• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.5
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• pp.94-101
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• 2013

The market for NAND flash-based storage devices has grown significantly as they rapidly replace traditional disk-based storage devices. Heterogeneous NAND flash-based storage devices using both multi-level cell (MLC) and single-level cell (SLC) NAND flash memories are also actively researched since both types of memories complement each other. Heterogeneous NAND flash-based storage devices suffer from the overheads incurred by migration from SLC to MLC and garbage collection of SLC. This paper proposes a new flash translation layer (FTL) for heterogeneous NAND flash-based storage devices to reduce the overheads by utilizing SLC efficiently. The proposed FTL analyzes the access patterns of logical blocks and selects and stores only logical blocks expected to bring performance improvement in SLC. The experimental results show that the total execution time of heterogeneous NAND flash-based storage devices with our proposed FTL scheme is 35% shorter than that with the previously proposed best FTL scheme.

• IEMEK Journal of Embedded Systems and Applications
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• v.12 no.6
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• pp.413-424
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• 2017

In this paper, we show shortcomings of separate chaining scheme by way of experiments with NAND flash memory and improve the performance with merge chaining scheme which is proposed in this paper. We explain this merge chaining scheme and explain how to improve the performance of search operation. Merge chaining scheme shows better performance at insert and search operation compare to separate chaining scheme.

• Proceedings of the Korean Information Science Society Conference
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• 2011.06b
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• pp.321-322
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• 2011

차세대 저장매체로 각광받고 있는 BPRAM을 이용해, NAND Flash memory의 결점을 보완하고자 하는 많은 연구들이 진행되고 있다. 본 논문에서는 BPRAM과 NAND Flash를 이용하여, 계층적 스토리지에 사용하는 하이브리드 파일 시스템인 Compressing Metadata File System(CMFS)을 개발하였다. CMFS는 Mount time에 필요한 메타데이터를 BPRAM에 저장하여 마운트 시간을 줄이고, 메타데이터를 Update하기 위한 Overhead를 줄이기 위해 부분 갱신 기법을 개발하였다. 또한 메타데이터의 저장을 위해 필요한 BPRAM의 용량를 줄이기 위해 메타데이터를 경량화 및 압축하고, 압축률을 높이기 위해 Hybrid Coding 압축기법을 개발하여 적용한다. Marvel PXA320(806MHz) 보드를 이용하여 CMFS의 성능을 측정하였으며, 타 압축 기법보다 높은 메타데이터의 압축률을 보였다.

• ETRI Journal
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• v.34 no.5
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• pp.787-790
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• 2012

The objective of this research is to design a high-performance NAND flash memory system containing a buffer system. The proposed instruction buffer in the NAND flash memory consists of two parts, that is, a fully associative temporal buffer for temporal locality and a fully associative spatial buffer for spatial locality. A spatial buffer with a large fetching size turns out to be effective for serial instructions, and a temporal buffer with a small fetching size is devised for branch instructions. Simulation shows that the average memory access time of the proposed system is better than that of other buffer systems with four times more space. The average miss ratio is improved by about 70% compared with that of other buffer systems.

• Journal of the Semiconductor & Display Technology
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• v.19 no.3
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• pp.112-117
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• 2020

NAND flash memory is a non-volatile memory that retains stored data even without power supply. Internal memory used as a data storage device and solid-state drive (SSD) is used in portable devices such as smartphones and digital cameras. However, NAND flash memory carries the risk of electric shock, which can cause errors during read/write operations, so use error correction codes to ensure reliability. It efficiently recovers bad block information, which is a defect in NAND flash memory. BBT (Bad Block Table) is configured to manage data to increase stability, and as a result of experimenting with the error correction code algorithm, the bit error rate per page unit of 4Mbytes memory was on average 0ppm, and 100ppm without error correction code. Through the error correction code algorithm, data stability and reliability can be improved.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.22 no.1
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• pp.7-11
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• 2009

In this study, p-channel silicon-oxide-nitride-oxide-silicon(SONOS) transistors are fabricated and characterized as an unit cell for NAND flash memory. The SONOS transistors are fabricated by $0.13{\mu}m$ low power standard logic process technology. The thicknesses of gate insulators are 2.0 nm for the tunnel oxide, 1.4 nm for the nitride layer, and 4.9 nm for the blocking oxide. The fabricated SONOS transistors show low programming voltage and fast erase speed. However, the retention and endurance of the devices show poor characteristics.

