• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.1
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• pp.71-78
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• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.7
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• pp.624-628
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• 2008

This paper is concerned with multiple motor control using a distributed network control method. Speed and position of multiple motors are synchronized using clock synchronized distributed controllers. CAN (controller area network) is used and a new clock synchronization algorithm is proposed and implemented. To verify the proposed control algorithm, two disks which are attached on two motor shafts are controlled to rotate at the same speed and phase angle with the same time base using network clocks.

• Proceedings of the KIEE Conference
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• 2004.11c
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• pp.391-393
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• 2004

For performance and stability of a synchronized system, we need an efficient Clock Tree Synthesis(CTS) methodology to design clock distribution networks. In a system-on-a-chip(SOC) design environment, CTS effectively distributes clock signals from clock sources to synchronized points on layout design. In this paper, we suggest the pre-layout analysis of the clock network including gated clock, multiple clock, and test mode CTS optimization. This analysis can help to avoid design failure with potential CTS problems from logic designers and supply layout constraints so as to get an optimal clock distribution network. Our new design flow including pre-layout CTS analysis and structural violation checking also contributes to reduce design time significantly.

• Journal of Computing Science and Engineering
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• v.6 no.4
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• pp.257-266
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• 2012

This paper overviews clock design problems related to the circuit reliability in deep submicron design technology. The topics include the clock polarity assignment problem for reducing peak power/ground noise, clock mesh network design problem for tolerating clock delay variation, electromagnetic interference aware clock optimization problem, adjustable delay buffer allocation and assignment problem to support multiple voltage mode designs, and the state encoding problem for reducing peak current in sequential elements. The last topic belongs to finite state machine (FSM) design and is not directly related to the clock design, but it can be viewed that reducing noise at the sequential elements driven by clock signal is contained in the spectrum of reliable circuit design from the clock source down to sequential elements.

• Journal of Institute of Control, Robotics and Systems
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• v.19 no.2
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• pp.125-130
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• 2013

Compared to OWR (One-Way Ranging) method that requires precise network time synchronization, TWR (Two-Way Ranging) method has advantages in building an indoor WPAN (Wireless Personal Area Network) location system with lower cost. However, clock offsets of nodes in WPAN system should be eliminated or compensated to improve location accuracy of the TWR method. Because conventional clock offset elimination methods requires multiple TWR transactions to reduce clock offset, they produce network traffic burden instead. This paper presents a clock offset estimation method that can reduce clock offset error with a single TWR transaction. After relative clock offsets of sensor nodes are estimated, clock offsets of mobile tags are estimated using a single TWR communication. Simulation results show that location accuracy of the proposed method is almost similar to the conventional clock offset elimination method, while its network traffic is about a half of the conventional method.

• ETRI Journal
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• v.30 no.3
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• pp.403-411
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• 2008

This paper introduces an interconnect delay fault test (IDFT) controller on boards and system-on-chips (SoCs) with IEEE 1149.1 and IEEE 1500 wrappers. By capturing the transition signals launched during one system clock, interconnect delay faults operated by different system clocks can be simultaneously tested with our technique. The proposed IDFT technique does not require any modification on boundary scan cells. Instead, a small number of logic gates needs to be plugged around the test access port controller. The IDFT controller is compatible with the IEEE 1149.1 and IEEE 1500 standards. The superiority of our approach is verified by implementation of the controller with benchmark SoCs with IEEE 1500 wrapped cores.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.5
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• pp.980-986
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• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.1 s.343
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• pp.37-44
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• 2006

This paper proposes an interconnect delay fault test (IDFT) solution on boards and SoCs based on IEEE 1149.1 and IEEE P1500. A new IDFT system clock rising edge generator which forces output boundary scan cells to update test data at the rising edge of system clock and input boundary scan cells to capture the test data at the next rising edge of the system clock is introduced. Using this proposed circuit, IDFT for interconnects synchronized to different system clocks in frequency can be achieved efficiently. Moreover, the proposed IDFT technique does not require any modification of the boundary scan cells or the standard TAP controller is simple in terms of test procedure and is small in terms of area overhead.

• Journal of KIISE:Computer Systems and Theory
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• v.34 no.2
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• pp.84-92
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• 2007

This paper proposes an interconnect delay fault test (IDFT) solution on boards and SoCs based on IEEE 1149.1 and IEEE P1500. A new IDFT system clock rising edge generator which forces output boundary scan cells to update test data at the rising edge of system clock and input boundary scan cells to capture the test data at the next rising edge of the system clock is introduced. Using this proposed circuit, IDFT for interconnects synchronized to different system clocks in frequency can be achieved efficiently. Moreover, the proposed IDFT technique does not require any modification of the boundary scan cells or the standard TAP controller and simplifies the test procedure and reduces the area overhead.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.2 s.332
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• pp.23-30
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• 2005

This paper describes a DLL(delay locked loop)-based multi-clock generator having the lower active stand-by power as well as a fast relocking after re-activating the DLL. for low power and high speed VLSI chip. It enables a frequency multiplication using frequency multiplier scheme and produces output clocks with 50:50 duty-ratio regardless of the duty-ratio of system clock. Also, digital control scheme using DAC enables a fast relocking operation after exiting a standby-mode of the clock system which was obtained by storing analog locking information as digital codes in a register block. Also, for a clock multiplication, it has a feed-forward duty correction scheme using multiphase and phase mixing corrects a duty-error of system clock without requiring additional time. In this paper, the proposed DLL-based multi-clock generator can provides a synchronous clock to an external clock for I/O data communications and multiple clocks of slow and high speed operations for various IPs. The proposed DLL-based multi-clock generator was designed by the area of $1796{\mu}m\times654{\mu}m$ using $0.35-{\mu}m$ CMOS process and has $75MHz\~550MHz$ lock-range and maximum multiplication frequency of 800 MHz below 20psec static skew at 2.3v supply voltage.