• Title/Summary/Keyword: Polishing methods

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A Study on the Optimization of Deburring Process for the Micro Channel using EP-MAP Hybrid Process (전해-자기 복합 가공을 이용한 마이크로 채널 디버링공정 최적화)

  • Lee, Sung-Ho;Kwak, Jae-Seob
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.22 no.2
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    • pp.298-303
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    • 2013
  • Magnetic abrasive polishing is one of the most promising finishing methods applicable to complex surfaces. Nevertheless this process has a low efficiency when applied to very hardened materials. For this reason, EP-MAP hybrid process was developed. EP-MAP process is expected to machine complex and hardened materials. In this research, deburring process using EP-MAP hybrid process was proposed. EP-MAP deburring process is applied to micro channel, thereby it can obtain both deburring process and polishing process. EP-MAP deburring process on the micro channel was performed. Through design of experiment method, error of height in this process according to process parameter is analyzed. When the level 1 parameter A(magnetic flux density) and level 2 parameter B(electric potential), C(working gap) and level 3 parameter D(feed rate) are applied in the deburring process using EP-MAP hybrid process, it provides optimum result of EP-MAP hybrid deburring process.

A Study on Interlayer Dielectric CMP Using Diamond Conditioner (다이아몬드 컨디셔너를 이용한 ILD CMP에 관한 연구)

  • 서헌덕;김형재;김호윤;정해도
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.86-89
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    • 2003
  • Chemical Mechanical Planarization(CMP) has been accepted as the most effective processes for ultra large scale integrated (ULSI) chip manufacturing. However, as the polishing process continues, pad pores get to be glazed by polishing residues, which hinder the supply of new slurry. And pad surface is ununiformly deformed as real contact distance. These defects make material removal rate(MRR) decrease with a number of polishied wafer. Also the desired within-chip planarity, within wafer non-uniformity(WIWNU) and wafer to wafer non-uniformity(WTWNU) arc unable to be achieved. So, pad conditioning in CMP Process is essential to overcome these defects. The eletroplated or brazed diamond conditioner is used as the conventional conditioning. And. allumina long fiber, the jet power of high pressure deionized water, vacuum compression. ultrasonic conditioner aided by cavitation effect and ceramic plate conditioner are once used or under investigation. But. these methods arc not sufficient for ununiformly deformed pad surface and the limits of conditioning effect. So this paper focuses on the characteristics of diamond conditioner which reopens glazed pores and removes ununiformly deformed pad away.

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Planarization Characteristics of CMP for WO3 Film with an Addition of Oxidizers (산화제 첨가에 따른 WO3 박막의 CMP 평탄화 특성)

  • Lee, Woo-Sun;Ko, Pil-Ju;Kim, Nam-Hoon;Seo, Yong-Jin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.1
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    • pp.12-16
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    • 2005
  • Chemical mechanical polishing (CMP) process is one of the most useful methods for improving the surface roughness of films. The effects of CMP on the surface morphology of WO$_3$ films prepared by RF sputtering system were investigated in this paper. A removal rate of films increased, and the uniformity performance of surface decreased with the addition of an oxidizer to the tungsten slurry. Non-uniformity performance of surface was superior as its value was below 5 % when oxidizers of 5.0 vol% and 2.5 vol%, respectively, were added to the tungsten slurry. The optimized oxidizer concentration, reflected both the improved roughness values and hillock-free surface with the good uniformity performance, was 5.0 vol% as an atomic force microscopy(AFM) analysis of thin film topographies. Our CMP results will be a useful reference for advanced technology of thin films for gas sensor applications in the near future.

Effect of Slurry Flow in Spray Slurry Nozzle System on Cu CMP (스프레이 슬러리 노즐 시스템에서 슬러리 유동이 Cu CMP에 미치는 영향)

  • Lee, Da Sol;Jeong, Seon Ho;Lee, Jong Woo;Jeong, Jin Yeop;Jeong, Hae Do
    • Journal of the Korean Society for Precision Engineering
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    • v.34 no.2
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    • pp.101-106
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    • 2017
  • The chemical mechanical planarization (CMP) process combines the chemical effect of slurry with the mechanical effect of abrasive (slurry)-wafer-pads The slurry delivery system has a notable effect on polishing results, because the slurry distribution is changed by the supply method. Thus, the investigation of slurry pumps and nozzles with regard to the slurry delivery system becomes important. This paper investigated the effect of a centrifugal slurry pump on a spray nozzle system in terms of uniform slurry supply under a rotating copper (Cu) wafer, based on experimental results and computational fluid dynamics (CFD). In conventional tools, the slurry is unevenly and discontinuously supplied to the pad, due to a pulsed flow caused by the peristaltic pump and distributed in a narrow area by the tube nozzle. Adopting the proposed slurry delivery system provides a higher uniformity and lowered shear stress than usual methods. Therefore, the newly developed slurry delivery system can improve the CMP performance.