• Journal of KIISE:Computer Systems and Theory
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• v.36 no.5
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• pp.412-421
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• 2009

Due to the physical characteristics of NAND flash memory, overwrite operations are not permitted at the same location, and therefore erase operations are required prior to rewriting. These extra operations cause performance degradation of NAND flash memory file system. Since it also has an upper limit to the number of erase operations for a specific location, frequent erases should reduce the lifetime of NAND flash memory. These problems can be resolved by delaying write operations in order to improve I/O performance: however, it will lower the cache hit ratio. This paper proposes a policy of page management using double cache for NAND flash memory file system. Double cache consists of Real cache and Ghost cache to analyze page reference patterns. This policy attempts to delay write operations in Ghost cache to maintain the hit ratio in Real cache. It can also improve write performance by reducing the search time for dirty pages, since Ghost cache consists of Dirty and Clean list. We find that the hit ratio and I/O performance of our policy are improved by 20.57% and 20.59% in average, respectively, when comparing them with the existing policies. The number of write operations is also reduced by 30.75% in average, compared with of the existing policies.

• IEMEK Journal of Embedded Systems and Applications
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• v.10 no.3
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• pp.151-156
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• 2015

Recently, an embedded flash memory has been widely used for the Internet of Things(IoT). Due to its nonvolatility, economical feasibility, stability, low power usage, and fast speed. With respect to power consumption, the embedded memory system must consider the most significant design factor. The objective of this research is to design high performance and low power NAND flash memory architecture including a dual buffer as a replacement for NOR flash. Simulation shows that the proposed NAND flash system can achieve better performance than a conventional NOR flash memory. Furthermore, the average memory access time of the proposed system is better that of other buffer systems with three times more space. The use of a small buffer results in a significant reduction in power consumption.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1998.11a
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• pp.145-150
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• 1998

8$\times$8 bit scaled SONOSFET NAND type flash EEPROM that shows better characteristics on cell density and endurance than NOR type have been designed and its electrical characteristics are verified with computer aided simulation. For the simulation, the spice model parameter was extracted from the sealed down SONOSFET that was fabricated by $1.5mutextrm{m}$ topological design rule. To improve the endurance of the device, the EEPROM design to have modified Fowler-Nordheim tunneling through the whole channel area in Write/Erase operation. As a result, it operates Write/Erase operation at low current, and has been proven Its good endurance. The NAND type flash EEPROM, which has upper limit of V$_{th}$, has the upper limit of V$_{th}$ as 4.5V. It is better than that of floating gate as 4V. And a EEPROM using the SONOSFET without scaling (65$\AA$-l65$\AA$-35$\AA$), was also designed and its characteristics have been compared. It has more possibliity of error from the V$_{th}$ upper limit as 4V, and takes more time for Read operation due to low current. As a consequence, it is proven that scaled down SONOSFET is more pertinent than existing floating gate or SONOSFET without scaling for the NAND type flash EEPROM.EPROM.

• KIPS Transactions on Computer and Communication Systems
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• v.5 no.1
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• pp.1-6
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• 2016

This paper focuses on algorithm innovation of NAND Flash Memory for enhancing cell lifetime. During flash memory read/write/erase, the voltage of a specific cell should be a valid voltage level. If not, we cannot read the data correctly. This type of interference/disturbance tends to be serious when program and erase operation will go on. This is because FN tunneling results in tunnel oxide damage due to increased trap site on repetitive high biased state. In order to resolve this problem, we make the cell degradation by reducing the amount of stress in terms of erase cell, resulting in minimizing the cell disturbance on erase verify.