• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.2
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• pp.302-317
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• 2017

This paper proposes a new full adder design based on pass-transistor logic that offers ultra-low power dissipation and superior variability together with low transistor count. The pass-transistor logic allows device count reduction through direct logic realization, and thus leads to reduction in the node capacitances as well as short-circuit currents due to the absence of supply rails. Optimum transistor sizing alleviates the adverse effects of process variations on performance metrics. The design is subjected to a comparative analysis against existing designs based on Monte Carlo simulations in a SPICE environment, using the 22-nm CMOS Predictive Technology Model (PTM). The proposed ULP adder offers 38% improvement in power in comparison to the best performing conventional designs. The trade-off in delay to achieve this power saving is estimated through the power-delay product (PDP), which is found to be competitive to conventional values. It also offers upto 79% improvement in variability in comparison to conventional designs, and provides suitable scalability in supply voltage to meet future demands of energy-efficiency in portable applications.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.1
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• pp.65-78
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• 2017

Single Event Transient has a critical impact on highly integrated logic circuits which are currently common in various commercial and consumer electronic devices. Reliability against the soft and intermittent faults will become a key metric to evaluate such complex system on chip designs. Our previous work analyzing soft errors was focused on parallelizing and optimizing error propagation procedures for individual transient faults on logic and sequential cells. In this paper, we present a new propagation technique where a fault binary decision diagram (BDD) continues to merge every new fault generated from the subsequent logic gate traversal. BDD-based transient fault analysis has been known to provide the most accurate results that consider both electrical and logical properties for the given design. However, it suffers from a limitation in storing and handling BDDs that can be increased in size and operations by the exponential order. On the other hand, the proposed method requires only a visit to each logic gate traversal and unnecessary BDDs can be removed or reduced. This results in an approximately 20-200 fold speed increase while the existing parallelized procedure is only 3-4 times faster than the baseline algorithm.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.6
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• pp.781-792
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• 2016

This paper presents a new approach to enhance the data retention of logic-compatible embedded DRAMs. The memory bit-cell in this work consists of two logic transistors implemented in generic triple-well CMOS process. The key idea is to use the parasitic junction capacitance built between the common cell-body and the data storage node. For each write access, a voltage transition on the cell-body couples up the data storage levels. This technique enhances the data retention and the read performance without using additional cell devices. The technique also provides much strong immunity from the write disturbance in the nature. Measurement results from a 64-kbit eDRAM test chip implemented in a 130 nm logic CMOS technology demonstrate the effectiveness of the proposed circuit technique. The refresh period for 99.9% bit yield measures $600{\mu}s$ at 1.1 V and $85^{\circ}C$, enhancing by % over the conventional design approach.

• Korean Journal of Optics and Photonics
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• v.19 no.3
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• pp.237-241
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• 2008

An all-optical encryption system built on the basis of electrical logic circuit design principles is proposed, using semiconductor optical amplifier (SOA) exclusive or (XOR) logic gates. Numerical techniques (steady-state and dynamic) were employed in a sequential manner to optimize the system parameters, speeding up the overall design process. The results from both numerical and experimental testbeds show that the encoding/decoding of the optical signal can be achieved at a 10 Gbps data rate with a conventional SOA cascade without serious degradation in the data quality.

• Journal of Sensor Science and Technology
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• v.33 no.3
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• pp.152-157
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• 2024

In this study, we propose a novel 8T ternary SRAM that can process three logic values (0, 1, and 2) with only two additional transistors, compared with the conventional 6T binary SRAM. The circuit structure consists of positive and negative ternary inverters (PTI and NTI, respectively) with carbon-nanotube field-effect transistors, replacing conventional cross-coupled inverters. In logic '0' or '2,' the proposed SRAM cell operates the same way as conventional binary SRAM. For logic '1,' it works differently as storage nodes on each side retain voltages of V_DD/2 and V_DD, respectively, using the subthreshold current of two additional transistors. By applying the ternary system, the data capacity increases exponentially as the number of cells increases compared with the 6T binary SRAM, and the proposed design has an 18.87% data density improvement. In addition, the Synopsys HSPICE simulation validates the reduction in static power consumption by 71.4% in the array system. In addition, the static noise margins are above 222 mV, ensuring the stability of the cell operation when V_DD is set to 0.9 V.

• Proceedings of the Korean Institute of Intelligent Systems Conference
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• 2003.09a
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• pp.58-61
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• 2003

This paper proposes e-Learning environments far digital circuit experiment. The e-Learning environments are implemented as a WBT system that includes the circuits monitoring system and the students management system. In the WBT client-server system, the instructor represents the server and students represent clients. The client computers are equipped with a digital circuit training board and connected to the server on the World Wide Web. The training board consists of a Programmable Logic Device (PLD) and measuring instruments. The instructor can reconfigure the PLD with various circuit designs from the server so that students can investigate signals from the training board. The instructor can monitor the progress of the students using Joint Test Action Grouo(JTAG) technology. We implement the WBT system and a courseware fo digital circuits and evaluation the environments.

• Journal of the Korean Society for Aviation and Aeronautics
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• v.19 no.4
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• pp.18-23
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• 2011

Generally, the digital circuit card can be tested by automatic test equipment using LASAR(Logic Automated Stimulus and Response). This paper proposes the ROM data extracting algorithm which can test the digital circuit card that consists usually ROMs. We are implemented of the proposed fault detecting program by LabWindow/CVI 8.5 and the digital automatic test instrument with NI-VXI(National Instrument - Versa Bus Modular Europe eXtentions for Instrumentation) card. We also make an interface circuit board connecting the digital test instrument and the digital circuit card. It shows the good performance of getting the data from ROMs.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.1
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• pp.93-102
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• 1994

This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

• 제어로봇시스템학회:학술대회논문집
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• 1995.10a
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• pp.146-149
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• 1995

A new method for grouping of relevant and equivalent inputs of a logical circuit was proposed by the authors by making use of pseudorandom M-sequence correlation. The authors show in this paper that it is possible to estimate the input grouping from a part of correlation functions when we admit small percentage of error, whereas it is impossible to reduce the data necessary to estimate the grouping by use of the truth table method. For example in case of 30-input logic circuit, the number of correlation functions necessary to calculate can be reducible from 1.07 * 10$^{9}$ to 465.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1992.04a
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• pp.354-358
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• 1992

This paper describes a development of high speed fuzzy inference circuit for the industrialprocesses. The hardware fuzzy inference circuit is developed utilizing a hardware fuzzy inference circuit is developed utilizing a DSP and a multiplier and accumulator chip. To enhance the inference speed, the pipeline disign is adopted at the bottleneck and the general Max-Min inference method is slightly modified as Max-max method. As a results, the inference speed is evaluated to be 100 KFLIPS. Owing to this high speed feature, satisfactory application can be attained for complex high speed motion control as well as the control of multi-input multi-output nonlinear system. As an application, the developed fuzzy inference circuit is embedded to a PLC (Porgrammable Logic Controller) for industrial process control. For the fuzzy PLC system, to fascilitate the design of the fuzzy control knowledge such as membership functions, rules, etc., a MS-Windows based GUI (Graphical User Interface) software is developed.