• Imaging Science in Dentistry
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• v.30 no.3
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• pp.183-188
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• 2000

Purpose: This study was to evaluate the beam quality of intraoral X-ray equipments used at Yonsei University Dental Hospital (YUDH) using the half value layer (HVL) and the characteristic curve of intraoral standard X-ray film. Materials and Methods : The study was done using the intraoral X -ray equipments used at each clinical department at YUDH. Aluminum filter was used to determine the HVL. Intraoral standard film was used to get the characteristic curve of each intraoral X-ray equipment. Results: Most of the HVLs of intraoral X-ray equipments were higher than the least recommended thickness, but the REX 601 model used at the operative dentistry department and the X-707 model used at the pediatric dentistry department had HVLs lower than the recommended thickness. The slopes of the characteristic curves of films taken using the PANP AS 601 model and REX 601 model at operative dentistry department, the X-70S model of prosthodontic dentistry department, and the REX 601 model at the student clinic were relatively low. Conclusion: HVL and the characteristic curve of X-ray film can be used to evaluate the beam quality of intraoral X-ray equipment. In order to get the best X-ray films with the least radiation exposure to patients and best diagnostic information in clinical dentistry, X -ray equipment should be managed in the planned and organized fashion.

• Journal of the Korean Society of Radiology
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• v.10 no.8
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• pp.591-596
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• 2016

The purpose of this study is to determine the equivalent energy of a 6MV X-ray beam in the experiment. The half-value layer (HVL) of lead for the 6 MV X-ray beam was measured using an ionization chamber. The linear attenuation coefficients were calculated with HVL. And, the mass attenuation coefficient was obtained by dividing the linear attenuation coefficient by the density of lead. The equivalent energy of mass attenuation coefficient was determined using the photon energy versus mass attenuation coefficient data of lead given by National Institute of Standards and Technology (NIST). In conclusion, the equivalent energy of the 6 MV X-ray beam was determined to be 1.61 MeV. This equivalent energy was determined to be about 30% lower than reported by Reft. The reason is presumed to be due to the presence of an air cavity between the lead attenuators.

• Imaging Science in Dentistry
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• v.53 no.3
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• pp.217-220
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• 2023

Purpose: This pilot study was conducted to evaluate half-value layer (HVL) measurements obtained using a semiconductor dosimeter for intraoral radiography. Materials and Methods: This study included 8 aluminum plates, 4 of which were low-purity (less than 99.9%) and 4 high-purity (greater than 99.9%). Intraoral radiography was performed using an intraoral X-ray unit in accordance with the dental protocol at the authors' affiliated hospital: tube voltage, 60 kVp and 70 kVp; tube current, 7 mA; and exposure time, 0.10 s. The accuracy of HVL measurements for intraoral radiography was assessed using a semiconductor dosimeter. A simple regression analysis was performed to compare the aluminum plate thickness and HVL in relation to the tube voltage (60 kVp and 70 kVp) and aluminum purity (low and high). Results: For the low-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the thickness of the aluminum plate (X), with Y=1.708+0.415X (r=0.999, P<0.05) and Y=1.980+0.484X (r=0.999, P<0.05), respectively. Similarly, for the high-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the plate thickness(X), with Y=1.696+0.454X (r=0.999, P<0.05) and Y=1.968+0.515X (r=0.998, P<0.05), respectively. Conclusion: This pilot study examined the relationship between aluminum plate thickness and HVL measurements using a semiconductor dosimeter for intraoral radiography. Semiconductor dosimeters may prove useful in HVL measurement for purposes such as quality assurance in dental X-ray imaging.

• The Journal of Korean Academy of Prosthodontics
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• v.45 no.3
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• pp.303-309
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• 2007

Statement of problem. The effect of gold electroforming on gold alloy was not studied. Purpose. This in vitro study investigate the effect of gold electroforming on gold-silver-palladium alloy. Material and methods. Three pieces of gold strips had undergone the electroforming procedures on one side and then half of the side again electroformed. The set mode for this study was program 1 ($200{\mu}m$). And the processing time was 15min (1/20 time to form $200{\mu}m$ coping). The confocal laser scanning microscope (PASCAL 5, Carl Zeiss, Bernried, Germany) was used to measure the thickness of the pure gold layer electroformed on the gold strips. Half of the gold strip was coated two times with electroformed gold, and the other half one time. The data from the cone focal laser system was processed to get the vertical profile of the strips and the difference of the vertical height between the double coated and single coated layer was regarded as the thickness of the gold coating. The layer thickness value to built 3D image of the cone-focal laser was set $0.5{\mu}m$. Next to the measurement of the thickness of the coating, the Vicker's hardness test was done. It was performed on the double coated surface, single coated surface and non-coated surface (back side) three times each. Results. The mean thickness value gained from gold electroforming technique was measured to be $22{\mu}m$ for sample 1, $23{\mu}m$ for sample 2, $21{\mu}m$ for sample 3. In the same condition of time, power and the amount of electrolyte, the data showed no difference between samples. According to the results of variance analysis, the differences among the variations in number of coating were statistically insignificant (p>0.05), meaning that the two times of gold electroforming coating did not change the hardness of gold-silver-palladium alloy. Conclusion. The test of thickness of gold coating proved the coherency of the gold electroforming procedure, in other words, when the power, the exposed surface area, processing time and the amount of electrolytes were set same, the same thickness of gold would be coated on. The hardness test showed that the electroformed gold coating did not change the hardness of the gold-silver-palladium alloy when it is coated not more than $45{\mu}m$.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.6
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• pp.503-508
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• 2008

