• 제목/요약/키워드: SnO$_2$ thin films

검색결과 303건 처리시간 0.027초

Si 첨가에 따른 리튬 이차 박막 전지용 주석 산화물 박막의 음극 특성 (Anode Characteristics of Tin Oxide Thin Films According to Various Si Additions for Lithium Secondary Microbattery)

  • 박건태;박철호;손영국
    • 한국세라믹학회지
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    • 제40권1호
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    • pp.69-76
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    • 2003
  • 리튬이차 박막전지로서, 실리콘 첨가(0, 2, 6, 10, 20㏖%)에 따른 주석 산화물 박막을 기판온도 30$0^{\circ}C$, Ar:O$_2$=7:3으로 R.F. magnetron sputtering법으로 제조하였다. 실리콘의 함량이 증가함에 따라, Si-O 결합량이 증가하고 Sn-O 결합량은 감소하였다. 적정량의 실리콘 첨가는 주석의 산화상태를 감소시켜 비가역성을 줄이고 충방전 동안 주석의 부피변화를 막아 사이클 특성이 향상되는 결과를 보여주었다. 6㏖% Si를 첨가한 주석 산화물 박막은 100사이클동안 700mAh/g의 용량을 가지는 가장 좋은 사이클 특성을 나타내었다.

Ta Doped SnO2 Transparent Conducting Films Prepared by PLD

  • Cho, Ho Je;Seo, Yong Jun;Kim, Geun Woo;Park, Keun Young;Heo, Si Nae;Koo, Bon Heun
    • 한국재료학회지
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    • 제23권8호
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    • pp.435-440
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    • 2013
  • Transparent and conducting thin films of Ta-doped $SnO_2$ were fabricated on a glass substrate by a pulse laser deposition(PLD) method. The structural, optical, and electrical properties of these films were investigated as a function of doping level, oxygen partial pressure, substrate temperature, and film thickness. XRD results revealed that all the deposited films were polycrystalline and the intensity of the (211) plane of $SnO_2$ decreased with an increase of Ta content. However, the orientation of the films changed from (211) to (110) with an increase in oxygen partial pressure (40 to 100 mTorr) and substrate temperature. The crystallinity of the films also increased with the substrate temperature. The electrical resistivity measurements showed that the resistivity of the films decreased with an increase in Ta doping, which exhibited the lowest resistivity (${\rho}{\sim}1.1{\times}10^{-3}{\Omega}{\cdot}cm$) for 10 wt% Ta-doped $SnO_2$ film, and then increased further. However, the resistivity continuously decreased with the oxygen partial pressure and substrate temperature. The optical bandgap of the 10 wt% Ta-doped $SnO_2$ film increased (3.67 to 3.78 eV) with an increase in film thickness from 100-700 nm, and the figure of merit revealed an increasing trend with the film thickness.

악취분별능력을 가진 자동차용 고기능 듀얼타입 집적형 유해가스 유입차단센서 개발 (Development of High Sensitive Integrated Dual Sensor to Detect Harmful Exhaust Gas and Odor for the Automotive)

  • 정완영;심창현
    • 제어로봇시스템학회논문지
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    • 제13권7호
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    • pp.616-623
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    • 2007
  • A dual micro gas sensor array was fabricated using nano sized $SnO_2$ thin films which had good sensitivities to CO and combustible gases, or $H_2S$ gas for air quality sensors in automobile. The already existed air quality sensor detects oxidizing gases and reducing gases, the air quality sensor(AQS), located near the fresh air inlet detected the harmful gases, the fresh air inlet door/ventilation flap was closed to reduce the amount of pollution entering the vehicle cabin through HVAC(heating, ventilating, and air conditioning) system. In this study, to make $SnO_2$ thin film AQS sensor, thin tin metal layer between 1000 and $2000{\AA}$ thick was oxidized between 600 and $800^{\circ}C$ by thermal oxidation. The gas sensing layers such as $SnO_2$, $SnO_2$(pt) and $SnO_2$(+CuO) were patterned by metal shadow mask for simple fabrication process on the silicon substrate. The micro gas sensors with $SnO_2$(+Pt) and $SnO_2$(CuO) showed good selectivity to CO gas among reducing gases and good sensitivity to $H_2S$ that is main component of bad odor, separately.

