• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.05a
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• pp.106-106
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• 2015

In this study, we investigated electrochemically formed nanotube shape on ternary Ti-25Ta-xHf alloys with Hf contents. Ti-25Ta-xHf (x=0~15 wt.%) alloys were manufactured by vacuum arc-melting furnace. The obtained ingots were homogenized in an argon atmosphere at $1050^{\circ}C$ for 2h and then water quenching. The specimens were cut from ingots to 4 mm thickness and first ground and polished using SiC paper (grades from #100 to #2000). The anodization treatments on Ti-25Nb-xHf alloys were carried out at room temperature for experiments. The formation of nanotubular film was conducted by electrochemical method in mixed electrolytes with 1 M $H_3PO_4$ + 0.8 wt. % NaF at 30 V for 2 h. The morphologies of nanotube depended on the Hf content in Ti-25Ta-xHf ternary system.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.10a
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• pp.195-196
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• 2009

ITZO 박막과 $TIO_2$ 버퍼층은 각각 두 개의 캐소드를 사용한 마그네트론 2원동시 방전법과 산소 함량 2%를 사용한 반응성 sputtering 방법으로 각각 증착이 되었다. 모든 박막들은 상온에서 폴리머 기판인 PET에 증착되었다. $TiO_2$ 버퍼층을 도입함으로써 ITZO/$TiO_2$ 박막은 비정질 구조를 보여 주었고, 그것들의 비저항은 버퍼층의 두께가 증가할수록 감소함을 관찰하였다. 특히 기계적 특징은 $TiO_2$ 버퍼층을 5nm 증착하였을 경우에 bending test와 광학 현미경의 crack정도를 관찰함으로써 향상되었음을 확인할 수 있었다. 투과율에 있어서 단일 ITZO 박막과 버퍼층을 5nm 도입한 박막은 가시광선에서 약 75%의 투과율을 가짐을 알 수 있었다.

• Bulletin of the Korean Chemical Society
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• v.22 no.12
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• pp.1366-1370
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• 2001

Thin films of the SiO2-TiO2-PDMS composite material have been prepared by the sol-gel dip coating method. Acid catalyzed solutions of tetraethoxy silane (TEOS) and polydimethyl siloxane (PDMS) mixed with titanium isopropoxide Ti(OiPr) were used as precursors. The optical and structural properties of the organically modified 70SiO2-30TiO2 composite films have been investigated with Fourier Transform Infrared Spectroscopy (FT-IR), UV-Visible Spectroscopy (UV-Vis), Differential Thermal Analysis (DTA) and prism coupling technique. The films coated on the soda-lime-silicate glass exhibit 450-750 nm thickness, 1.56-1.68 refractive index and 88-94% transmittance depending on the experimental parameters such as amount of PDMS, thermal treatment and heating rate. The optical loss of prepared composite film was measured to be about 0.34 dB/cm.

• Journal of Welding and Joining
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• v.14 no.4
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• pp.99-108
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• 1996

The microstructure and bond strength are examined on the SiC/SiC and SiC/mild steel joints brazed by the Ag-Ti based alloys with different Ti contents. In the SiC/SiC brazed joints, the thickness of the reaction layers at the bond interface and the Ti particles in the brazing alloy matrices increase with Ti contents. When Ti is added up to 9 at% in the brazing alloy. $Ti_3SiC_2$ phase in addition to TiC and $Ti_5Si_3$ phase is newly created at the bond interface and TiAg phase is produced from peritectic reaction in the brazing alloy matrix. In the SiC/mild steel joints brazed with different Ti contents, the microstructure at the bond interface and in the brazing alloy matrix near SiC varies similarly to the case of SiC/SiC brazed joints. But, in the brazing alloy matrix near the mild steel, Fe-Ti intermetallic compounds are produced and increased with Ti contents. The bond strengths of the SiC/SiC and SiC/mild steel brazed joints are independent on Ti contents in the brazing alloy. There are no large differences of the bond strength between SiC/SiC and SiC/mild steel brazed joints. In the SiC/mild steel brazed joints, Fe dissolved from the mild steel does not affect on the bond strength of the joints. Thermal contraction of the mild steel has nearly no effects on the bond strength due to the wide brazing gap of specimens used in the four-point bend test. The brazed joints has the average bond strength of about 200 MPa independently on Ti contents, Fe dissolution and joint type. Fracture in four-point bend test initiates at the interface between SiC and TiC reaction layer and propagates through SiC bulk. The adhesive strength between SiC and TiC reaction layer seems to mainly control the bond strength of the brazed joints.

• Proceedings of the KIEE Conference
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• 2005.07c
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• pp.1850-1852
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• 2005

$SrTiO_3$ and $BaTiO_3$ sol-liquids and powders were prepared by the sol-gel method. $SrTiO_3/BaTiO_3$ heterolayered thin/thick films have been prepared on the $Al_2O_3$ substrates by screen printing and spin-coating method. The thin films were sintered at $750^{\circ}C$ in the air for 1 hour and the thick films sintered at $1325^{\circ}C$ in the air for 2 hours, respectively. The $SrTiO_3/BaTiO_3$ thin/thick films's structural and dielectric properties were investigated. Increasing the spin-coating times, (110), (200), (211) peaks of the $SrTiO_3$ were increased. The X-ray diffraction(XRD) patterns and SEM photographs indicated that the $SrTiO_3$ phase were formed in the surface of $BaTiO_3$ thick films. The average thickness of a $BaTiO_3$ thick films and $SrTiO_3$ thin films were $50{\mu}m$ and 400nm, respectively The dielectric constant and dielectric loss of the $SrTiO_3/BaTiO_3$ thin/thick films with $SrTiO_3$ coated 5 times were 1598 and 0.0436 at 10KHz.

