• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.1
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• pp.1-11
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• 1997

A BiCMOS circuit consists of the CMOS part which performs the logic function, and the bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential beavior. Also, stuck-on faults enhanced IDDQ (quiscent power supply current) at steady state. In this paper, a method is proposed which efficiently generates test patterns to detect stuck-open faults and stuck-on faults in BiCMOS circuits. The proposed method divides the BiCMOS circuit into pull-up part and pull-down part, and generates test patterns detect faults occured in each part by structural property of the BiCMOS circuit.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.11
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• pp.42-48
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• 1990

In this paper robust test generation for stuck-open faults in CMOS circuits is proposed. By obtaining initialization patterns and test patterns using the relationship of bit position and Hamming weight among input vectors for CMOS circuit test generation time for stuck-open faults can be reduced, and the problem of input transition skew which make fault detection difficult is solved, and the number of test sequences are minimized. Also the number of test sequences is reduced by arranging test sequences using Hamming distance between initialization patterns and test patterns for circuit.

• The Transactions of the Korea Information Processing Society
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• v.4 no.2
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• pp.628-638
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• 1997

This paper describes an implementation of fault simulator that can switch level fault models such as transistor stuck-open and stuck-closed faults as well as stuck-at faults. It overcomes the limitation when only stuck-at faults are used in VLSI circuits. Signal flow of a transistor switch is bidirectional in its nature, but most of signal flows in a switch level circuits, about 95%, are in one direction. This fault simulator focuses on the way which changes a switch level circuit into a graph model with two directed edges. Two paths from Vdd to ground and from ground to directions. Logic simulation is performed along dominant signal flows. The switch level fault simulation estimates the dominant path by injecting switch-level fualts, and pattern vectors are used for faults simulation. Experimental results are shown to demonstrate correctness of the fault simulator.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.53 no.1
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• pp.22-27
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• 2004

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

• Journal of the Korean Institute of Telematics and Electronics
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• v.21 no.5
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• pp.55-60
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• 1984

With the advancement of CMOS technology, it has become attractive to employ complex gate structures in realizing digital circuits. A new test generation algorithm for CMOS complex gates to detect all stuck-open and stuck-on faults considering internal gate response and unknown state is proposed. Minimal and complete set can be derived by this algorithm. Also, it is verified that such a test set is generated applying this algorithm to arbitrary CMOS complex gates by computer.

• Journal of the Korean Institute of Telematics and Electronics
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• v.21 no.6
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• pp.78-84
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• 1984

We propose a new algorithm which detects stuck-open faults in CMOS circuits without being affected by time skews not using additional circuits. That is, the Domino CMOS circuit structure is used as circuit configurations and the clocking gate in this circuit is modeled as one branch, then test sequence is generated by using the transition test. Also, it is verified by applying this algorithm implemented in VAX II/780 to arbitrary CMOS circuits that all of stuck-open faults which were not detected because of time skews in conventional methods is detected.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.29B no.9
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• pp.1-7
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• 1992

This paper proposes a built-in self-test tchnique for CMOS circuits. To detect a stuck-open fault in CMOS circuits, two consequent test patterns is required. The ordered pairs of test patterns for stuck-open faults are generated by feedback shift registers of extended length. A nonlinear feedback shift register is designed by the merging method and reordering algorithms of test patterns proposed in this paper. And a new multifunctional BILBO (Built-In Logic Block Observer) is designed to perform both test pattern generation and signature analysis efficiently.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.32B no.5
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• pp.661-670
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• 1995

This paper presents a fast massively parallel automatic test pattern generator for digital combinational logic circuits using neural networks. Automatic test pattern generation neural network(ATPGNN) evolves its state to a stable local minima by exchanging messages among neural network modules. In preprocessing phase, we calculate the essential assignments for the stuck-at faults in fault list by adopting dominator concept. It makes more neurons be fixed and the system speed up. Consequently. fast test pattern generation is achieved. Test patterns for stuck-open faults are generated through getting initialization patterns for the obtained stuck-at faults in the corresponding ATPGNN.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.2
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• pp.173-183
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• 1996

In this paper, a new structure that can do fault detection and location of digial logic circuits more efficiently using current testing techniques is proposed. In the conventional method, observation point for steady state power supply current was only one, but in the proposed method more fault classes are divided for fault detection and location through the ovservation of steady state power supply current at two points. Also, it is shown that this structure can be easily applied in detection of stuck-open fault which is not easy to do testing with conventional current testing techniques. In the presented mehtod, an extra trasnistor is used, and current path is made compulsorily in the CMOS circuits in which no current path can be established in steady state, then it can be known that stuck-open tault is in the MOS transistor on the considering current path, if this path disappears due to stuck-open fault. The validity and the effectiveness is shwon, thorugh the SPICE simulation of circuits with fault and the current path search experiment using current path search program based on transistor short model wirtten in C language on SUN sparc workstation.