In order to reduce the piezoelectric field originated from the well layer which resides in InGaN/GaN light emitting diode, InGaN/GaN superlattice buffer layers were grown at the bottom and the top of the active layer. Measuring the photoluminescence spectra with different reverse bias voltages clearly revealed the condition of the flat band under which the transition energy is maximized and the linewidth is minimized. Accordingly, the piezoelectric field of $In_{0.15}Ga_{0.85}N$ in our sample was estimated as -1.08 MV/cm. It is less than half the value reported in the previous studies, and it is evidenced that the strain has reduced due to the superlattice buffer layers.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.284-285
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• 2007

In this paper, we present the effect on a novel transmission line filter response by the etch hole position on the suspended ground and the residue on the resonator under ground plane. We defined the etch hole offset as the distance from the sidewall of the suspended ground to the nearest side of the etch holes. We simulated new filter responses to reflect the real value of the changed etch hole offset caused by characteristics of negative photoresist. Return loss is distorted by the residue on the center conductor remained after sacrificial layer removing. By comparison of simulation and measurements, we concluded the residue on the resonator distorted the RF response worse than etch hole offset variation did.

• Advances in materials Research
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• v.3 no.2
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• pp.61-75
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• 2014

This study aimed to investigate the suitability of some concrete components for producing "high-performance heavy density concrete" using different types of aggregates that could enhances the shielding efficiency against ${\gamma}$-rays. 15 mixes were prepared using barite, magnetite, goethite and serpentine aggregates along with 10% silica fume, 20% fly ash and 30% blast furnace slag to total OPC content for each mix. The mixes were subjected to compressive strength at 7, 28 and 90 days. In some mixes, compressive strengths were also tested up to 90 days upon replacing sand with the fine portions of magnetite, barite and goethite. The mixes containing magnetite along with 10% SF reaches the highest compressive strength exceeding over M60 requirement by 14% after 28 days. Whereas, the compressive strength of concrete containing barite was very close to M60 and exceeds upon continuing for 90 days. Also, the compressive strength of high-performance concrete incorporating magnetite fine aggregate was significantly higher than that containing sand by 23%. On the other hand, concrete made with magnetite fine aggregate had higher physico-mechanical properties than that containing barite and goethite. High-performance concrete incorporating magnetite fine aggregate enhances the shielding efficiency against ${\gamma}$-rays.

• Journal of Radiation Protection and Research
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• v.42 no.1
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• pp.26-32
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• 2017

Background: Ionizing radiation is known to be harmful to human health. The shielding of ionizing radiation depends on the attenuation which can be achieved by three main rules, i.e. time, distance and absorbing material. Materials and Methods: The mass attenuation coefficient, linear attenuation coefficient, Half Value Layer (HVL) and Tenth Value Layer (TVL) of X-rays (32 keV, 74 keV) and gamma rays (662 keV) are measured in Barium compounds. Results and Discussion: The measured values agree well with the theory. The effective atomic numbers ($Z_{eff}$) and electron density (Ne) of Barium compounds have been computed in the wide energy region 1 keV to 100 GeV using an accurate database of photon-interaction cross sections and the WinXCom program. Conclusion: The mass attenuation coefficient and linear attenuation coefficient for $BaCO_3$ is higher than the $BaCl_2$, $Ba(No_3)_2$ and BaSO4. HVL, TVL and mean free path are lower for $BaCO_3$ than the $BaCl_2$, $Ba(No_3)_2$ and $BaSO_4$. Among the studied barium compounds, $BaCO_3$ is best material for x-ray and gamma shielding.

• Journal of the Korean Magnetics Society
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• v.16 no.2
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• pp.111-114
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• 2006

We investigated the magnetism and electronic structures for the layered structures consisting of (110) layers of zinc-blende CrAs and MnAs. We calculated the electronic structures for $(CrAs)_3(MnAs)_3(110)$ superlattice consisted of alternating three layers of CrAs(110) and MnAs(110) by the full-potential linearized augmented plane wave (FLAPW) method. The calculated magnetic moment of Cr in interface layer ($3.07\;\mu_B$) was slightly larger than that of Cr atom in center layer ($3.06\;\mu_B$), while that of interface Mn atom ($3.74\;\mu_B$) was slightly smaller than the value of Mn atom in center layer ($3.76\;\mu_B$). The electronic structure and half-metallicity in this superlattice were discussed using the calculated density of states.

• Korean Journal of Materials Research
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• v.33 no.2
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• pp.54-62
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• 2023

The most comprehensive and particularly reliable method for non-destructively measuring the residual stress of the surface layer of metals is the sin²ψ method. When X-rays were used the relationship of ε_φψ-sin²ψ measured on the surface layer of the processing metal did not show linearity when the sin²ψ method was used. In this case, since the effective penetration depth changes according to the changing direction of the incident X-ray, σ_φ becomes a sin²ψ function. Since σ_φ cannot be used as a constant, the relationship in ε_φψ-sin²ψ cannot be linear. Therefore, in this paper, the orthogonal function method according to Warren's diffraction theory and the basic profile of normal distribution were synthesized, and the X-ray diffraction profile was calculated and reviewed when there was a linear strain (stress) gradient on the surface. When there is a strain gradient, the X-ray diffraction profile becomes asymmetric, and as a result, the peak position, the position of half-maximum, and the centroid position show different values. The difference between the peak position and the centroid position appeared more clearly as the strain (stress) gradient became larger, and the basic profile width was smaller. The weighted average strain enables stress analysis when there is a strain (stress) gradient, based on the strain value corresponding to the centroid position of the diffracted X-rays. At the 1/5 I_max max height of X-ray diffraction, the position where the diffracted X-ray is divided into two by drawing a straight line parallel to the background, corresponds approximately to the centroid position.