• Journal of the Korean Institute of Telematics and Electronics T
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• v.35T no.1
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• pp.7-13
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• 1998

The VLSI devices of submicron level trend to have a lowering of reliability because of hot carriers by two dimensional influences which are caused by short channel effects and which are not generated in a long channel devices. In order to minimize the two dimensional influences, much research has been made into various types of source/drain structures. MOS typed tunnel transistor with Schottky barrier junctions at source/drain, which has the advantages in fabrication process, downsizing and response speed, has been proposed. The experimental device was fabricated with p type silicon, and manifested the transistor action, showing the unsaturated output characteristics and the high transconductance comparing with that in field effect mode. The results of trial indicate for better performance as follows; high doped channel layer to lower the driving voltage, high resistivity substrate to reduce the leakage current from the substrate to drain.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.6
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• pp.117-127
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• 1994

In this paper, electrical and reliability properties of N$_2$O oxides, grown at the temperature of 95$0^{\circ}C$ and 100$0^{\circ}C$ to 74$\AA$, and 82$\AA$. respectively, using NS12TO gas in a conventional furnace, have been compared with those of pure oxide grown at the temperature of 850 to 84$\AA$ using O$_2$ gas. Initial IS1gT-VS1gT characteristics of N$_2$O oxides were similar to those of pure oxide, and reliability properties of N$_2$O oxides, such as charge trapping, interface state density and leakage current at low electric field under F-N stress, were improved much better than those of pure oxide. But, with increasing capacitor area. TDDB characteristics of N$_2$O oxides were more degraded than those of pure oxide and this degradation of TDDB characteristics was more severe in 100$0^{\circ}C$ N$_2$Ooxide than in 95$0^{\circ}C$ N$_2$O oxide. The improvement of reliability properties excluding TDDB in N$_2$Ooxides was attributed to the hardness of the interface improved by nitrogen pile-up at the interface of Si/SiO$_2$, but on the other hand, the degradation of TDDB characteristics in N$_2$O oxides was obsered due to the increase of local thinning spots caused by excessive nitrogen at interface during the growth of N$_2$O oxides.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.6
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• pp.802-809
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• 2014

This paper presents a dual-mode bias modulator (BM) for complementary metal oxide semiconductor (CMOS) power amplifiers (PAs). The BM includes a hybrid buck converter and a normal buck converter for an envelope tracking (ET) mode for high output power and for an average power tracking (APT) mode for low output power, respectively. The dual-mode BM and CMOS PA are designed using a $0.18-{\mu}m$ CMOS process for the 1.75 GHz band. For the 16-QAM LTE signal with a peak-to-average power ratio of 7.3 dB and a bandwidth of 5 MHz, the PA with the ET mode exhibited a poweradded efficiency (PAE) of 39.2%, an EVM of 4.8%, a gain of 19.0 dB, and an adjacent channel leakage power ratio of -30 dBc at an average output power of 22 dBm, while the stand-alone PA has a PAE of 8% lower at the same condition. The PA with APT mode has a PAE of 21.3%, which is an improvement of 13.4% from that of the stand-alone PA at an output power of 13 dBm.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.6-7
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• 2008

Current sensing in power semiconductors involves sensing of over-current in order to protect the device from harsh conditions. This technique is one of the most important functions in stabilizing power semiconductor device modules. The sense FET is very efficient method with low power consumption, fast sensing speed and accuracy. In this paper we have analyzed the characteristics of proposed sense FET and optimized its electrical characteristics to apply conventional 450V power MOSFET devices by numerical and simulation analysis. The proposed sense FET has the n-drift doping concentration $1.5\times10^{14}cm^{-3}$, size of $600{\mu}m^2$ with 4.5 $\Omega$, and off-state leakage current below 50 ${\mu}A$. We offer the layout of the proposed sense FET to process actually. The offerd design and optimization methods is meaningful, which the methods can be applied to the power devices having various breakdown voltages for protection.

• Membrane and Water Treatment
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• v.6 no.3
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• pp.225-235
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• 2015

During low-pressure membrane treatments of cyanobacterial cells, including microfiltration (MF) and ultrafiltration (UF), there have reportedly been releases of intracellular compounds including cyanotoxins and compounds with an earthy-musty odor into the water, probably owing to cyanobacterial cell breakage retained on the membrane. However, to our knowledge, no information was reported regarding the effect of growth phase of cyanobacterial cells on the release of the intracellular compounds. In the present study, we used a geosmin-producing cyanobacterium, Anabaena smithii, to investigate the effect of the growth phase of the cyanobacterium on the release of intracellular geosmin during laboratory-scale MF experiments with the cells in either the logarithmic growth or stationary phase. Separate detection of damaged and intact cells revealed that the extent of cell breakage on the MF membrane was almost the same for logarithmic growth and stationary phase cells. However, whereas the geosmin concentration in the MF permeate increased after 3 h of filtration with cells in the logarithmic growth phase, it did not increase during filtration with cells in the stationary phase: the trend in the geosmin concentration in the MF permeate with time was much different between the logarithmic growth and stationary phases. Adsorption of geosmin to algogenic organic matter (AOM) retained on the MF membrane and/or pore blocking with the AOM were greater when the cells were in the stationary phase versus the logarithmic growth phase, the result being a decrease in the apparent release of intracellular geosmin from the stationary phase cells. In actual drinking water treatment plants employing membrane processes, more attention should be paid to the cyanobacterial cells in logarithmic growth phase than in stationary phase from a viewpoint of preventing the leakage of intracellular earthy-musty odor compounds to finished water.

