• 한국정보통신학회논문지
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• 제15권8호
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• pp.1813-1819
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• 2011

본 연구에서 제안하는 위치인식시스템은 전파의 위상 및 크기를 이용하여 거리를 구하고 여기서 구한 거리 정보를 보다 정확하게 측정하기 위해서 비젼에 의한 영상 히스토그램 기법을 이용하여 보완하는 기술이다. 제안하는 기술은 거리측정용 무선송수신기로부터 송수신된 900Mhz대 RF 신호로부터 중간주파수인 450Khz의 아날로그 데이터를 디지털신호처리를 통하여 얻어내며, 여기서 얻어진 거리 정보에다 비젼에 의해 얻어진 거리를 상호 보완하여 보다 정확한 거리 정보를 획득한다. 측정된 거리의 평가를 위해서 실제거리와 측정된 거리를 비교 분석하고, 또한 평균처리 및 진폭특성을 통한 측정오차 개선 방법과 기존의 RF 신호만 이용하는 경우와 비교 검토한다.

• Nuclear Engineering and Technology
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• 제50권1호
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• pp.203-210
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• 2018

As the modernization of the nuclear instrumentation system progresses, research reactors have adopted digital wide-range neutron power measurement (DWRNPM) systems. These systems typically monitor the neutron flux across a range of over 10 decades. Because neutron detectors only measure the local neutron flux at their position, the local neutron flux must be converted to total reactor power through calibration, which involves mapping the local neutron flux level to a reference reactor power. Conventionally, the neutron power range is divided into smaller subranges because the neutron detector signal characteristics and the reference reactor power estimation methods are different for each subrange. Therefore, many factors should be considered when preparing the calibration procedure for DWRNPM channels. The main purpose of this work is to serve as a reference for performing the calibration of DWRNPM systems in research reactors. This work provides a comprehensive overview of the calibration of DWRNPM channels by describing the configuration of the DWRNPM system and by summarizing the theories of operation and the reference power estimation methods with their associated calibration procedure. The calibration procedure was actually performed during the commissioning of an open-pool type research reactor, and the results and experience are documented herein.

• 한국생산제조학회지
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• 제8권4호
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• pp.130-135
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• 1999

The main scale of linear encoder greatly effects on the precision of displacement measurement. Especially when needing the long range measurement the length of main scale should be increased accordingly. In this paper we propose a linear encoder that uses laser interference pattern as main scale for long range measurement. The linear encoder is similar to Michelson interferometer excepting that the reference mirror is tilted so as to obtain interference fringe pattern and a grating panel is attached on a quadratic photo diodes. Four kinds of grating having phase difference of 0. $\pi$/4, $\pi$/2, 3$\pi$/4 are arranged on the panel. The experimental results show that signals of quadratic photo diode A, B, {{{{ {-}atop {A } }}}} and {{{{ {- } atop {B } }}}} are cosine wavelike and successive signals have phase difference of $\pi$/4 each other. So the proposed method can achieve improved measurement resolution.

• 한국정밀공학회지
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• 제20권2호
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• pp.104-111
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• 2003

Micro force measurement is required more frequently for a precision manufacturing and investment in fields of precision industries such as semiconductor, chemistry and biology, and so forth. Null balance method has been introduced as an alternative of a loadcell. Loadcells have advantages in aspects of low cost and easy manufacturing, but have also the limitation in resolution and sensitivity to environment variations. In this paper, null balance method is explained and the dominant parameters related to system performances are mentioned. Null position sensor, electromagnetic system and controller are investigated. Also, the characteristic experiment is carried out in order to estimate the resolution and the measurement range. In order to overcome the limitation by the drift of position sensor and the performance of controller, double electromagnetic force compensation method is proposed and experimented. After controlling and filtering, the resolution under $\pm$ 1mg and measurement range over 300g could be obtained.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 1999년도 춘계학술대회 논문집
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• pp.170-174
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• 1999

The main scale of linear scale greatly affects on the precision of displacement measurement. Especially when needing the long range measurement, the length of main scale should be increased accordingly. In this paper, we propose a linear scale that uses laser interference pattern as main scale for long range measurement. The linear scale is similar to Michelson interferometer excepting that the reference mirror is tilted so as to obtain interference fringe pattern and a grating panel is attached on a quadratic photo diodes. Four kinds of grating having phase differences of 0, $\pi$ /4, $\pi$ /2, 3 $\pi$ /4 are arranged on the panel. The experimental results show that signals of - quadratic photo diode, A, B,$\overline{A}$ and $\overline{B}$ are cosine wavelike and successive signals have phase difference of $\pi$/4 each other. So the proposed method can achieve improved measurement resolution.

