• Title/Summary/Keyword: PECVD (Plasma Enhanced Vapor Deposition)

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Laser-induced crystallization of amorphous and microcrystalline silicon during measurements of Raman spectroscopy

  • Park, Seong-Gyu;Gwon, Jeong-Dae;Lee, Yeong-Ju;Kim, Dong-Ho;Jeong, Yong-Su
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2012.05a
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    • pp.151-152
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    • 2012
  • 라만(Raman) 분광법은 실리콘의 결정화도를 분석하는데 가장 유용하게 쓰이는 기법이다. 본 논문에서는 상압 플라즈마 화학기상증착법 (atmospheric pressure plasma-enhanced chemical vapor deposition, AP-PECVD)에 의해 형성된 실리콘 박막의 결정화도를 라만 분광법에 의해 분석하였다. 라만 분석 시, 조사하는 레이져의 파장에 따라서 실리콘 박막 내로의 침투깊이가 결정된다. 또한 레이져의 파워가 임계점을 넘게 되면, 레이져에 의한 실리콘의 결정화가 진행되는 것을 확인하였다.

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Corrosion Protection of Plasma-Polymerized Cyclohexane Films Deposited on Copper

  • Park, Z.T.;Lee, J.H.;Choi, Y.S.;Ahn, S.H.;Kim, J.G.;Cho, S.H.;Boo, J.H.
    • Journal of the Korean institute of surface engineering
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    • v.36 no.1
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    • pp.74-78
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    • 2003
  • The corrosion failure of electronic devices has been a major reliability concern lately. This failure is an ongoing concern because of miniaturization of integrated circuits (IC) and the increased use of polymers in electronic packaging. Recently, plasma-polymerized cyclohexane films were considered as a possible candidate for a interlayer dielectric for multilever metallization of ultra large scale integrated (ULSI) semiconductor devices. In this paper the protective ability of above films as a function of deposition temperature and RF power in an 3.5 wt.% NaCl solution were examined by polarization measurement. The film was characterized by FTIR spectroscopy and contact angle measurement. The protective efficiency of the film increased with increasing deposition temperature and RF power, which induced the higher degree of cross-linking and hydrophobicity of the films.

Bottom Gate Microcrystalline Silicon TFT Fabricated on Plasma Treated Silicon Nitride

  • Huang, Jung-Jie;Chen, Yung-Pei;Lin, Hung-Chien;Yao, Hsiao-Chiang;Lee, Cheng-Chung
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.218-221
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    • 2008
  • Bottom-gate microcrystalline silicon thin film transistors (${\mu}c$-Si:H TFTs) were fabricated on glass and transparent polyimide substrates by conventional 13.56 MHz RF plasma enhanced chemical vapor deposition at $200^{\circ}C$. The deposition rate of the ${\mu}c$-Si:H film is 24 nm/min and the amorphous incubation layer near the ${\mu}c$-Si:H/silicon nitride interface is unobvious. The threshold voltage of ${\mu}c$-Si:H TFTs can be improved by $H_2$ or $NH_3$ plasma pretreatment silicon nitride film.

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External rf plasma treatment effect on multi-wall carbon nanotubes grown inside anodic alumina nanoholes at low deposition temperatures

  • Ahn, Kyoung-Soo;Kim, Jun-Sik;Kim, Eun-Kyu;Kim, Chae-Ok;Hong, Jin-Pyo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.692-693
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    • 2002
  • Well-aligned multi-wall carbon nanotubes (MWNTs) were fabricated by utilizing a radio frequency plasma-enhanced chemical vapor deposition (rf-PECVD) system from Ni particles at the bottom of anodic alumina nanoholes (AAN). To remove the amorphous graphite layers on the AAN surface and to eliminate the protrusion of MWNT tips, the AAN surface with MWNTs were treated by external rf plasma source. As a result, the AAN surface almost became flat without having any protrusion of MWNT tips. The diameter, length of MWNTs and AAN were investigated by using a scanning electron microscopy (SEM). Raman spectroscopy was also used to characterize wall structure of the carbon nanotube. And the emission properties of the MWNTs were measured for the application of field emission display (FED) in near future.

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Evaluation of Photocatalysis-Fixed Using Titanium for Advanced Wastewater Treatment (고도처리를 위한 금속티타늄 고정화광촉매기술평가)

  • Jang, Jun-Won;Min, Jee-Eun;Park, Jae-Woo
    • 한국방재학회:학술대회논문집
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    • 2008.02a
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    • pp.815-818
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    • 2008
  • Titanium was oxidized with oxygen plasma and calcinated with rapid thermal annealing for degradation of humic acid dissolved in water. Titania photocatalytic plate was produced by titanium surface oxidized with oxygen plasma by Plasma Enhanced Chemical Vapor Deposition(PECVD). RF-power and deposition condition is controlled under 100 W, 150 W, 300 W and 500 W. Treatment time was controlled by 5 min and 10 min. The film properties were evaluated by the X-ray Photoelectron Spectroscopy (XPS) and X-Ray Diffraction (XRD). From the experimental results, we found the optimal condition of titania film which exhibited good performance. Moreover photocatalytic capacity was about twice better than thermal spray titania film, and also as good as titania powder.