• Journal of Magnetics
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• v.15 no.4
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• pp.213-220
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• 2010

Since the hypothalamus immediately reacts to a nerve by processing all the information from the human body and the external stimulus being conducted, it performs a significant role in internal secretion; thus, a diverse and rapid stimulus pulse is required. By detecting Zero Detector accurately via the application of AVR on-Chip (ATMEL) using commercial electricity, chopping generates a stimulus pulse to the brain using an IGBT gate to designate a new magnetic stimulation following treatment and diagnosis. To simplify and generate a diverse range of stimuli for the brain, chopping can be used as a free magnetic stimulator. Then, commercial frequency (60Hz) is chopped precisely at the first level of the leakage transformer to deliver an appropriate stimulus pulse towards the hypothalamus when necessary. Discharge becomes stable, and the chopping frequency and duty-ratio provide variety after authorizing a high-pressure chopping voltage at the second level of the magnetic stimulator. These methods have several aims. The first is to apply a variable stimulus pulse via accurate switching frequency control by a voltaic pulse or a pulse repetition rate, according to the diagnostic purpose for a given hypothalamus. Consequently, the efficiency tends to increase. This experiment was conducted at a maximum of 210 W, a magnetic induced amplitude of 0.1~2.5 Tesla, a pulse duration of $200{\sim}350\;{\mu}s$, magnetic inducement of 5 Hz, stimulus frequency of 0.1~60 Hz, and a duration of stimulus train of 1~10 sec.

• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.4
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• pp.67-72
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• 1989

Room Temperature Plasma Nitridation of silicon was investigated as a new LOCOS (local oxidation of silicon) process in order to reduce the bird's beak length. In $N_2$ plasma formed by 100kHz, 400W AC power, a thin silicon nitride film (<100${\AA}$) was uniformly grown on a silicon substrate. SEM studies showed that the nitride layer formed by this method can effectively protect the silicon from oxidation and reduce the bird's beak length to $0.2{mu}m$ when 4000${\AA}$ field oxide is grown. This is a considerable improvement comparing with 0.7${mu}m,$ the bird's beak, for the conventional LOCOS process using a thick LPCVD nitride. No appreciable crystalline defect could be found around the bird's beak with SEM cross-section afrer Secco etch. Leakage current tests were carried out on the $N^+/P^-$ well and $P^+/N^-$ well diodes formed by this new LOCOS process. The electrical tests indicate that this new process has electrical properties similar or superior to those of the conventional LOCOS process.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.4
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• pp.251-265
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• 2001

As the device scaling proceeds, the operating voltage(VDD) of giga-bit DRAMs is expected to be reduced to 1.5V or down, fir improving the device reliability and reducing the power dissipation. Therefore the low-voltage circuit design techniques are required to implement giga-bit DRAMs. In this work, state-of-art low-voltage DRAM circuit techniques are reviewed, and four kinds of low-voltage circuit design techniques are newly proposed for giga-bit DRAMs. Measurement results of test chips and SPICE simulation results are presented for the newly proposed circuit design techniques, which include a hierarchical negative-voltage word-line driver with reduced subthreshold leakage current, a two-phase VBB(Back-Bias Voltage) generator, a two-phase VPP(Boosted Voltage) generator and a bandgap reference voltage generator.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.41 no.6
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• pp.17-25
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• 2004

In this paper, we propose a new small swing domino logic for low-power consumption. To reduce the power consumption, both the precharge node and the output node swing the range from 0 to $V_{REF}$- $V_{THN}$, where $V_{REF}$=VDD-n $V_{THN}$ (n=1, 2, and 3). This can be done by adding the inverter structure on domino logic that allows a full swing or a small swing on its input terminal without leakage current. Compared to previous works, the proposed structure can save the power consumption of more than 30% for n=0, 1, 2, and 3 in the equation of $V_{REF}$=VDD-n $V_{THN}$. A multiplier applying the proposed domino logic has been designed and fabricated using a 0.35-${\mu}{\textrm}{m}$ n-well CMOS process under 3.3-V supply voltage. Compared with other previous works, it shows a 30% power reduction and a better feature in power-delay product.lay product.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.1
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• pp.1-7
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• 2014

A bidirectional transient voltage suppression (TVS) diode consisting of specially designed $p^--n^{{+}+}-p^-$ multi-junctions was developed using low temperature (LT) epitaxy and fabrication processes. Its electrostatic discharge (ESD) performance was investigated using I-V, C-V, and various ESD tests including the human body model (HBM), machine model (MM) and IEC 61000-4-2 (IEC) analysis. The symmetrical structure with very sharp and uniform bidirectional multi-junctions yields good symmetrical I-V behavior over a wide range of operating temperature of 300 K-450 K and low capacitance as 6.9 pF at 1 MHz. In addition, a very thin and heavily doped $n^{{+}+}$ layer enabled I-V curves steep rise after breakdown without snapback phenomenon, then resulted in small dynamic resistance as $0.2{\Omega}$, and leakage current completely suppressed down to pA. Manufactured bidirectional TVS diodes were capable of withstanding ${\pm}4.0$ kV of MM and ${\pm}14$ kV of IEC, and exceeding ${\pm}8$ kV of HBM, while maintaining reliable I-V characteristics. Such an excellent ESD performance of low capacitance and dynamic resistance is attributed to the abruptness and very unique profiles designed very precisely in $p^--n^{{+}+}-p^-$ multi-junctions.