• Applied Microscopy
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• v.36 no.spc1
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• pp.1-7
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• 2006

The three-dimensional structure of an inorganic crystal, $SmZn_{0.67}Sb_2$ (space group $P4/nmm,\;a=4.30(3){\AA}\;and\;c= 10.27(1){\AA}$), was refined by electron crystallography utilizing high voltage electron microscopy (HVEM). Effects of instrumental resolution, image quality, beam damage and specimen tilting on the structure refinement have been evaluated. The instrumental resolution and image quality were the most important factors on the final results in the structure refinement, while the beam damage and specimen tilting effects could be experimentally minimized or controlled. The average phase errors $({\Phi}_{res})$ for the [001], [100] and [110] HVEM images of $SmZn_{0.67}Sb_2$ were $10.1^{\circ},\;9.6^{\circ}\;and\;6.8^{\circ}$, respectively. The atomic coordinates of $SmZn_{0.67}Sb_2$ were consistent within $0.0013{\AA}{\sim}0.0088{\AA}$, compared to the X-ray crystallography data for the same sample.

• Proceedings of the Korean Information Science Society Conference
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• 2005.07a
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• pp.580-582
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• 2005

거리가 상당히 먼 곳에서 고가의 장비를 사용하기 위해서는 사용할 연구 인력이 직접 와야 하는 많은 시간적 비용적 문제가 발생한다. 특히 본원에 장비되어 있는 초고전압 투과전자현미경(High Voltage Electron Microscopy - 이하 HVEM)의 경우 고가의 장비로 지역마다 기기를 구비할 수 없어 사용자는 직접 장비가 있는 연구실까지 와서 사용해야 한다. HVEM은 1천만 배율의 성능을 가진 국내 유일은 물론 전 세계적으로도 손꼽히는 고성능의 투과전자현미경으로 NT(Nano Technology), BT(Bio Technology) 연구에 있어서 핵심적인 역할을 하는 청단 연구기기이다. 따라서 본 논문에서는 그리드 컴퓨터 기술을 이용하여 HVEM을 원격제어 하는 시스템을 구축하였다.

• Applied Microscopy
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• v.34 no.1
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• pp.13-21
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• 2004

The high voltage electron microscope (HVEM) newly installed in KBSI is an advanced transmission electron microscope capable of atomic resolution (${\leq}1.2{\AA}$ point-to-point resolution) together with high titling function (${\pm}60^{\circ}$), which are suitable to do 3-dimensional atomic imaging of a specimen. In addition, the instrument can be controlled by remote operation system, named as 'FasTEM' for the HVEM, which is favorable to overcome some environmental obstacles resulting from the direct operation. The FasTEM remote operation system has been established between the headquarter of KBSI in Daejeon and the Seoul branch. The server system in the headquarter has been connected with a portable client console system in the Seoul branch using an advanced internet resource, 'KOREN' of 155 Mbps grade. Most of the HVEM functions essential to do remote operation are available on the portable client console. The experiment to acquire the high resolution image of [001] Au has been achieved by excellent transmission of control signals and communication with the HVEM. Real-time reaction like direct operation, such as controls of the illumination and projection parameters, acquisition and adjustment of each detector signal, and electrical steering of each motor-driven system has been realized in remote site. It is positively anticipated that the first remote operation of HVEM in conjunction with IT infraengineering plays a important role in constructing the network based e-Science Grid in Korea for national user s facilities.

• 한국전자현미경학회:학술대회논문집
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• 2005.05a
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• pp.66-69
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• 2005

• Ceramist
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• v.10 no.5
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• pp.63-67
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• 2007

• Proceedings of the Korea Crystallographic Association Conference
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• 2004.11a
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• pp.11-11
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• 2004

• Applied Microscopy
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• v.35 no.4
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• pp.98-104
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• 2005

A FOV (field-of-view) of the HV-MSC (high voltage multi-scan CCD, $1024{\times}1024$ pixels) camera mounted in the post-column HV-GIF (high voltage gatan image filter) has been drastically enlarged by the projection lens current adjustment. An imaging area of the HV-MSC camera obtained at the lowest magnification (2,000x) is $112{\mu}m^2$ which corresponds to the recording area of the film at the magnification of 8,800x, while the achievable recording area is only $0.43{\mu}m^2$ at the same magnification without this technique. Ignoring the image distortion of less than 5%, we have designed an on-site reference graph to estimate projection lens currents for microscope magnifications above 8,800x, where the recording area on the HVMSC is same as that on the film.

• 한국전자현미경학회:학술대회논문집
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• 2005.11a
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• pp.48-52
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• 2005

• 한국전자현미경학회:학술대회논문집
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• 2005.11a
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• pp.31-32
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• 2005

• 한국전자현미경학회:학술대회논문집
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• 2005.05a
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• pp.32-32
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• 2005