• 한국광학회지
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• 제21권2호
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• pp.46-52
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• 2010

본 논문에서는 양방향 반사율 분포함수의 이론과 제작된 측정시스템 및 측정불확도의 평가방법을 소개한다. (380~1500) nm의 분광 양방향 반사율 분포함수를 $(-75{\sim}75)^{\circ}$의 각도 범위에서 측정할 수 있는 측정시스템을 제작하였고, 상관관계가 있는 불확도 성분과 상관관계가 없는 불확도 성분으로 나누어 측정불확도를 평가하였다. 평가 결과, 제작된 양방향 반사율 분포함수 측정시스템의 상대확장불확도는 3% (k=2) 이하로 평가되었다.

• International Journal of Precision Engineering and Manufacturing
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• 제6권4호
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• pp.14-20
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• 2005

In this paper, a new field of metrology called 'precision nanometrology' is presented. The 'precision nanometrology' is the result of evolutions of the traditional 'precision metrology' and the new 'nanometrology'. 'Precision nanometrology' is defined here as the science of dimensional measurement and motion measurement with 100 nm to 0.1 nm resolution/uncertainty within a range of micrometer to meter. The definition is based on the fact that nanometrology in nanoengineering and the precision industries, such as semiconductor industry, precision machine tool industry, precision instrument industry, is not only concerned with the measurement resolution and/or uncertainty but also the range of measurement. It should also be pointed out that most of the measurement objects in nanoengineering have dimensions larger than 1 micrometer. After explaining the definition of precision nanometrology, the paper provides several examples showing the critical roles of precision nanometrology in precision nanosystems, including nanometrology system, nanofabrication system, and nanomechatronics system.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2001년도 ICCAS
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• pp.163.2-163
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• 2001

Confocal scanning microscopy (CSM) has been reported as an excellent method using the optical probe in scanning probe microscopy (SPM). Transmission or reflection confocal scanning microscopy (TCSM, RCSM) has been used in the three-dimensional reconstruction of specimen or the non-destructive measurement in vivo. The axial movement of the primary focal point having the information of specimen gives a good measurement performance with the great sensitivity. Application of the confocal theory and astigmatism to displacement measurement sensor uses the aperture as the pinhole or slit after collecting lens relating to confocal response in non-contact measurement; and astigmatic lens using four-segments detector as short-range sensor, long-range one combining the grating and rotary one hating the rotary directional grating. The aperture type can play an ...

• 한국항공우주학회지
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• 제45권9호
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• pp.757-765
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• 2017

위성항법시스템 (GNSS: Global Navigation Satellite System)으로 계산되는 위치 정확도는 위성 의사거리 (Pseudo-Range) 측정값 정확도와 DOP (Dilution of Precision) 으로 표현되는 위성의 배치관계를 통해 결정된다. 위성의 의사거리 측정값은 위성 시계, 궤도, 전리층, 대류층, 다중경로 등 여러 요인에 의해 오차가 발생하게 되며, 사용자 의사거리정확도를 향상을 위해서는 정확한 의사거리 측정값이 필요하다. 반면, 위성의 배치의 경우, 사용자의 수신환경에 따라 위치 정확도가 달라진다. 예를 들어, 고층 빌딩이 많은 도심의 경우에는 위성전파 차단의 위험이 많아 가시위성의 수가 감소하고 개활지에 비해 상대적으로 양호한 DOP을 가지기 어렵다. 본 논문은 가상위성 (Virtual Satellite)을 통해 DOP 성능 개선과 의미있는 가상거리측정값 (VRM: Virtual Range Measurement) 정확도를 확보하여, 위치 정확도 향상 시키는 방법에 대해 연구하였다. 그 결과 적절한 가상위성배치와 정확한 가상 거리측정값을 이용하면 수직위치 정확도의 개선 효과를 얻을 수 있었다.

• 제어로봇시스템학회논문지
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• 제7권10호
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• pp.837-842
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• 2001

In this paper, we design and implement the DC characteristic measurement system for semiconductor devices. The proposed system is composed of 4 SMU(Source and Measure Unit) channels. Various efforts in hardware and software have been made to reduce the measurement errors. Internal and external sources of errors in measurement system especially in pA range measurement have been identified and removed. Also, various digital signal processing techniques are developed. Calibration is executed under the control of microprocessor periodically. Experimental results show that the implemented system can measure the DC characteristic of semiconductor devices with less than 0.2% error in various voltage and current source/measurement range.