라디오주파수 분말 스퍼터링 방법으로 성장시킨 주석을 도핑한 산화아연 박막의 열처리 (Annealing of Sn Doped ZnO Thin Films Grown by Radio Frequency Powder Sputtering)

  • 이하람;정병언;양명훈;이종관;최영빈;강현철
    • 열처리공학회지
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    • 제31권3호
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    • pp.111-119
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    • 2018
  • We report the post-annealing effect of Sn doped ZnO (ZnO:Sn) thin film grown on sapphire (001) substrate using radio-frequency powder sputtering method. During thermal annealing in a vacuum atmosphere, the ZnO:Sn thin film is transformed into a porous thin film. Based on X-ray diffraction, scanning electron microscopy, and energy dispersive X-ray analyses, a possible mechanism for the production of pores is presented. Sn atoms segregate to form clusters that act as catalysts to dissociate Zn-O bonds. The Zn and O atoms subsequently vaporize, leading to the formation of pores in the ZnO:Sn thin film. We also found that Sn clusters were oxidized to form SnO or $SnO_2$ phases.

SnS (tin monosulfide) thin films obtained by atomic layer deposition (ALD)

  • Hu, Weiguang;Cho, Young Joon;Chang, Hyo Sik
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.305.2-305.2
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    • 2016
  • Tin monosulfide (SnS) is one promising candidate absorber material which replace the current technology based on cadmium telluride (CdTe) and copper indium gallium sulfide selenide (CIGS) for its suitable optical band gap, high absorption coefficient, earth-abundant, non-toxic and cost-effective. During past years work, thin film solar cells based on SnS films had been improved to 4.36% certified efficiency. In this study, Tin monosul fide was obtained by atomic layer deposition (ALD) using the reaction of Tetrakis (dimethylamino) tin (TDMASn, [(CH3)2N]4Sn) and hydrogen sulfide (H2S) at low temperatures (100 to 200 oC). The direct optical band gap and strong optical absorption of SnS films were observed throughout the Ultraviolet visible spectroscopy (UV VIS), and the properties of SnS films were analyzed by sanning Electron Microscope (SEM) and X-Ray Diffraction (XRD).

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Compositional Study of Surface, Film, and Interface of Photoresist-Free Patternable SnO2 Thin Film on Si Substrate Prepared by Photochemical Metal-Organic Deposition

  • Choi, Yong-June;Kang, Kyung-Mun;Park, Hyung-Ho
    • 마이크로전자및패키징학회지
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    • 제21권1호
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    • pp.13-17
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    • 2014
  • The direct-patternable $SnO_2$ thin film was successfully fabricated by photochemical metal-organic deposition. The composition and chemical bonding state of $SnO_2$ thin film were analyzed by using X-ray photoelectron spectroscopy (XPS) from the surface to the interface with Si substrate. XPS depth profiling analysis allowed the determination of the atomic composition in $SnO_2$ film as a function of depth through the evolution of four elements of C 1s, Si 2p, Sn 3d, and O 1s core level peaks. At the top surface, nearly stoichiometric $SnO_2$ composition (O/Sn ratio is 1.92.) was observed due to surface oxidation but deficiency of oxygen was increased to the interface of patterned $SnO_2/Si$ substrate where the O/Sn ratio was about 1.73~1.75 at the films. This O deficient state of the film may act as an n-type semiconductor and allow $SnO_2$ to be applied as a transparent electrode in optoelectronic applications.

A Study on an Oxygen Vacancy and Conductivity of Oxide Thin Films Deposited by RF Magnetron Sputtering and Annealed in a Vacuum

  • Oh, Teresa
    • Transactions on Electrical and Electronic Materials
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    • 제18권1호
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    • pp.21-24
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    • 2017
  • Usually, the oxygen vacancy is an important factor in an oxide semiconductor device because the conductivity is related to the oxygen vacancy, which is formed at the interface between oxide semiconductors and electrodes with an annealing processes. ZTO is made by mixing n-type ZnO and p-type $SnO_2$. Zink tin oxide (ZTO), zink oxide (ZnO) and tin oxide ($SnO_2$) thin films deposited by RF magnetron sputtering and annealed, to generate the oxygen vacancy, were analyzed by XPS spectra. The contents of oxygen vacancy were the highest in ZTO annealed at $150^{\circ}C$, ZnO annealed at $200^{\circ}C$ and $SnO_2$ annealed at $100^{\circ}C$. The current was also increased with increasing the oxygen vacancy ions. The highest content of ZTO oxygen vacancies was obtained when annealed at 150. This is the middle level in compared with those of ZnO annealed at $200^{\circ}C$ and $SnO_2$ annealed at $100^{\circ}C$. The electrical properties of ZTO followed those of $SnO_2$, which acts a an enhancer in the oxide semiconductor.

