• Proceedings of the IEEK Conference
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• 1999.06a
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• pp.349-352
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• 1999

In this paper, we present simplified fault set which is made by analyzing fault relation to design specification in CMOS operational amplifier. The hard fault is easily modeled because an effect of hard fault is out of all design specification. However, the soft fault is not easily modeled because an effect of soft fault on design specification is varied according to position and depth of fault. We simulated hard and soft fault by HSPICE, varying threshold voltage and W/L ratio from 90% increase to 90% decrease. The decrease of test time and the production of high reliability mixed-mode IC are possible by the proposed fault set.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.53 no.6
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• pp.457-464
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• 2004

Hard Disk Drive (HDD) test system is an equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD production line, KUMI, KOREA, and shows satisfactory results.

• 제어로봇시스템학회:학술대회논문집
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• 2005.06a
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• pp.2418-2423
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• 2005

Hard Disk Drive (HDD) test system is the equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD product line, KUMI, KOREA, and shows satisfactory results.

• 제어로봇시스템학회:학술대회논문집
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• 2005.06a
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• pp.2424-2429
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• 2005

Hard Disk Drive (HDD) test system is the equipment for the final test of HDD product by iterative read/write/seek test. This paper proposes an expert system for the fault diagnosis of HDD test systems. The purposed expert system is composed with two cascade inference, fuzzy logic and conventional binary logic. The fuzzy logic determines the possibility of the system fault using the test history data, then, the binary logic inferences the fault location of the test system. The proposed expert system is tested in SAMSUNG HDD product line, KUMI, KOREA, and shows satisfactory results.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.597-600
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• 2002

This paper has been studied expert system using fuzzy theory for fault diagnosis of HDD test systems by detecting systems fault and presenting the way of repair using test history and rule base built via interview from exports. The rules of fault diagnosis of HDD test systems are classified into 2 types, fuzzy and crisp, and these have been serialized to decide whether fault diagnosis be done or not by fuzzy rules and to present the way of repair by crisp rules. And then this paper has designed expert system using fuzzy theory for fault diagnosis.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.2
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• pp.299-308
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• 2008

This paper proposes a new design specification-based band fault modelling technique that can test design specification in a time domain. The band fault model is defined and the conditions of band fault model are gained as normal operation regions are defined. And the conditions of band fault model are used in a 5.25GHz low noise amplifier, then 9 band fault models that can detect hard and parametric faults of active and passive devices are obtained.

• Journal of information and communication convergence engineering
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• v.3 no.1
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• pp.28-32
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• 2005

In this paper, we propose a novel test method to effectively detect hard and soft faults in CMOS 2-stage op-amps. The proposed method uses a very high frequency sinusoidal signal that exceeds unit gain bandwidth to maximize the fault effects. Since the proposed test method doesn't require any complex algorithms to generate the test pattern and uses only a single test pattern to detect all target faults, therefore test costs can be much reduced. The area overhead is also very small because the CUT is converted to a unit gain amplifier. Using HSPICE simulation, the results indicated a high degree of fault coverage for hard and soft faults in CMOS 2-stage op-amps. To verify this proposed method, we fabricated a CMOS op-amp that contained various short and open faults through the Hyundai 0.65-um 2-poly 2-metal CMOS process. Experimental results for the fabricated chip have shown that the proposed test method can effectively detect hard and soft faults in CMOS op-amps.

• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.625-628
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• 2003

This paper proposes a fuzzy expert system for the fault diagnosis of Hard Disk Drive(HDD) test systems. The purposes of this system are diagnosis of HDD test systems, detection of system faults using test history, and presentation of the way of repair. Proposed Expert system is designed with Fuzzy logic and Binary Logic to present the way of repair using HDD tort result, HDD test history. The proposed system is simulated with actual data from SAMSUNG HDD product line in KUMI, KOREA, and show effective results.

• IEMEK Journal of Embedded Systems and Applications
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• v.4 no.1
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• pp.23-28
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• 2009

Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described.

• The Transactions of the Korean Institute of Power Electronics
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• v.3 no.4
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• pp.426-436
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• 1998

Identification of fault current during the operation of a power semiconductor switch and activation of suitable remedial actions are important for reliable operation of power converters. A short circuit is a basic and severe fault situation in a circuit structure such as voltage source converters. This paper presents a new active protection circuit for fast and precise clamping and safe shutdown of fault currents of the IGBTs. This circuit allows operation of the IGBTs with a higher on-state gate voltage, which can thereby reduce the conduction loss in the device without compromising the short circuit protection characteristics. The operation of the circuit is studied under various conditions, considering variation of temperature, rising rate of fault current, gate voltage value, and protection circuit parameters. An evaluation of the operation of the circuit is made using IGBTs from different to confirm the effectiveness of the protection circuit.