• Journal of Photoscience
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• v.10 no.2
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• pp.199-202
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• 2003

The relationship between the morphology of nanostructured TiO$_2$ films and the photo-injected electron transport has been investigated using intensity-modulated photocurrent spectroscopy (IMPS). For this purpose, three different TiO$_2$ films with 5 ${\mu}{\textrm}{m}$ thickness are prepared: The rutile TiO$_2$ film with 500 nm-sized cluster-like spherical bundles composed of the individual needles (Tl), the rutile TiO$_2$ film made up of non-oriented, homogeneously distributed rod-shaped particles having a dimension of approximately 20${\times}$80 nm (T2), and the anatase TiO$_2$ film with 20 nm-sized spherically shaped particles (T3). Cross sectional scanning electron micrographs show that all of the TiO$_2$films have a quite different particle packing density: poorly packed Tl film, loosely packed T2 film and densely packed T3 film. The electron transport is found to be significantly influenced by film morphology. The effective electron diffusion coefficient D$_{eff}$ derived from the IMPS time constant is an order of magnitude lower for T2 than for T3, but the D$_{eff}$ for the Tl sample is much lower than T2. These differences in the rate of electron transport are ascribed to differences in the extent of interparticle connectivity associated with the particle packing density.ity.

• Journal of the Korean Ceramic Society
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• v.33 no.6
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• pp.700-708
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• 1996

TiO2 membranes for microfiltration were prepared on $\alpha$-alumina support tube by slurry coating. The coating layer was obtained by flowing TiO2 slip on the inner surface of the alumina support. TiO2 membranes were heat-treated at 9$25^{\circ}C$ for 2 hrs. The thickness of the unsupported membrane was about 10${\mu}{\textrm}{m}$. The mean pore diameter of the membranes were 0.09 and 0.15${\mu}{\textrm}{m}$ respectively and the pure water flux was 900~1,200ι/m2.hr at room temperature and 1 bar. For a possible application of oily wastewater treatement an kerosene/wa-ter emulsion was separated in terms of flux and removal efficiency. In 60 min of operating time the flux of TiO2 membranes was 50~100 ι/m2.hr and removal efficiency was over 97% at 3kgf/cm2 of operating pres-sure and 600 ml/min of flow rate. TiO2 membranes could be recycled by reheat treatments at $600^{\circ}C$ for 2 hrs.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.3
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• pp.1-8
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• 1997

The surface properties after plasma etching of TiW alloy using the chemistries of BCl$_{3}$ and SF$_{6}$ gases with varying mixing ratio have been investigated using XPS(X-ray photoelectron spectrocopy). The elements existed on the etched sampled have been extracted with BCL$_{3}$/SF$_{6}$ ratio and their chemical binding states have also been analysed. It was confirmed that the thickness of native oxide formed on the TiW films is thinner than 10nm by using Ar sputtering. At the same time, the roughness of etched surface has been esamnied using AFM (atomic force microscopy). on the basis of the basis of this results, the relations between the caanges of oxygen contents detected by XPS and the rouhness of etched surface have been discussed. And the etch rate and etched profile of Tiw films have been examined and the changes of the etch rate and etched prfile have been discussed with XPS results. From XPS results, the role of passivation layer consisted of Ti-S compound with XPS results. From XPS results, the role of passivation layer consisted of Ti-S compound has been proposed. Ti-S compound seems to make a role of passivation layer that surpresses Ti-O formation.ion.

• Korean Journal of Materials Research
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• v.27 no.5
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• pp.289-293
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• 2017

$Y_2Ti_2O_7$ nanoparticles (0.3 mol%) have been successfully synthesized by the co-precipitation process. The samples, adjusted to pH7 with ammonia solution as catalyst and calcined at $700{\sim}900^{\circ}C$, exhibit very fine particles with close to spherical shape and average size of 10-30 nm. It was possible to control the size of the synthesized $Y_2Ti_2O_7$ particles by manipulating the conditions. The $Y_2Ti_2O_7$ nanoparticles were coated on a glass substrate by a dipping coating process with inorganic binder. The $Y_2Ti_2O_7$ solution coated on the glass substrate had excellent adhesion of 5B; pencil hardness test results indicated an excellent hardness of 6H. The thickness of the thick film was about $30{\mu}m$. Decomposition of MB on the $Y_2Ti_2O_7$ thin film shows that the photocatalytic properties were excellent.

• Korean Journal of Materials Research
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• v.12 no.12
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• pp.955-961
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• 2002

2.7vol%TiNi/6061 Al composites with TiNi shape memory alloy as reinforcement were fabricated by vacuum hot press. It was investigated by OM, SEM, EPMA and XRD analysis for the behavior of diffusion layer formation on various heat treatment condition. Thickness of diffusion layer was increased proportionally according to heat treatment time. The layer was formed by the mutual diffusion of TiNi and Al. The diffusion rate from TiNi fiber to Al matrix was faster than that of reverse diffusion path. The more diffused layer was formed in Al matrix. The diffusion at interface layer was consisted of $A1_3$Ti, $Al_3$Ni analyzed by EPMA, XRD results.