• Journal of the Korean Institute of Telematics and Electronics A
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• v.29A no.7
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• pp.73-81
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• 1992

We have investigated the thermal reaction property and the oxygen behavior of TiN/Ti/Si structure after different hear treatments using x-ray photoelectron spectroscopy and cross-sectional transmission electron microscopy measurements. During the heat treatment in N$_2$ amibient, the considerable amount of oxygen atoms incorporates into TiN/Ti/Si Structures. It is found that oxygen atoms pile up at the top surface of TiN and TiN/Ti interface, forming a compound of TiO$_2$ above $600^{\circ}C$. Inside the TiN film, the oxygen content increases as the annealing temperature increases, mostly TiO and Ti$_2$O$_3$ rather than thermodynamically stable TiO$_2$. Above the annealing temperature of 55$0^{\circ}C$, the TiSi$_2$ formation has initiated. One thing to note is that a severe blistering is observed in the sample annealed at $600^{\circ}C$, due to (1) the difference of thermal expansion coefficient between TiN and Si` (2) the compressive stress induced by the volume reduction caused by the Ti-Silicide grain while elevating temperatures.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.5
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• pp.1-8
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• 2000

Fatigue and data retention characteristics of the Pt/PZT/Pt structure using single grain PZT thin films by PZT seeding method were investigated. In case of fatigue, there is no loss in switched polarization up to 2$\times$10$^{11}$ cycles using 1MHz square wave form at $\pm$10V and no data loss after 30000sec of memory retention at room temperature. From the activation energy measured at high temperatures, the time required 20% loss in remanent polarization is estimated to be 6.6$\times$10$^{7}$ years at room temperature.

• Journal of the Korean Chemical Society
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• v.42 no.4
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• pp.487-500
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• 1998

A bird's-eye view on preparation, structure and properties of polymeric complexes in the field of Inorganic-Organic-Hybrids is presented in the view point of solid state and materials chemistry. These materials are useful precursors for preparing nanoparticles and fine grain oxides. Some of them are electroactive and are used as protonic or lithium electrolytes, electrochromic materials or membranes for sensors and actuators. New results on bio-hybrids, a class of material not far from polymeric complexes, are also described.

• Proceedings of the Materials Research Society of Korea Conference
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• 2009.05a
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• pp.33.1-33.1
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• 2009

Lead-free (1-x)$(Na_{0.5}K_{0.5})NbO_3$-xBa($Ti_{0.9}Sn_{0.1})O_3$ [NKN-BTS-100x] ceramics doped with 1 mol% $MnO_2$ have been prepared by the conventional solid state method and their structural and piezoelectric properties were investigated. The NKN-BTS-100x ceramics exhibited a dense and homogeneous microstructure when they were sintered at $1030-1150^{\circ}C$. Grain growth was observed for the specimen sintered at relatively low temperature of $1050^{\circ}C$. A tetragonal/orthorhombic morphotropic phase boundary (MPB) in the perovskite structure was also appeared for the NKN-BTS-100x ceramics (0.04$1050^{\circ}C$. The enhanced piezoelectric properties in the NKN-BTS ceramics with a MPB composition were obtained. Especially, for the NKN-BTS-6 ceramics, a high dielectric constant (${\varepsilon}^T_3/\varepsilon_0=1,400$), piezoelectric constant ($d_{33}=237$) and electromechanical coupling factor ($k_p=0.42$) were obtained.

• Korean Journal of Materials Research
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• v.12 no.9
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• pp.718-723
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• 2002

$Ti_{1-x}$ $Al_{ x}$N thin films as barrier layer for memory devices application were deposited by reactive magnetron sputtering. The crystallinity, micro-structure, oxidation resistance and oxidation mechanism of films were investigated as a function of Al content. Lattice parameter and grain size of thin films were decreased with increasing the Al content Oxidation of the film with higher Al content is slow and then, total oxide thickness is thinner than that of lower Al content film. Oxide layer formed on the surface is AlTiNO layer. Oxidation of $Ti_{1-x}$ /$Al_{x}$ N barrier layer is diffusion limited process and thickness of oxide layer with oxidation time increased with a parabolic law. The activation energy of oxygen diffusion, Ea and diffusion coefficient, D of $Ti_{0.74}$ /X$0.74_{0.26}$N film is 2.1eV and $10^{-16}$ ~$10^{-15}$ $\textrm{cm}^2$/s, respectively. $_Ti{1-x}$ /$Al_{x}$ XN barrier layer showed good oxidation resistance.

