• 제목/요약/키워드: Transmission Electron microscopy

검색결과 2,331건 처리시간 0.028초

주사 투과 전자현미경을 활용한 음극형광 분석법 (Introduction to Cathodoluminescence Spectroscopy Using Scanning Transmission Electron Microscopy)

  • 김성대
    • 한국전기전자재료학회논문지
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    • 제36권4호
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    • pp.326-331
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    • 2023
  • The utilization of scanning transmission electron microscopy (STEM) in conjunction with cathodoluminescence (CL) has emerged as a valuable tool for the investigation of material optical properties. In recent years, this technique has facilitated significant advancements in the fields of plasmonics and quantum emitters by surpassing prior technical restrictions. The review commences by providing an outline of the diverse STEM-CL operating modes and technical aspects of the instrumentation. The review explains the fundamental physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments for different types of excitations. Additionally, the review compares STEM-CL to other related techniques such as scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy.

Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials

  • Lee, Sang-Gil;Lee, Ji-Hyun;Yoo, Seung Jo;Datta, Suvo Jit;Hwang, In-Chul;Yoon, Kyung-Byung;Kim, Jin-Gyu
    • Applied Microscopy
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    • 제45권4호
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    • pp.203-207
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    • 2015
  • Sample preparation is very important for crystal structure analysis of novel nanostructured materials in electron microscopy. Generally, a grid dispersion method has been used as transmission electron microscope (TEM) sampling method of nano-powder samples. However, it is difficult to obtain the cross-sectional information for the tabular-structured materials. In order to solve this problem, we have attempted a new sample preparation method using focused ion beam. Base on this approach, it was possible to successfully obtain the electron diffraction patterns and high-resolution TEM images of the cross-section of tabular structure. Finally, we were able to obtain three-dimensional crystallographic information of novel zeolite nano-crystal of the tabular morphology by applying the new sample preparation technique.

광소자로 사용되는 ZnTe박박의 결정성에 따른 결함 관찰 (Crystallinity and Internal Defect Observation of the ZnTe Thin Film Used by Opto-Electronic Sensor Material)

  • Kim, B.J.
    • 한국표면공학회지
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    • 제35권5호
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    • pp.289-294
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    • 2002
  • ZnTe films have been grown on (100) GaAs substrate with two representative problems. The one is lattice mismatch, the other is thermal expansion coefficients mismatch of ZnTe /GaAs. It claims here, the relationship of film thickness and defects distribution with (100) ZnTe/GaAs using hot wall epitaxy (HWE) growth was investigated by transmission electron microscopy (TEM). It analyzed on the two-sort side using TEM with cross-sectional transmission electron microscopy (XTEM) and high-resolution electron microscopy (HREM). Investigation into the nature and behavior of dislocations with dependence-thickness in (100) ZnTe/ (100) GaAs hetero-structures grown by transmission electron microscopy (TEM). This defects range from interface to 0.7 $\mu\textrm{m}$ was high density, due to the large lattice mismatch and thermal expansion coefficients. The defects of low density was range 0.7$\mu\textrm{m}$~1.8$\mu\textrm{m}$. In the thicker range than 1.8$\mu\textrm{m}$ was measured hardly defects.

A Correlative Approach for Identifying Complex Phases by Electron Backscatter Diffraction and Transmission Electron Microscopy

  • Na, Seon-Hyeong;Seol, Jae-Bok;Jafari, Majid;Park, Chan-Gyung
    • Applied Microscopy
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    • 제47권1호
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    • pp.43-49
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    • 2017
  • A new method was introduced to distinguish the ferrite, bainite and martensite in transformation induced plasticity (TRIP) steel by using electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). EBSD is a very powerful microstructure analysis technique at the length scales ranging from tens of nanometers to millimeters. However, iron BCC phases such as ferrite, bainite and martensite cannot be easily distinguished by EBSD due to their similar surface morphology and crystallographic structure. Among the various EBSD-based methodology, image quality (IQ) values, which present the perfection of a crystal lattice, was used to distinguish the iron BCC phases. IQ values are very useful tools to discern the iron BCC phases because of their different density of crystal defect and lattice distortion. However, there are still remaining problems that make the separation of bainite and martensite difficult. For instance, these phases have very similar IQ values in many cases, especially in deformed region; therefore, even though the IQ value was used, it has been difficult to distinguish the bainite and martensite. For more precise separation of bainite and martensite, IQ threshold values were determined by a correlative TEM analysis. By determining the threshold values, iron BCC phases were successfully separated.

