• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1041-1044
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• 2003

In this paper, a new CMOS fully integrated frequency-to-digital converter is proposed. The operation of the proposed circuit is based on a pulse-shrinking delay element. In the proposed circuit, a resolution of the converted digital output can be easily improved by increasing the number of the pulse-shrinking element. Also the input frequency range can be easily changed through controlling bias voltage in the pulse-shrinking element. The simulation of the designed circuit carried out by HSPICE using the CMOS 0.35${\mu}{\textrm}{m}$ process technology.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.277-280
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• 2001

The proposed clock generator lowers the operating frequency in a system core though it keeps data bandwidth high because it has a multiphase clocking architecture. Moreover. it has a dual loop which is comprised of an inner analog phase generation loop and outer digital phase control loop. It has both advantages of DLL's wide operating range and DLL's low jitter The proposed design has been demonstrated in terms of the concept and Hspice simulation. All circuits were designed using a 0.25${\mu}{\textrm}{m}$ CMOS process and simulated with 2.5 V power supply.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.361-364
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• 2001

This paper presents a simple method for estimating the maximum crosstalk noise of on-chip grobal wires. For the derivation of the maximum crosstalk expression we have modeled wires using lumped-elements that are composed of R, L and C. We have also used experimental constant to reduce the modeling error. The accuracy of the proposed method is verified by comparing against the HSPICE simulation results under the present process parameters and environmental conditions. The results of the proposed method can be used as an estimator in design-aid tools.

• Proceedings of the IEEK Conference
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• 1999.06a
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• pp.389-392
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• 1999

It is essential to estimate an effective inductance in a ground plane of muliti-layer IC package system in order to determine the simultaneous switching noise of the package. A new method to estimate the effective ground inductance in multi-layer IC package is presented. With the estimated ground plane inductance values, maximum switching noise variations according to the number of simultaneously switching drivers are investigated by developing a new SSN model. These results are verified by performing HSPICE simulation with the 0.35${\mu}{\textrm}{m}$ CMOS technology.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.244-247
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• 1999

In this paper, a low voltage CMOS analog four-quadrant multiplier is presented. The proposed multiplier is composed of a pair of transconductor and lowers supply voltage down to $V_{T}$+2 $V_{Ds,sat}$+ $V_{DS,triode}$. The designed analog four-quadrant multiplier have simulated by HSPICE using 0.25${\mu}{\textrm}{m}$ n-well CMOS process with a 1.2V supply voltage. Simulation results show that the THD can be 1.28% at maximum differential input of 0.7 $V_{p-p}$././.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.8
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• pp.23-32
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• 1998

In this paper, we propose a memory compiler to genrate embedded RAMs and ROMs for ASIC chips. We design the leaf cells to be compsoed of memory blocks. The compiler is built using tile-based method to simplify routing. The compiler can genrate any memory layouts to satisfy 64 to 4096 words and 4 to 256 bits per word. The technology we used here is 0.8.mu.m single poly double metal CMOS process. The address access time and power consumption are verifie dthrough the HSPICE simulation.

• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.637-638
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• 2006

A novel 1.2V class-AB output stage for the SW-OpAmp technique was presented. By using current mirrors and simple current extraction circuits, the proposed circuit boosts DM signal currents while eliminates CM ones to perform class-AB operation. Hspice simulation results verify the versatility of the proposed circuit technique.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.54 no.8
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• pp.350-354
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• 2005

This paper proposes a new method for delay time calculation in RLC interconnects. This method is simple, but precise. The proposed method can calculate delay time of RLC interconnects by simple numerical formula calculation without complex moment calculation using reduced model in RLC interconnects. The results using the proposed method for RLC circuits show that average relative error is within $10\%$ in comparison with HSPICE simulation results.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.28 no.11A
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• pp.891-901
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• 2003

This paper presents low-power asynchronous barrel shifters for variable length encoders and decoders useful in portable applications using multimedia standards. Our approach is to create multi-level asynchronous barrel shifters optimized for the skewed shift control statistics often found in these codecs. For common shifts, data passes through one level, whereas for rare shifts, data passes though multiple levels. We compare our optimized designs with the straightforward asynchronous and synchronous designs. Both pre- and Post-layout HSPICE simulation results indicate that, compared to their synchronous counterparts, our designs provide over a 40% savings in average energy consumption for a given average performance.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.7 no.1
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• pp.100-105
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• 2003

In this paper, we propose the novel test method effectively to detect short and open faults in CMOS op-amp. The proposed method uses a sinusoidal signal with higher frequency than unit gain bandwidth. Since the proposed test method doesn't need complex algorithm to generate test pattern, the time of test pattern generation is short, and test cost is reduced because a single test pattern is able to detect all target faults. To verify the proposed method, CMOS two-stage operational amplifier with short and open faults is designed and the simulation results of HSPICE for the circuit have shown that the proposed test method can detect short and open faults in CMOS op-amp.