• Journal of Physiology & Pathology in Korean Medicine
• /
• v.28 no.4
• /
• pp.440-445
• /
• 2014

Korean medical system is unique system that has two medical system, Western medical institution and Korean medical institution. In this environment, patients who use each medical institution have different selection factors. The study explores the selection factors' difference of korean/western medical institutions. The empirical analysis of the surveyed data produced the following outcomes. The result of factor analysis, four factors were extracted. That was Human services, Costs and Physical Environment, Prestige and reputation, Public relations and reliability. Overall, the four selection factor importance scores of Korean medical institution were higher than western medical institution's. These findings show that there is a difference between korean and western medical institutions in terms of selection factors. After this study, More study about medical management and healthcare policy including korean medical characteristics is needed.

• Structural Engineering and Mechanics
• /
• v.25 no.3
• /
• pp.347-363
• /
• 2007

A novel methodology, referred to as Auxiliary Domain Method (ADM), allowing for a very efficient solution of nonlinear reliability problems is presented. The target nonlinear failure domain is first populated by samples generated with the help of a Markov Chain. Based on these samples an auxiliary failure domain (AFD), corresponding to an auxiliary reliability problem, is introduced. The criteria for selecting the AFD are discussed. The emphasis in this paper is on the selection of the auxiliary linear failure domain in the case where the original nonlinear reliability problem involves multiple objectives rather than a single objective. Each reliability objective is assumed to correspond to a particular response quantity not exceeding a corresponding threshold. Once the AFD has been specified the method proceeds with a modified subset simulation procedure where the first step involves the direct simulation of samples in the AFD, rather than standard Monte Carlo simulation as required in standard subset simulation. While the method is applicable to general nonlinear reliability problems herein the focus is on the calculation of the probability of failure of nonlinear dynamical systems subjected to Gaussian random excitations. The method is demonstrated through such a numerical example involving two reliability objectives and a very large number of random variables. It is found that ADM is very efficient and offers drastic improvements over standard subset simulation, especially when one deals with low probability failure events.

• KSII Transactions on Internet and Information Systems (TIIS)
• /
• v.10 no.3
• /
• pp.1111-1130
• /
• 2016

Cooperative communications can significantly improve the wireless transmission performance with the help of relay nodes. In cooperative communication networks, relay selection and power allocation are two key issues. In this paper, we propose a relay selection and power allocation scheme RS-PA-PSACO (Relay Selection-Power Allocation-Particle Swarm Ant Colony Optimization) based on PSACO (Particle Swarm Ant Colony Optimization) algorithm. This scheme can effectively reduce the computational complexity and select the optimal relay nodes. As one of the swarm intelligence algorithms, PSACO which combined both PSO (Particle Swarm Optimization) and ACO (Ant Colony Optimization) algorithms is effective to solve non-linear optimization problems through a fast global search at a low cost. The proposed RS-PA-PSACO algorithm can simultaneously obtain the optimal solutions of relay selection and power allocation to minimize the SER (Symbol Error Rate) with a fixed total power constraint both in AF (Amplify and Forward) and DF (Decode and Forward) modes. Simulation results show that the proposed scheme improves the system performance significantly both in reliability and power efficiency at a low complexity.

• Journal of Technologic Dentistry
• /
• v.37 no.4
• /
• pp.285-293
• /
• 2015

Purpose: The following study analyzes the mediating effects of professionalism on the relationship between major selection conviction and career decision level of dental technology students. It is to be used as basic data for improvement of the students' career decision level and an effective way to train professionals of the colleges. Methods: The survey was conducted on dental technology students. The collected data was analyzed by the statistical program SPSS 18.0. The results were analyzed by reliability, frequency, multiple-way ANOVA, correlation, multiple regression. To test for significance on each item, p<0.05 has been decided as a standard. Results: The analysis shows that the students' age and clinical practice experience bring a significant difference in major selection conviction, career decision level and professionalism. Professionalism has been found to bring significance mediating effects in relation to major selection conviction and career decision level. Conclusion: To improve the quality and pride as a professional as well as satisfaction with major selection can be expected to raise the standard of the students' career decision level.