RF-마그네트론 스퍼터링에 의해 제조된 In1.6Zn0.2Sn0.2O3-δ 박막의 투과율 및 전기 전도성에 미치는 증착 온도의 영향 (Effect of the Deposition Temperature on the Transmittance & Electrical Conductivity of In1.6Zn0.2Sn0.2O3-δ Thin Films Prepared by RF-magnetron Sputtering)

  • 서한;지미정;안용태;주병권;최병현
    • 한국세라믹학회지
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    • 제49권6호
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    • pp.663-668
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    • 2012
  • In order to reduce the indium contents in transparent conducting oxide(TCO) thin films of $In_{1.6{\sim}1.8}Zn_{0.2}Sn_{0.2{\sim}0.4}O_3$ (IZTO), $In_{1.6}Zn_{0.2}Sn_{0.2}O_{3-{\delta}}$(IZTO) was prepared by replacing indium with Zn and Sn. The TCO films were deposited via RF-magnetron sputtering of the IZTO target at various deposition temperatures and its film characteristics were investigated. When deposited in an Ar atmosphere at $400^{\circ}C$, the electrical resistivity of the film decreased to $6.34{\times}10^{-4}{\Omega}{\cdot}cm$ and the optical transmittance was 80%. As the deposition temperature increased, the crystallinity of the IZTO film was enhanced. As a result, the electrical conductivity and transmittance properties were improved. This demonstrates the possibility of replacing ITO TCO film with IZTO.

롤투롤 스퍼터를 이용하여 PET 기판 위에 제조된 ITO 박막의 색도(b*) 및 투과도 연구 (Chromaticity (b*) and Transmittance of ITO Thin Films Deposited on PET Substrate by Using Roll-to-Roll Sputter System)

  • 서성만;강보갑;김후식;임우택;최식영
    • 한국재료학회지
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    • 제19권7호
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    • pp.376-381
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    • 2009
  • Indium Tin Oxide (ITO) thin films on Polyethylene Terephtalate (PET) substrate were prepared by Roll-to-Roll sputter system with targets of 5 wt% and 10 wt% $SnO_2$ at room temperature. The influence of the chromaticity (b*) and transmittance properties of the ITO Films were investigated. The ITO thin films were deposited as a function of the DC power, rolling speed, and Ar/$O_2$ gas flow ratio, and then characterized by spectrophotometer. Their crystallinity and surface resistance were also analyzed by X-ray diffractometer and 4-point probe. As a result, the chromaticity (b*) and transmittance of the ITO films were broadly dependent on the thickness, which was controlled by the rolling speed. When the ITO films were prepared with the DC power of 300 W and the Ar/$O_2$ gas flow ratio of 30/1 sccm using 10 wt% $SnO_2$ target as a function of the rolling speeds 0.01 through 0.10 m/min, its chromaticity (b*) and transmittance were about -4.01 to 11.28 and 75.76 to 86.60%, respectively. In addition, when the ITO films were deposited with the DC power of 400W and the Ar/$O_2$ gas flow ratio of 30/2 sccm used in 5 wt% $SnO_2$ target, its chromaticity (b*) and transmittance were about -2.98 to 14.22 and 74.29 to 88.52%, respectively.

대면적 기판의 투명 전극용 SnO2 박막 증착을 위한 APCVD 공정 (APCVD Process of SnO2 Thin-Film on Glass for Transparent Electrodes of Large-Scale Backplanes)

  • 김병국;김현수;김형준;박준우;김윤석;박승호
    • 대한기계학회논문집 C: 기술과 교육
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    • 제1권1호
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    • pp.7-12
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    • 2013
  • $SnO_2$ (tin oxide) 박막은 물리적, 전기적 성질이 우수하여 첨단산업의 다양한 분야에서 널리 응용/개발되고 있다. 이의 응용대상은 다양한 센서, 윈드쉴드(windshield) 윈도우의 히팅 요소, 태양전지, flat panel diplay에서의 투명전극을 들 수 있다. 본 연구에서는 대면적 기판에 대한 APCVD 공정개발을 위하여 실험용 2세대 크기의 유리기판에 $SnO_2$ 박막증착 실험을 수행하였다. 증착 온도가 증가함에 따라 증착 두께가 두꺼워지고 이에 따라 면저항은 감소, 투과도는 감소, 연무도 (haze)는 증가함을 확인하였다. 증착을 위한 전구체인 $SnCl_4$의 유량이 증가함에 따라 증착 두께 역시 증가하고 이에 따라 면저항은 감소한다. 그러나 투과도와 연무도는 $SnCl_4$ 유량의 영향을 거의 받지 않는다는 것을 확인하였다.