Cohen, "A micropipette force probe suitable for near-field scanning optical microscopy," Rev. Sci. Instrum. 63, 4061-4065 (1992). https://doi.org/10.1063/1.1143212
  7. E. Jin and X. Xu, "Focussed ion beam machined cantilever aperture probes for near-field optical imaging," J. Microsc. 229, 503-511 (2008). https://doi.org/10.1111/j.1365-2818.2008.01935.x
  8. M. Salomo, D. Bayer, B. Schaaf, M. Aeschlimann, and E. Oesterschulze, "Fabrication and characterization of coaxial scanning near-field optical microscopy cantilever sensors," Microelectron. Eng. 87, 1540-1542 (2010). https://doi.org/10.1016/j.mee.2009.11.031
  9. G. Schurmann, W. Noell, U. Staufer, N. F. de Rooij, R. Eckert, J. M. Freyland, and H. Heinzelmann,"Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy," Appl. Opt. 40, 5040-5045 (2001). https://doi.org/10.1364/AO.40.005040
  10. H. Kim, S. B. Choi, M. Jang, and D. J. Park, "A concept of cantilevers optical dimension for optimal application to cantilever-based near-field scanning optical microscope and its measurement," J. Korean Phys. Soc. 74, 637-641 (2019). https://doi.org/10.3938/jkps.74.637
  11. E. Oesterschulze, O. Rudow, C. Mihalcea, W. Scholz, and S. Werner, "Cantilever probes for SNOM applications with single and double aperture tips," Ultramicroscopy 71, 85-92 (1998). https://doi.org/10.1016/S0304-3991(97)00089-2
  12. S. Werner, O. Rudow, C. Mihalcea, and E. Oesterschulze, "Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy," Appl. Phys. A 66, S367-S370 (1998). https://doi.org/10.1007/s003390050680
  13. S. Baral, A. R. Miandashti, and H. H. Richardson, "Near-field thermal imaging of optically excited gold nanostructures: scaling principles for collective heating with heat dissipation into the surrounding medium," Nanoscale 10, 941-948 (2018). https://doi.org/10.1039/c7nr08349a
  14. P. N. Minh, T. Ono, and M. Esashi, "High throughput aperture near-field scanning optical microscopy," Rev. Sci. Instrum. 71, 3111-3117 (2000). https://doi.org/10.1063/1.1304867
  15. J. Kim and K.-B. Song, "Recent progress of nano-technology with NSOM," Micron 38, 409-426 (2007). https://doi.org/10.1016/j.micron.2006.06.010
  16. P. Bazylewski, S. Ezugwu, and G. Fanchini, "A review of three-dimensional scanning near-field optical microscopy (3D-SNOM) and its applications in nanoscale light management," Appl. Sci. 7, 973 (2017). https://doi.org/10.3390/app7100973
  17. Y. De Wilde, F. Formanek, and L. Aigouy, "Apertureless near-field scanning optical microscope based on a quartz tuning fork," Rev. Sci. Instrum. 74, 3889-3891 (2003). https://doi.org/10.1063/1.1593785
  18. S. Blaize, S. Aubert, A. Bruyant, R. Bachelot, G. Lerondel, P. Royer, J.-E. Broquin, and V. Minier, "Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization," J. Microsc. 209, 155-161 (2003). https://doi.org/10.1046/j.1365-2818.2003.01106.x
  19. A. Fragola, L. Aigouy, Y. De Wilde, and M. Mortier, "Upconversion fluorescence imaging of erbium-doped fluoride glass particles by apertureless SNOM," J. Microsc. 210, 198-202 (2003). https://doi.org/10.1046/j.1365-2818.2003.01090.x
  20. M. Alhabeb, K. Maleski, T. S. Mathis, A. Sarycheva, C. B. Hatter, S. Uzun, A. Levitt, and Y. Gogotsi, "Selective etching of silicon from Ti3SiC2 (MAX) to obtain 2D titanium carbide (MXene)," Angew. Chem. 57, 5544-5548 (2018). https://doi.org/10.1002/anie.201800128
  21. 4science.net, "CdSe/ZnS Quantum Dots (540 ± 5 nm λ)," (4science.net, Published Date : 11 December 2016). Available: https://www.4science.net/goods/detail.do?glt_no=25276 (Accessed Date: 12 December 2020).
  22. P. Zhang, "Investigation of novel quantum dots/proteins/cellulose bioconjugate using NSOM and fluorescence," J. Fluoresc. 16, 349-353 (2006). https://doi.org/10.1007/s10895-005-0058-4
  23. D. P. Ryan, P. M. Goodwin, C. J. Sheehan, K. J. Whitcomb, M. P. Gelfand, and A. Van Orden, "Mapping emission from clusters of CdSe/ZnS nanoparticles," J. Phys. Chem. C 122, 4046-4053 (2018). https://doi.org/10.1021/acs.jpcc.7b10924
  24. A. Bek, R. Vogelgesang, and K. Kern, "Apertureless scanning near field optical microscope with sub-10 nm resolution," Rev. Sci. Inst. 77, 043703 (2006). https://doi.org/10.1063/1.2190211