Alternative Sample Preparation Method for Large-Area Cross-Section View Observation of Lithium Ion Battery

  • Kim, Ji-Young;Jeong, Young Woo;Cho, Hye Young;Chang, Hye Jung
    • Applied Microscopy
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    • v.47 no.2
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    • pp.77-83
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    • 2017
  • Drastic development of ubiquitous devices requires more advanced batteries with high specific capacitance and high rate capability. Large-area microstructure characterization across the stacks of cathode, electrolyte and anode might reveal the origin of the instability or degradation of batteries upon cycling charge. In this study, sample preparation methods to observe the cross-section view of the electrodes for battery in SEM and several imaging tips are reviewed. For an accurate evaluation of the microstructure, ion milling which flats the surface uniformly is recommended. Pros and cons of cross-section polishing (CP) with Ar ion and focused ion beam (FIB) with Ga ion were compared. Additionally, a modified but new cross-section milling technique utilizing precision ion polishing system (PIPS) which can be an alternative method of CP is developed. This simple approach will make the researchers have more chances to prepare decent large-area cross-section electrode for batteries.

Effects of Specimen Preparation Method and Contact Resistance on the Formation of Anodizing Films on Aluminum Alloys (시편의 준비 방법 및 접촉저항이 알루미늄 합금의 아노다이징 피막 형성에 미치는 영향)

  • Moon, Sungmo
    • Journal of the Korean institute of surface engineering
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    • v.53 no.1
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    • pp.29-35
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    • 2020
  • In this study, five different specimen preparation methods were introduced and their advantages and disadvantages were presented. One of them, an epoxy mounting method has advantages of constant exposure area, ease of surface preparation without touching the specimen surface during polishing or cleaning, use of small amount of material and ease of specimen reuse by polishing or etching. However, in order to eliminate unexpected errors resulting from preferable reaction at the specimen/epoxy interface and contact resistance between the specimen and copper conducting line for electrical connection, it is recommended to cover the wall side of the specimen with porous anodic oxide films and to remain the contact resistance lower than 1 ohm. The increased contact resistance between the specimen and Cu conducting line appeared to result in increases of anodizing voltage and solution temperature during anodizing by which thickness and hardness of anodizing film on Al2024 alloy were drastically decreased and color of the films became more brightened.

The Study of Metal CMP Using Abrasive Embedded Pad (고정입자 패드를 이용한 텅스텐 CMP에 관한 연구)

  • Park, Jae-Hong;Kim, Ho-Yun;Jeong, Hae-Do
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.12
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    • pp.192-199
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    • 2001
  • Chemical mechanical planarization (CMP) has emerged as the planarization technique of choice in both front-end and back-end integrated circuit manufacturing. Conventional CMP process utilize a polyurethane polishing pad and liquid chemical slurry containing abrasive particles. There hale been serious problems in CMP in terms of repeatability and deflects in patterned wafers. Especial1y, dishing and erosion defects increase the resistance because they decrease the interconnection section area, and ultimately reduce the lifetime of the semiconductor. Methods to reduce dishing & erosion have recently been interface hardness of the pad, optimization of the pattern structure as dummy patterns. Dishing & erosion are initially generated an uneven pressure distribution in the materials. These defects are accelerated by free abrasives and chemical etching. Therefore, it is known that dishing & erosion can be reduced by minimizing the abrasive concentration. Minimizing the abrasive concentration by using CeO$_2$is the best solution for reducing dishing & erosion and for removal rate. This paper introduce dishing & erosion generating mechanism and a method fur developing a semi-rigid abrasive pad to minimize dishing & erosion during CMP.

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Effects of various prophylactic procedures on titanium surfaces and biofilm formation

  • Di Salle, Anna;Spagnuolo, Gianrico;Conte, Raffaele;Procino, Alfredo;Peluso, Gianfranco;Rengo, Carlo
    • Journal of Periodontal and Implant Science
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    • v.48 no.6
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    • pp.373-382
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    • 2018
  • Purpose: The aim of this study was to evaluate the effects of various prophylactic treatments of titanium implants on bacterial biofilm formation, correlating surface modifications with the biofilms produced by Pseudomonas aeruginosa PAO1, Staphylococcus aureus, and bacteria isolated from saliva. Methods: Pure titanium disks were treated with various prophylactic procedures, and atomic force microscopy (AFM) was used to determine the degree to which surface roughness was modified. To evaluate antibiofilm activity, we used P. aeruginosa PAO1, S. aureus, and saliva-isolated Streptococcus spp., Bacteroides fragilis, and Staphylococcus epidermidis. Results: AFM showed that the surface roughness increased after using the air-polishing device and ultrasonic scaler, while a significant reduction was observed after using a curette or polishing with Detartrine ZTM (DZ) abrasive paste. In addition, we only observed a significant (P<0.01) reduction in biofilm formation on the DZ-treated implant surfaces. Conclusion: In this study, both AFM and antibiofilm analyses indicated that using DZ abrasive paste could be considered as the prophylactic procedure of choice for managing peri-implant lesions and for therapy-resistant cases of periodontitis.