Atomically sculptured heart in oxide film using convergent electron beam

  • Gwangyeob Lee;Seung-Hyub Baek;Hye Jung Chang
    • Applied Microscopy
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    • 제51권
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    • pp.1.1-1.2
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    • 2021
  • We demonstrate a fabrication of an atomically controlled single-crystal heart-shaped nanostructure using a convergent electron beam in a scanning transmission electron microscope. The delicately controlled e-beam enable epitaxial crystallization of perovskite oxide LaAlO3 grown out of the relative conductive interface (i.e. 2 dimensional electron gas) between amorphous LaAlO3/crystalline SrTiO3.

Structural Analysis of Exosomes Using Different Types of Electron Microscopy

  • Choi, Hyosun;Mun, Ji Young
    • Applied Microscopy
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    • 제47권3호
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    • pp.171-175
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    • 2017
  • Negative staining has been traditionally used for exosome imaging; however, the technique is limited to surface topology only and can cause staining artifacts. Therefore, to analyze the internal structure of exosomes, we employed a method of block preparation, thin sectioning, and electron tomography. In addition, an automatic serial sectioning technique with 15-nm thickness through focused ion beam was employed to observe the three-dimensional structure of exosomes of various sizes. Cryo-transmission electron microscopy revealed the near-to-native structure of exosomes.

Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional Material; Graphene

  • Na, Min Young;Lee, Seung-Mo;Kim, Do Hyang;Chang, Hye Jung
    • Applied Microscopy
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    • 제45권1호
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    • pp.23-31
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    • 2015
  • Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.

Quantitative Evaluation of Dislocation Density in Epitaxial GaAs Layer on Si Using Transmission Electron Microscopy

  • Kim, Kangsik;Lee, Jongyoung;Kim, Hyojin;Lee, Zonghoon
    • Applied Microscopy
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    • 제44권2호
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    • pp.74-78
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    • 2014
  • Dislocation density and distribution in epitaxial GaAs layer on Si are evaluated quantitatively and effectively using image processing of transmission electron microscopy image. In order to evaluate dislocation density and distribution, three methods are introduced based on line-intercept, line-length measurement and our coding with line-scanning method. Our coding method based on line-scanning is used to detect the dislocations line-by-line effectively by sweeping a thin line with the width of one pixel. The proposed method has advances in the evaluation of dislocation density and distribution. Dislocations can be detected automatically and continuously by a sweeping line in the code. Variation of dislocation density in epitaxial GaAs films can be precisely analyzed along the growth direction on the film.

Direct Observation of Heterogeneous Nucleation in Al-Si-Cu-Mg Alloy Using Transmission Electron Microscopy and Three-dimensional Atom Probe Tomography

  • Hwang, Jun Yeon;Banerjee, Rajarshi;Diercks, David R.;Kaufman, Michael J.
    • Applied Microscopy
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    • 제43권3호
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    • pp.122-126
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    • 2013
  • The heterogeneous nucleation of the ${\Theta}^{\prime}$ phase on nanoscale precipitates has been investigated using a combination of three-dimensional atom probe tomography and high-resolution transmission electron microscopy. Two types of ${\Theta}^{\prime}$ phases were observed, namely small (~2 nm thick) cylindrical precipitates and larger (~100 nm) globular precipitates and both appear to be heterogeneously nucleated on the nanoscale precipitates. The composition and crystal structure of precipitates were directly analyzed by combination of two advanced characterization techniques.

Image Processing and Cryo-Transmission Electron Microscopy; Example of Human Proteasome

  • Choi, Hyosun;Jeon, Hyunbum;Noh, Seulgi;Kwon, Ohkyung;Mun, Ji Young
    • Applied Microscopy
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    • 제48권1호
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    • pp.1-5
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    • 2018
  • Cryo-transmission electron microscopy (cryo-TEM) allows us to perform structural analysis of a analyses of large protein complexes, which are difficult to analyze using X-ray crystallography or nuclear magnetic resonance. The most common examples of proteins used are ribosomes and proteasomes. In this paper, we briefly describe the advantage of cryo-TEM and the process of two-dimensional classification by considering a human proteasome as an example.