• Title/Summary/Keyword: TFT-LCD display

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A Study on the Uniformity Improvement of Residual Layer of a Large Area Nanoimprint Lithography

  • Kim, Kug-Weon;Noorani, Rafigul I.;Kim, Nam-Woong
    • Journal of the Semiconductor & Display Technology
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    • v.9 no.4
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    • pp.19-23
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    • 2010
  • Nanoimprint lithography (NIL) is one of the most versatile and promising technology for micro/nano-patterning due to its simplicity, high throughput and low cost. Recently, one of the major trends of NIL is large-area patterning. Especially, the research of the application of NIL to TFT-LCD field has been increasing. Technical difficulties to keep the uniformity of the residual layer, however, become severer as the imprinting area increases. In this paper we performed a numerical study for a large area NIL (the $2^nd$ generation TFT-LCD glass substrate ($370{\times}470$ mm)) by using finite element method. First, a simple model considering the surrounding wall was established in order to simulate effectively and reduce the computing time. Then, the volume of fluid (VOF) and grid deformation method were utilized to calculate the free surfaces of the resist flow based on an Eulerian grid system. From the simulation, the velocity fields and the imprinting pressure during the filling process in the NIL were analyzed, and the effect of the surrounding wall and the uniformity of residual layer were investigated.

Study of point defects caused by a thin contamination layer in a-Si TFT-LCD

  • Oh, Jae-Young;Lee, Jae-Kyun;Yang, Moung-Su;Kang, In-Byeong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.845-848
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    • 2007
  • Analysis of point defects invisible by a microscope has been studied on the a-Si thin film transistor panel. The point defects which were named Invisible Point Defect (IPD) is characterized by no particles or distortion of patterns on a pixel structure and randomly distributed on panels. To investigate the IPD, measurements were carried out: gray level driving, transistor transfer characteristic, focused ion beam (FIB), and secondary ion mass spectrometry (SIMS). The results showed that a contamination layer had a bad influence on an active surface. The contamination layer consisted of oxygen and iron from a water supply line during cleaning process. After the process tuning, IPD has been stabilized.

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Parametric Study for Excimer Laser-induced Crystallization in the a-Si thin film

  • Moon, Min-Hyung;Kim, Hyun-Jae;Choi, Kwang-Soo;Souk, Jun-Hyung;Seo, Chang-Ki;Kim, Do-Young;Dhungel, Suresh Kumar;Yi, Junsin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.630-633
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    • 2003
  • Integrating the driver circuitry directly onto the glass substrate would be one of the advantages of polycrystalline Si (poly-Si) TFT-(LCD). Low-temperature poly-Si TFT(LTPS) is well-suited for higher-definition display applications due to its intrinsically superior electrical characteristics. In order to improve LTPS electrical characteristics, currently the excimer laser-induced crystallization (ELC) processes and sequential lateral solidification method were developed. Grain size of the poly-Si is mainly affected by beam pitch and energy density. Key parameter for making a larger poly-Si using excimer laser annealing(ELA) and increasing a throughput is due to increase in beam pitch and energy density to a certain degree. Furthermore, thin $SiO_{2}$ capping is effective to suppress the protrusion of the poly-Si thin films and to reduce the interface state density. From the ELA process, we are able to control grain size by varying different parameters such as number of shots and energy density.

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A Method to Predict the Performance of a-Si TFT device

  • Shih, Ching-Chieh;Wei, Chun-Ching;Wu, Yang-En;Gan, Feng-Yuan
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.52-55
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    • 2006
  • The driving-current degradation of a-Si:H thin-film transistor(TFT) device has been analyzed for the first time. A method to analyze the performance of TFT circuits is presented, which is different from the conventional one by threshold voltage shift method. It can be also used to evaluate the performance of gate driver on array (GOA) circuit, which is integrated in a 12.1" WXGA ($1280{\ast}3{\ast}800$) TFT-LCD panel.

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The Novel OverDriving Technology with Optimum Look-Up-Table

  • Huang, Ming-Wei;Huang, Juin-Ying;Tseng, Wen-Tse;Yu, Hong-Tien
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.276-279
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    • 2005
  • The proposed Novel OverDriving Technology with Optimum Look-up-Table(LUT)is suggested to be a better solution to reducing the occurrence of overshooting caused by the traditional overdriving method implemented to normally liquid crystal (VA mode). Chunghwa Picture Tubes, LTD. (CPT) has successfully implement this tech into 20 inch TFTLCD TV module at the present day. The proposed technology can speed up gray-to-gray response time of LCD less than one half of frame time. On the side, Optimum LUT construction apply the compression scheme to record total actual grayscale transfer characteristics instead of applying the normal spread method such as linear / non-linear interpolation. The memory space is been reduced and the distortion of the image quality is lesser.

