• JSTS:Journal of Semiconductor Technology and Science
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• 제13권1호
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• pp.71-78
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• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• 제어로봇시스템학회논문지
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• 제14권7호
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• pp.624-628
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• 2008

This paper is concerned with multiple motor control using a distributed network control method. Speed and position of multiple motors are synchronized using clock synchronized distributed controllers. CAN (controller area network) is used and a new clock synchronization algorithm is proposed and implemented. To verify the proposed control algorithm, two disks which are attached on two motor shafts are controlled to rotate at the same speed and phase angle with the same time base using network clocks.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2004년도 학술대회 논문집 정보 및 제어부문
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• pp.391-393
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• 2004

For performance and stability of a synchronized system, we need an efficient Clock Tree Synthesis(CTS) methodology to design clock distribution networks. In a system-on-a-chip(SOC) design environment, CTS effectively distributes clock signals from clock sources to synchronized points on layout design. In this paper, we suggest the pre-layout analysis of the clock network including gated clock, multiple clock, and test mode CTS optimization. This analysis can help to avoid design failure with potential CTS problems from logic designers and supply layout constraints so as to get an optimal clock distribution network. Our new design flow including pre-layout CTS analysis and structural violation checking also contributes to reduce design time significantly.

• Journal of Computing Science and Engineering
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• 제6권4호
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• pp.257-266
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• 2012

This paper overviews clock design problems related to the circuit reliability in deep submicron design technology. The topics include the clock polarity assignment problem for reducing peak power/ground noise, clock mesh network design problem for tolerating clock delay variation, electromagnetic interference aware clock optimization problem, adjustable delay buffer allocation and assignment problem to support multiple voltage mode designs, and the state encoding problem for reducing peak current in sequential elements. The last topic belongs to finite state machine (FSM) design and is not directly related to the clock design, but it can be viewed that reducing noise at the sequential elements driven by clock signal is contained in the spectrum of reliable circuit design from the clock source down to sequential elements.

• 제어로봇시스템학회논문지
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• 제19권2호
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• pp.125-130
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• 2013

Compared to OWR (One-Way Ranging) method that requires precise network time synchronization, TWR (Two-Way Ranging) method has advantages in building an indoor WPAN (Wireless Personal Area Network) location system with lower cost. However, clock offsets of nodes in WPAN system should be eliminated or compensated to improve location accuracy of the TWR method. Because conventional clock offset elimination methods requires multiple TWR transactions to reduce clock offset, they produce network traffic burden instead. This paper presents a clock offset estimation method that can reduce clock offset error with a single TWR transaction. After relative clock offsets of sensor nodes are estimated, clock offsets of mobile tags are estimated using a single TWR communication. Simulation results show that location accuracy of the proposed method is almost similar to the conventional clock offset elimination method, while its network traffic is about a half of the conventional method.

• ETRI Journal
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• 제30권3호
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• pp.403-411
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• 2008

This paper introduces an interconnect delay fault test (IDFT) controller on boards and system-on-chips (SoCs) with IEEE 1149.1 and IEEE 1500 wrappers. By capturing the transition signals launched during one system clock, interconnect delay faults operated by different system clocks can be simultaneously tested with our technique. The proposed IDFT technique does not require any modification on boundary scan cells. Instead, a small number of logic gates needs to be plugged around the test access port controller. The IDFT controller is compatible with the IEEE 1149.1 and IEEE 1500 standards. The superiority of our approach is verified by implementation of the controller with benchmark SoCs with IEEE 1500 wrapped cores.

• 전기학회논문지
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• 제56권5호
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• pp.980-986
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• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• 대한전자공학회논문지SD
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• 제43권1호
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• pp.37-44
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• 2006

본 논문은, IEEE 1149.1 및 IEEE P1500 기반의 보드 및 SoC의 연결선 지연 고장 테스트를 위한 회로 및 테스트 방법을 제안한다. IDFT 모드 시, 출력 셀의 Update와 입력 셀의 Capture가 한 시스템 클럭 간격 내에 이루어지도록 하는 시스템 클럭 상승 모서리 발생기를 구현한다. 이 회로를 이용함으로써, 단일 시스템 클럭 뿐만 아니라 다중 시스템 클럭을 사용하는 보드 및 SoC의 여러 연결선의 지연 고장 테스트를 쉽게 할 수 있다. 기존의 방식에 비해 면적 오버헤드가 적고 경계 셀 및 TAP의 수정이 필요 없으며, 테스트 절차도 간단하다는 장점을 가진다.

• 한국정보과학회논문지:시스템및이론
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• 제34권2호
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• pp.84-92
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• 2007

본 논문은, IEEE 1149.1 및 IEEE P1500 기반의 보드 및 SoC의 연결선 지연 고장 테스트를 위한 회로 및 테스트 방법을 제안한다. IDFT 모드 시, 출력 셀의 Update와 입력 셀의 Capture가 한 시스템 클럭 간격 내에 이루어지도록 하는 시스템 클럭 상승 모서리 발생기를 구현한다. 이 회로를 이용함으로써, 단일 시스템 클럭 뿐만 아니라 다중 시스템 클럭을 사용하는 보드 및 SoC의 여러 연결선의 지연고장 테스트를 쉽게 할 수 있다. 기존의 방식에 비해 면적 오버헤드가 적고 경계 셀 및 TAP의 수정이 필요 없으며, 테스트 절차도 간단하다는 장점을 가진다.

• 대한전자공학회논문지SD
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• 제42권2호
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• pp.23-30
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• 2005

이 논문에서는 낮은 stand-by power 및 DLL의 재동작 후 fast relocking 구조를 가지는 저전력, 고속 VISI 칩용 DLL(지연 고정 루프) 기반의 다중 클락 발생기를 제안하였다. 제안된 구조는 주파수 곱셈기를 이용하여 주파수 체배가 가능하며 시스템 클락의 듀티비에 상관없이 항상 50:50 듀티비를 위한 Duty-Cycle Correction 구조를 가지고 있다. 또한 DAC를 이용한 디지털 컨트롤 구조를 클락 시스템이 standby-mode에서 operation-mode 전환 후 빠른 relocking 동작을 보장하고 아날로그 locking 정보를 레지스터에 디지털 코드로 저장하기 위해 사용하였다. 클락 multiplication을 위한 주파수 곱셈기 구조로는 multiphase를 이용한 feed-forward duty correction 구조를 이용하여 지연 시간 없이 phase mixing으로 출력 클락의 duty error를 보정하도록 설계하였다. 본 논문에서 제안된 DLL 기반 다중 클락 발생기는 I/O 데이터 통신을 위한 외부 클락의 동기 클락과 여러 IP들을 위한 고속 및 저속 동작의 다중 클락을 제공한다. 제안된 DLL기반의 다중 클락 발생기는 $0.35-{\mu}m$ CMOS 공정으로 $1796{\mu}m\times654{\mu}m$ 면적을 가지며 동작 전압 2.3v에서 $75MHz\~550MHz$ lock 범위와 800 MHz의 최대 multiplication 주파수를 가지고 20psec 이하의 static skew를 가지도록 설계되었다.