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Study of nanocrystalline silicon deposition using internal Multiple U-type antenna (내장형 Multiple U-type 안테나를 이용한 나노 다결정 실리콘의 증착에 대한 연구)

  • Kim, Hong-Beom;Lee, Hyeong-Cheol;Yeom, Geun-Yeong
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2007.04a
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    • pp.87-88
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    • 2007
  • 나노 다결정 실리콘 박막 증착을 하기 위해서 현재 정전결합플라즈마(CCP, Capacitively Coupled Plasma)를 이용한 PECVD(Plasma Enhanced Chemical Vapor Deposition) 공정에 관한 여구가 활발히 이루어지고 있다. 유도결합플라즈마는(ICP, Inductively Coupled Plasma) 정전결합플라즈마보다 플라즈마 밀도가 높고 파워전달 효율이 좋은 것으로 알려져 있으나 대면적가 어려워 기판이 큰 TFT-LCD로는 많이 연구되고 있지 않다. 본 연구는 유도결합플라즈마를 위해 내장형 multiple U-type 선형 안테나를 이용하여 나노 다결정 실리콘 박막을 증착하여 그 특성을 분석하였다.

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Micromorph Schottky Silicon Solar Cells

  • Kim, Joon-Dong;Han, Chang-Soo;Yun, Ju-Hyung;Yi, Jun-Sin;Park, Yun-Chang
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.130-130
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    • 2010
  • Thin Si films were grown by a plasma-enhanced chemical vapor deposition (PECVD, SNTEK, Korea) system. Two different deposition condition were applied and formed a fully amorphous Si (a-Si) film and a micromorph mixing of microcrystalline Si (mc-Si) and a-Si film. Under one sun illumination, the micromorph device provided the enhanced open circuit voltage and fill factor values. It presents the fabrication of the micromorph Si film and the a-Si film by modulating a deposition condition. The performances of the Si thin film Schottky solar cells are discussed.

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The Study of Silicon Nitride Passivation Layer on OLED ($Si_3N_4$ 페시베이션 박막이 유기발광다이오드 소자에 주는 영향 연구)

  • Park, Il-Houng;Kim, Kwan-Do;Shin, Hoon-Kyu;Yoon, Jae-Kyoung;Yun, Won-Min;Kwon, Oh-Kwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.332-333
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    • 2009
  • In this paper, we have deposited silicon nitride films by plasma-enhanced chemical vapor deposition (PECVD). For films deposited under optimized conditions, the mechanism of plasma-enhanced vapor deposition of silicon nitride is studied by varying process parameters such as rf power, gas ratio, and chamber pressure. It was demonstrated that organic light-emitting diode(OLEDs) were fabricated with the inorganic passivation layer processing. We have been studied the inorganic film encapsulation effect for organic light-emitting diodes (OLED). To evaluate the passivation layer, we have carried out the fabrication of OLEDs and investigate with luminescence and MOCON.

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Growth Properties of Carbon Nanowall According to the Substrate Angle (기판 각도에 따른 탄소나노월의 성장 특성)

  • Kim, Sung Yun;Joung, Yeun-Ho;Han, Jae Chan;Choi, Won Seok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.9
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    • pp.686-689
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    • 2013
  • The carbon nanowall (CNW) is a carbon-based nanomaterials and it was constructed with vertical structure graphenes and it has the highest surface density among carbon-based nanostructures. In this study, we have checked the growth properties of CNW according to the substrate angle. Microwave plasma enhanced chemical vapor deposition (PECVD) system was used to grow CNW on Si substrate with methane ($CH_4$) and hydrogen ($H_2$) gases. And, we have changed the substrate angle from $0^{\circ}$ to $90^{\circ}$ in steps of $30^{\circ}$. The planar and vertical conditions of the grown CNWs according to the substrate angle were characterized by a field emission scanning electron microscopy (FE-SEM) and energy dispersive spectroscopy (EDS). In case of the growth angle increases, our experimental results showed that the length of the CNW was shortened and the content of carbon component was decreased.

The Relation between Emission Properties and Growth of Carbon nanotubes with dc bias by RF Plasma Enhanced Chemical Vapor Deposition

  • Choi, Sun-Hong;Han, Jae-Hee;Lee, Tae-Young;Yoo, Ji-Beom;Park, Chong-Yun;Yi, Whi-Kun;Yu, Se-Gi;Jung, Tae-Won;Lee, Jung-Hee;Kim, Jong-Min
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.662-665
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    • 2002
  • The growth of carbon nanotubes (CNTs) was carried out using ratio frequency plasma enhanced chemical vapor deposition (rf PECVD) system equipped with dc bias for the directional growth. Acetylene and ammonia gas were used as the carbon source and a catalyst. The relation between gas flow rate and dc bias on the growth of CNTs was investigated. We studied the relation between emission properties and the directionality of CNTs grown under different dc bias voltage.

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