The Relationship between Lens Properties and the Lens Wearer's Factors in RGP Lens Manufacturing (RGP렌즈 제조 시 렌즈 물성과 렌즈 착용자 요인과의 관계)

  • Park, Mijung;Park, Ha Young;Park, Jung Ju;Kong, Heejung;Cha, Young Hwa;Kim, So Ra
    • Journal of Korean Ophthalmic Optics Society
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    • v.18 no.1
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    • pp.27-35
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    • 2013
  • Purpose: The present study was conducted to investigate the changes in the physical properties of RGP lenses induced by the polishing during the process of RGP lens manufacturing, and further evaluate the differences in the actual wearer's comfort and the tear film break-up time caused by these changes. Methods: RGP lenses (fluorosilicone acrylate material) were divided into 4 groups by the different lens-polishing time like 0, 25, 50 and 100 seconds and the thickness, the surface roughness and the wetting angle of those lenses were compared. Furthermore, the comfortability of the lens wear was surveyed after applying these lenses on the subject's eyes with normal tear volume and the non-invasive tear break-up time of the wearers was measured. Results: The central thickness of 4 RGP lenses made of different lens-polishing time was not significantly different however, the lens surface was changed smoother after polishing to be confirmed by scanning electron microscopy. The wetting angle of the RGP lens significantly decreased in accordance with the increase of polishing time. Thus, the difference of approximately $16^{\circ}$ between 0 second and 100 seconds-polishing was statistically significant. The actual wearing feeling of RGP lens was tended to improve in accordance with the increase of the lens wettability however, it was not proportional improvement. The non-invasive tear break-up time of the lens wearers showed different aspect compared with the changes in lens wettability and the actual feeling of RGP lens wear. Conclusions: In this study, better lens wettability, thinner lens thickness, and/or improved lens surface induced by physical stimuli in the process of RGP lens manufacturing was not well-correlated with the increase of actual subjective/objective satisfaction in RGP lens wear. Thus, the consideration of physical properties of the lens as well as the lens wearers' physiological factors in the process of RGP lens manufacturing may be suggested.

Changes in Subjective Symptom, Tear Film Stabilization and Blinking Rates when Wearing RGP Lenses with Different Polishing Conditions for Certain Period of Time (연마상태가 다른 RGP렌즈의 일정기간 착용 시 렌즈착용자의 자각적 증상, 눈물막 안정 및 순목횟수 변화)

  • Park, Mijung;Kim, Hyo Gyum;Bae, Jun Seob;Park, Jung Ju;Kim, So Ra
    • Journal of Korean Ophthalmic Optics Society
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    • v.19 no.1
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    • pp.31-42
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    • 2014
  • Purpose: The present study was conducted to investigate the effect of the physical properties of RGP lens induced by lens polishing on the actual wearer's subjective comfort, the tear film break-up time and the blinking rate as a follow-up study that revealed the relationship between the lens physical properties during lens manufacturing and lens wearer's factors. Methods: RGP lenses made from the three different polishing conditions (25, 50 and 100 seconds) were applied on 28 eyes of 17 subjects, aged 20 to 29 years, without any known disease and surgical history in the eyes. While the subjects were asked to wear the RGP lenses longer than a week, the questionnaire for the comfortability was administered everyday. Subjective and objective tear break-up time and blinking rate of the wearers were further measured. Results: The wearer's subjective comfortability showed some difference in the type of discomfort and satisfaction score according to the polishing status when wearing RGP lenses made from different polishing conditions longer than a week, and a bigger difference in satisfaction score induced by polishing condition was especially shown in experienced RGP lens wearer rather than un-experienced wearer. In the case of RGP lens wearer compared with the ones without the wearing experience, as the wearing time increased subjective and objective tear break-up time were increased and the blinking rate was decreased. However, subjective and objective tear break-up time were tended to decrease with even longer wearing time when wearing the RGP lens made from the polishment for 100 seconds. Conclusions: These results confirmed that the optimization of physical properties of the lens may not give the same effect on the wearer's subjective and objective symptoms and other factors when actual wearing. From the results, it can suggest that the success rate of RGP lens wear may be changed by physiological factors such as the stabilization of wearer's tear film, comfortability and lens wearing experience when wearing RGP lens based on 'The manufacturing standard for soft contact lens/hard contact lens' provided by Korea Food and Drug Administration.