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PDP의 방전구조 설계기술

  • 신범재
    • The Proceedings of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.18 no.4
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    • pp.54-64
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    • 2004
  • 본격적인 디지털 방송 시대를 앞두고 대형 TV 스크린에 대한 기술 개발 경쟁이 치열하게 전개되고 있다. 대형 디스플레이 소자로서 대표 주자인 Plasma Display Panel(PDP)의 양산에 한국, 일본 및 대만의 전자 업체들의 경쟁이 시작되었고, 이제는 30 인치 이상 대형 디스플레이로 상업화 가능성이 없었던 TFT(Thin Film Transistor) LCD(Liquid Crystal Display)가 40인치 이상의 TV 시장을 공략하기 위해서 대규모의 투자를 진행하고 있어서 PDP의 아성을 위협하기 시작했다〔1〕∼〔3〕. (중략)

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Analysis of the Horizontal Block Mura Defect

  • Mi, Zhang;Jian, Guo;Chunping, Long
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1597-1599
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    • 2007
  • In TFT-LCD, mura is a defect which degrades the display quality. The resistance difference between gate lines is the main cause of H-Block mura. Two methods could eliminate this defect. A thinner gate layer or gate fan-out pattern decrease mura level. H-Block mura has been reduced after implementing the new schemes.

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An Analysis of Mobile Display Industries (모바일 디스플레이산업 분석)

  • 배상진
    • Journal of Korea Technology Innovation Society
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    • v.5 no.3
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    • pp.396-411
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    • 2002
  • This is an analysis of international mobile displays industry. There has been severe competition in market and technology. In technology, There has been competition between Japan, USA and Korea. On the other hand, there has been competition in the products market between Korea, Japan and Taiwan. Recently Korea has catched-up Japan in mid-size display industry. The response of Japanese firms are as follows: technological collaboration with Taiwanese firms in mid-size and concentration in small and large size displays. New competition, however, has started, since new technologies such as TFT-LCD and OELD have been used in products.

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An Effective Medical Image System using TFT-DXD Method's Digital X-ray Detector (TFT-DXD 방식의 디지털 X-ray Detector를 이용한 고효율 의료 영상처리시스템)

  • Hwang, Jae-Suk;Lee, Jae-Kyun;Lee, Chae-Wook
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.32 no.4C
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    • pp.389-395
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    • 2007
  • The Film X-ray and the CCD method of current medical image system have the disadvantages such as required large place and diagnosis time. In this paper, we implement an effective medical image system using TXT-DXD method's digital X-ray detector(DR1000C). The implemented medical image system has advantages of placing efficiency and short diagnosis time. In order to make the image out of the system more effective, we develop an LCD(Liquid Crystal Display) control driver, having the resolution of 1900*1200. And we propose an enhancement unsharp masking method to update image enhancement of DR1000C medical image system, and compare it with the current methods.

The Emerging Application Potential of LTPS Technology

  • Yoneda, Kiyoshi;Yokoyama, Ryoichi;Yamada, Tsutomu;Mameno, Kazunobu
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.43-49
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    • 2003
  • Low-temperature polysilicon (LTPS) technology has continued to mature with the passing of each year since LTPS mass production began. The integration of complex circuits has become possible with advances in microprocessing, leading to the realization of panels with highly advanced functions. At the same time, efforts have been made to meet market demands for lower costs, thereby boosting competitive strength. Today, LTPS-TFT LCDs have become standard equipment for the monitors of digital still cameras, and inroads are being made into the massive cellular phone market. Micro displays such as electronic viewfinders, which were previously only possible with high-temperature polysilicon technology, can now also be made with LTPS, thus expanding the scope of the technology. AMOLED displays using the LTPS-TFT as a back plane are also approaching the stage of industrialization. The hidden potential for the OLED to replace the familiar LCD has prompted Widespread anticipation for this emerging technology. This paper reflects on the history of LTPS technology, then looks forward to its future prospects and suggests a variety of potential fields of application.

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