• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1999년도 하계종합학술대회 논문집
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• pp.349-352
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• 1999

In this paper, we present simplified fault set which is made by analyzing fault relation to design specification in CMOS operational amplifier. The hard fault is easily modeled because an effect of hard fault is out of all design specification. However, the soft fault is not easily modeled because an effect of soft fault on design specification is varied according to position and depth of fault. We simulated hard and soft fault by HSPICE, varying threshold voltage and W/L ratio from 90% increase to 90% decrease. The decrease of test time and the production of high reliability mixed-mode IC are possible by the proposed fault set.

• 대한전기학회논문지:시스템및제어부문D
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• 제53권6호
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• pp.457-464
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• 2004

Hard Disk Drive (HDD) test system is an equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD production line, KUMI, KOREA, and shows satisfactory results.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2005년도 ICCAS
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• pp.2418-2423
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• 2005

Hard Disk Drive (HDD) test system is the equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD product line, KUMI, KOREA, and shows satisfactory results.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2005년도 ICCAS
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• pp.2424-2429
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• 2005

Hard Disk Drive (HDD) test system is the equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD product line, KUMI, KOREA, and shows satisfactory results.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 합동 추계학술대회 논문집 정보 및 제어부문
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• pp.597-600
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• 2002

This paper has been studied expert system using fuzzy theory for fault diagnosis of HDD test systems by detecting systems fault and presenting the way of repair using test history and rule base built via interview from exports. The rules of fault diagnosis of HDD test systems are classified into 2 types, fuzzy and crisp, and these have been serialized to decide whether fault diagnosis be done or not by fuzzy rules and to present the way of repair by crisp rules. And then this paper has designed expert system using fuzzy theory for fault diagnosis.

• 한국정보통신학회논문지
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• 제12권2호
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• pp.299-308
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• 2008

본 논문에서는 RF 집적회로의 설계사양을 시간영역에서 테스팅이 가능한 구간고장모델링 기법을 제안한다. 먼저 구간고장모델을 정의하였고, 정상동작구간을 결정하여 구간고장모델이 될 수 있는 조건을 증명하였다. 그리고 구간고장모델 조건을 5.25 GHz 저잡음 증폭기에 적용하여 능동소자와 수동소자의 강고장과 파라메트릭 고장의 검출이 가능한 9개의 구간고장모델을 모의실험에 의하여 구하였다. 본 논문에서 얻어진 구간고장모델을 기반으로 출력에 나타나는 출력파형의 변화를 시간영역에서 관찰하여 설계사양 테스팅을 수행할 수 있으므로 RF 집적회로의 테스팅 시간과 비용을 줄일 수 있다.

• Journal of information and communication convergence engineering
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• 제3권1호
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• pp.28-32
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• 2005

In this paper, we propose a novel test method to effectively detect hard and soft faults in CMOS 2-stage op-amps. The proposed method uses a very high frequency sinusoidal signal that exceeds unit gain bandwidth to maximize the fault effects. Since the proposed test method doesn't require any complex algorithms to generate the test pattern and uses only a single test pattern to detect all target faults, therefore test costs can be much reduced. The area overhead is also very small because the CUT is converted to a unit gain amplifier. Using HSPICE simulation, the results indicated a high degree of fault coverage for hard and soft faults in CMOS 2-stage op-amps. To verify this proposed method, we fabricated a CMOS op-amp that contained various short and open faults through the Hyundai 0.65-um 2-poly 2-metal CMOS process. Experimental results for the fabricated chip have shown that the proposed test method can effectively detect hard and soft faults in CMOS op-amps.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 B
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• pp.625-628
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• 2003

This paper proposes a fuzzy expert system for the fault diagnosis of Hard Disk Drive(HDD) test systems. The purposes of this system are diagnosis of HDD test systems, detection of system faults using test history, and presentation of the way of repair. Proposed Expert system is designed with Fuzzy logic and Binary Logic to present the way of repair using HDD tort result, HDD test history. The proposed system is simulated with actual data from SAMSUNG HDD product line in KUMI, KOREA, and show effective results.

• 대한임베디드공학회논문지
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• 제4권1호
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• pp.23-28
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• 2009

Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described.

• 전력전자학회논문지
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• 제3권4호
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• pp.426-436
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• 1998

Identification of fault current during the operation of a power semiconductor switch and activation of suitable remedial actions are important for reliable operation of power converters. A short circuit is a basic and severe fault situation in a circuit structure such as voltage source converters. This paper presents a new active protection circuit for fast and precise clamping and safe shutdown of fault currents of the IGBTs. This circuit allows operation of the IGBTs with a higher on-state gate voltage, which can thereby reduce the conduction loss in the device without compromising the short circuit protection characteristics. The operation of the circuit is studied under various conditions, considering variation of temperature, rising rate of fault current, gate voltage value, and protection circuit parameters. An evaluation of the operation of the circuit is made using IGBTs from different to confirm the effectiveness of the protection circuit.