• Korean Journal of Materials Research
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• v.12 no.1
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• pp.16-20
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• 2002

In this study, the 95W heavy alloys of 3/7, 5/5 and 7/3 of Ni/Fe ratio were sintered at the temperature range between 1420 and $1480^{\circ}C$ for 1h and their microstructures were discussed for an effect of the ${\mu}$-phase $(Fe_7W_6)$ on the microstructure. The ${\mu}$-phase was observed in the only 95W-1.5Ni-3.5Fe alloy of 3/7 and it is thought to be formed and grown from the surface of the W particle. The W particle was surrounded with the ${\mu}$-phase and there were only the W particles and this phase without Ni-Fe-W matrix at the most part. The ${\mu}$-phase changed the interphase structure in the alloy and the grain growth of the W was suppressed because of interrupting the solution-reprecipitation of the W. The W content in the matrix was considered to be lowered due to the interruption of the solution-reprecipitation and the formation of the ${\mu}$-phase in the .

• KIEE International Transactions on Electrophysics and Applications
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• v.5C no.3
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• pp.119-123
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• 2005

Lithium titanium oxide as anode material for energy storage prepared by novel synthesis method. Li$_{4}$Ti$_{5}$O$_{12}$ based spinel-framework structures are of great interest material for lithium-ion batteries. We describe here Li$_{4}$Ti$_{5}$O$_{12}$ a zero-strain insertion material was prepared by novel sol-gel method and by high energy ball milling (HEBM) of precursor to from nanocrystalline phases. According to the X-ray diffraction and scanning electron microscopy analysis, uniformly distributed Li$_{4}$ Ti$_{5}$O$_{12}$ particles with grain sizes of 100nm were synthesized. Lithium cells, consisting of Li$_{4}$ Ti$_{5}$O$_{12}$ anode and lithium cathode showed the 173 mAh/g in the range of 1.0 $\~$ 3.0 V. Furthermore, the crystalline structure of Li$_{4}$ Ti$_{5}$O$_{12}$ didn't transform during the lithium intercalation and deintercalation process.

• Carbon letters
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• v.8 no.3
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• pp.177-183
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• 2007

[ $TiO_2$ ]ACF composites were prepared by the electrochemical method with Titanium (IV) n-butoxide (TNB) electrolyte under different electrochemical operation time. The BET surface area for $TiO_2$/ACF composites decrease with the increase of electrochemical operation time. There is a single crystal structure which is anatase in all of the samples from the data of XRD. The SEM micrphotographs of $TiO_2$/ACF composites show that the $TiO_2$ particles were well mixed with the ACF. There are O and P with strong C and Ti peaks in all samples from EDX results, and it also shows that a decrease of the C content with a increasing of Ti content with increasing of the electrochemical operation time in the over all composites. DSC cures show that the exothermic peak of all composites at $560^{\circ}C$ represents the transformation heat of amorphous parts to anatase phase and the discontinuous grain growth of the transformed anatase particles. Finally, the excellent photoactivity of $TiO_2$/ACF composites (especially, ACFT10) could be attributed that the decrease of concentration of MB can be concluded to be much faster for the adsorption by ACF than for photocatalytic decomposition by $TiO_2$.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.60 no.11
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• pp.2093-2096
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• 2011

In this study, lead-free $(Na_{0.5}K_{0.5})NbO_3-BiTiO_3$ ceramics were fabricated by a conventional mixed oxide method. Structural and electrical properties of lead-free $(Na_{0.5}K_{0.5})NbO_3$ ceramics with the variation of $BiTiO_3$ were investigated. The results of X-ray diffraction analysis showed a typical polycrystalline perovskite structure without presence of the second phase in all specimens. Sintered density increased with an increasing of BTO and the specimen added with 0.07 mol% of $BiTiO_3$ showed the maximum value of 97.8%. Average grain size decreased and densification increased with an increasing of $BiTiO_3$ contents. The electromechanical coupling factor of the 0.01 mol% $BiTiO_3$ doped NKN specimens was 0.32. Dielectric constant, dielectric loss and Curie temperature of the 0.07 mol% $BiTiO_3$ doped NKN specimens were 1185, 0.145% and $400^{\circ}C$, respectively.

• Journal of Electrical Engineering and Technology
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• v.4 no.1
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• pp.118-122
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• 2009

Organic thin film transistors with a pentacene active layer and various polymer gate insulators were fabricated and their performances were investigated. Characteristics of pentacene thin film transistors on different polymer substrates were investigated using an atomic force microscope (AFM) and x-ray diffraction (XRD). The pentacene thin films were deposited by thermal evaporation on the gate insulators of various polymers. Hexamethyldisilazane (HMDS), polyvinyl acetate (PVA) and polymethyl methacrylate (PMMA) were fabricated as the gate insulator where a pentacene layer was deposited at 40, 55, 70, 85, 100 oC. Pentacene thin films on PMMA showed the largest grain size and least trap concentration. In addition, pentacene TFTs of top-contact geometry are compared with PMMA and $SiO_2$ as gate insulators, respectively. We also fabricated pentacene TFT with Poly (3, 4-ethylenedioxythiophene)-Polysturene Sulfonate (PEDOT:PSS) electrode by inkjet printing method. The physical and electrical characteristics of each gate insulator were tested and analyzed by AFM and I-V measurement. It was found that the performance of TFT was mainly determined by morphology of pentacene rather than the physical or chemical structure of the polymer gate insulator