• Title/Summary/Keyword: Ga doped

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The electrical and optical properties of the Ga-doped ZnO thin films grown on transparent sapphire substrate (투명 사파이어 기판위에 성장시킨 Ga-doped ZnO 박막의 전기적·광학적 특성)

  • Chung, Yeun Gun;Joung, Yang Hee;Kang, Seong Jun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.17 no.5
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    • pp.1213-1218
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    • 2013
  • In this study, Ga-doped ZnO (GZO) thin films were fabricated on transparent sapphire substrate by RF magnetron sputtering method and then investigated the effect of various substrate temperature on the electrical, optical properties and characteristic of crystallization of the GZO thin films. The electrical property indicated that the lowest resistivity ($4.18{\times}10^{-4}{\Omega}cm$), the highest carrier concentration ($6.77{\times}10^{20}cm^{-3}$) and Hall mobility ($22cm^2/Vs$) were obtained in the GZO thin film fabricated at $300^{\circ}C$. And for this condition, the highest c-axis orientation and (002) diffraction peak which exhibits a FWHM of $0.34^{\circ}$ were obtained. From the results of AFM measurements, it is known that the highest crystallinity is observed at $300^{\circ}C$. The transmittance spectrum in the visible range was approximately 80 % regardless of substrate temperature. The optical band-gap showed the blue-shift as increasing the substrate temperature to $300^{\circ}C$, and they are all larger than the band gap of bulk ZnO (3.3 eV). It can be explained by the Burstein-Moss effect.

Photoluminescent Properties of $\textrm{Zn}_{2}\textrm{SiO}_{4}$: Mn Green Phosphors doped with Ga (Ga 도핑된 $\textrm{Zn}_{2}\textrm{SiO}_{4}$: Mn 녹색 형광체의 발광특성)

  • Park, Eung-Seok;Jang, Ho-Jeong;Jo, Tae-Hwan
    • Korean Journal of Materials Research
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    • v.8 no.9
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    • pp.860-864
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    • 1998
  • We investigated the photoluminescence and the crystalline properties with Ga doping concentrations (0-12 mol%) in $\textrm{Zn}_{1.98}\textrm{Mn}_{0.02}\textrm{SiO}_{4}$ green phosphors prepared by the solid state reaction. The photoluminescence was improved by a doping of Ga element in $\textrm{Zn}_{1.98}\textrm{Mn}_{0.02}(\textrm{Si_{1-x}\textrm{Ga}_{x})\textrm{O}_{4}$ phosphors which showed the highest emission intensity and good color purity in the doping concentration of x=0.08. The emission intensity of $\textrm{Zn}_{1.98}\textrm{Mn}_{0.02}(\textrm{Si_{1-x}\textrm{Ga}_{x})\textrm{O}_{4}$(x= 0.08) phosphors was increased to 7 times with increasing the sintering temperatures from $1100^{\circ}C$ to $1400^{\circ}C$, showing the improved crystalline quality. The decay time was not affected by Ga doping concentrations with constant values around 24ms. It was found from SEM and PSA analyses that the phosphors were composed of a large number of small grains around 1-3$10\mu\textrm{m}$ with a small amounts of agglomerated particles above $10\mu\textrm{m}$.

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Schottky Barrier Diode Fabricated on Single Crystal β-Ga2O3 Semiconductor (단결정 β-Ga2O3 반도체를 이용한 쇼트키 배리어 다이오드 제작)

  • Kim, Hyun-Seop;Jo, Min-Gi;Cha, Ho-Young
    • Journal of the Institute of Electronics and Information Engineers
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    • v.54 no.1
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    • pp.21-25
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    • 2017
  • In this study, we have fabricated Schottky barrier diodes (SBD) on single-crystal ${\beta}-Ga_2O_3$ semiconductor that has received much attention for use in next-generation power devices. The SBD had a Pt/Ti/Au Schottky contact on a $2{\mu}m$ Sn-doped low concentration N-type epitaxial layer. The fabricated device exhibited a breakdown voltage of > 180 V, a specific on-resistance of $1.26m{\Omega}{\cdot}cm^2$, and forward current densities of $77A/cm^2$ at 1 V and $473A/cm^2$ at 1.5 V, which proved the potential for use in power device fabrication.

