한국정보디스플레이학회:학술대회논문집
- 2006.08a
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- Pages.52-55
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- 2006
A Method to Predict the Performance of a-Si TFT device
- Shih, Ching-Chieh (AUO Technology Center, AU Optronics Corporation) ;
- Wei, Chun-Ching (AUO Technology Center, AU Optronics Corporation) ;
- Wu, Yang-En (AUO Technology Center, AU Optronics Corporation) ;
- Gan, Feng-Yuan (AUO Technology Center, AU Optronics Corporation)
- Published : 2006.08.22
Abstract
The driving-current degradation of a-Si:H thin-film transistor(TFT) device has been analyzed for the first time. A method to analyze the performance of TFT circuits is presented, which is different from the conventional one by threshold voltage shift method. It can be also used to evaluate the performance of gate driver on array (GOA) circuit, which is integrated in a 12.1" WXGA (
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