• The Korean Journal of Food & Health Convergence
• /
• v.8 no.4
• /
• pp.23-30
• /
• 2022

This study aims to analyze the premium hamburger market, which has recently become popular, the effect of the importance of the customer selection attribute of premium hamburgers on customer satisfaction, and the effect of customer satisfaction on repurchase intention. Existing research has focused on the importance of the selection attributes of premium hamburgers. Quality, convenience, experience, and presentation visuals were selected as customer selection attributes. This study analyzed 158 customers who had purchased and tasted premium hamburgers. To verify reliability and validity, a confirmatory factor analysis and discriminant validity analysis were performed, and a path analysis was carried out using structural equation modeling. The results showed that the quality, convenience, experience, and presentation visuals of premium hamburgers had a statistically significant effect on satisfaction. Moreover, satisfaction was verified to have a significant effect on repurchase intention. Customers' preference for premium burgers will continue to increase, thanks to the growth in national income, single-person families, and healthy food wellness. It was empirically proven that the selection attributes of premium burgers have a statistically significant effect on customer satisfaction and that satisfaction significantly affects repurchase intention. This study broadens the research horizon and has practical implications.

• Journal of Applied Reliability
• /
• v.18 no.1
• /
• pp.56-65
• /
• 2018

Purpose: The purpose of this study is to estimate shelf life of fuze MTSQ (Mechanical Time & Super Quick) KM577A1 from Ammunition Stockpile Reliability Program (ASRP) data. Methods: For many years, ammunition test data had been gathered from ASRP. In this study, lot selection criteria and reliability score of functioning time for fuze are proposed. Reliability score of functioning time and failure data are used to estimate shelf life. Results: The results of this study are as follows; The failure modes of fuze MTSQ KM577A1 are dud, inverse function and mechanical time functioning failure (not operating in intended time). Dud and inverse function are major failure modes. Fuze MTSQ KM577A1's shelf life ($B_5$) is estimated 18.2 years conservatively. Conclusion: Degradation of chemical components in fuze MTSQ KM577A1 is major factor for its reliability. And shelf life ($B_5$) of fuze MTSQ KM577A1 is estimated 18.2 years conservatively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2004.11a
• /
• pp.53-56
• /
• 2004

This paper presents the improved burn-in method for the reliability of SRAM in MCP Semiconductor reliability is commonly improved through the burn-in process. Reliability problem is more significant in the Multi Chip Package, because of including over two devices in a package. In the SRAM-based Multi Chip Package, the failure of SRAM has a large effect on the yield and quality of the other chips - Flash Memory, DRAM, etc. So, the quality of SRAM must be guaranteed. To improve the quality of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the current used methods. That method is effective in detecting special failure. Finally, with the composition of some kinds of methods, we could achieve the high qualify of SRAM in Multi Chip Package.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
• /
• v.21 no.1
• /
• pp.111-117
• /
• 2007

This paper presents a new approach to evaluate reliability indices of electric distribution systems using genetic Algorithm (GA). The use of reliability evaluation is an important aspect of distribution system planning and operation to adjust the reliability level of each area. In this paper, the reliability model is based on the optimal load transforming problem to minimize load generated load point outage in each sub-section. This approach is one of the most difficult procedures and become combination problems. A new approach using GA was developed for this problem. GA is a general purpose optimization technique based on principles inspired from the biological evolution using metaphors of mechanisms such as natural selection, genetic recombination and survival of the fittest. Test results for the model system with 24 nodes 29 branches are reported in the paper.

• Transactions on Electrical and Electronic Materials
• /
• v.5 no.4
• /
• pp.138-142
• /
• 2004

This paper presents the improved bum-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved through the bum-in process. Reliability problem is more significant in MCP that includes over two chips in a package, because the failure of one chip (SRAM) has a large influence on the yield and quality of the other chips - Flash Memory, DRAM, etc. Therefore, the quality of SRAM must be guaranteed. To improve the quality of SRAM, we applied the improved wafer level bum-in process using multi cells selection method in addition to the previously used methods. That method is effective in detecting special failure. Finally, with the composition of some kind of methods, we could achieve the high quality of SRAM in Multi Chip Package.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.18 no.6
• /
• pp.506-509
• /
• 2005

This paper presents the improved burn-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved by the burn-in process. Reliability Problem is very significant in the MCP which includes over two chips in a package because the failure of one SRAM chip has a large influence on the yield and quality of the other chips such as Flash Memory, DRAM, etc. Therefore the quality of SRAM must be guaranteed. To improve the qualify of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the previously used methods and it is found to be effective in detecting particular failures. Finally, with the composition of some kinds of methods, we achieved the high quality of SRAM in MCP.