Physical Operations of a Self-Powered IZTO/β-Ga2O3 Schottky Barrier Diode Photodetector

  • Madani Labed;Hojoong Kim;Joon Hui Park;Mohamed Labed;Afak Meftah;Nouredine Sengouga;You Seung Rim
    • Nanomaterials
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    • v.12 no.7
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    • pp.1061-1074
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    • 2022
  • In this work, a self-powered, solar-blind photodetector, based on InZnSnO (IZTO) as a Schottky contact, was deposited on the top of Si-doped β-Ga2O3 by the sputtering of two-faced targets with InSnO (ITO) as an ohmic contact. A detailed numerical simulation was performed by using the measured J-V characteristics of IZTO/β-Ga2O3 Schottky barrier diodes (SBDs) in the dark. Good agreement between the simulation and the measurement was achieved by studying the effect of the IZTO workfunction, β-Ga2O3 interfacial layer (IL) electron affinity, and the concentrations of interfacial traps. The IZTO/β-Ga2O3 (SBDs) was tested at a wavelength of 255 nm with the photo power density of 1 mW/cm2. A high photo-to-dark current ratio of 3.70×105 and a photoresponsivity of 0.64 mA/W were obtained at 0 V as self-powered operation. Finally, with increasing power density the photocurrent increased, and a 17.80 mA/W responsivity under 10 mW/cm2 was obtained.

Scintillating properties of Bi-doped $Y_3Ga_5O_{12}$

  • Novoselov, Andrey;Yoshikawa, Akira;Nikl, Martin;Fukuda, Tsuguo
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.14 no.6
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    • pp.233-235
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    • 2004
  • Shaped single crystals of Bi : $Y_3Ga_5O_{12}$(Bi = 0.041, 0.047 and 0.061 mol%) were grown by the micro-pulling-down method. Optical absorption spectra show an absorption band at 288 nm ascribed to the lowest energy $6s^2$ \longrightarrow 6s6p transition of $Bi^{3+}$ , while luminescence spectra demonstrate the band at 314 nm ascribed to the reverse radiative transition of the excited $Bi^{3+}$ centres. At room temperature, dominant decay time component was found to be about 440 ns with a minor slower component 580 ns.

이종타겟을 이용한 GZO 박막의 제작

  • Jeong, Yu-Seop;Kim, Sang-Mo;Son, In-Hwan;Kim, Gyeong-Hwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.120-120
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    • 2009
  • Ga doped ZnO (GZO) transparent conductive films were deposited on the glass substrates at room temperature by facing target sputtering (FTS) method. The sputtering targets were 100 mm diameter disks of GZO($Ga_2O_3$ 3.w.t%) and Zn metal. The GZO thin films were deposited as a various $PO_2$ (oxygen gas content). Base pressure was $2{\times}10^{-6}torr$, and a working pressure was 1mTorr. The properties of thin films on the electrical and optical properties of the deposited films were investigated by using a four-point probe (Chang-min), a Hall Effect measurement (Ecopia) and an UV/VIS spectrometer (HP). The minimum resistivity of film was $6.5{\times}10^{-4}[{\Omega}-cm]$ and the average transmittance of over 80% was seen in the visible range

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Synthesis and Luminescent Property Investigation of the $Mg_4GeO_2:Mn$ for LEDs

  • Lee, Seung-Jae;Park, Joung-Kyu;Kim, Kyung-Nam;Bae, Pan-Kee;Kim, Chang-Hae;Chang, Hyun-Ju;Kim, Yong-Rok
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1526-1528
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    • 2007
  • In this report, Manganese doped magnesium germanate ($Mg_4GeO_2:Mn$) phosphor has been synthesized by the solid state method. Also, this phosphor was prepared by simple process under an air atmosphere for oxidation of Mn. The prepared phosphor shows a main luminescent peak at 661nm. Therefore, this phosphor is possible to be applicable to white LED lamp by GaN or InGaN chips.

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Synthesis of the $CaGa_2S_4:Eu^{2+}$ phosphors and Application in White LEDs

  • Kim, Jae-Myung;Kim, Kyung-Nam;Park, Joung-Kyu;Kim, Chang-Hae;Jang, Ho-Gyeom
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1623-1626
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    • 2005
  • The thiogallate phosphors which are well known for a long time as phosphor materials for CRT or EL device were reported. Those have high luminescent properties at long-wavelength region. Among those phosphors, the samples with divalent europium doped CaGa2S4 were prepared by a simple process under the reduction atmosphere $(5%\;H_2/\;95%\;N_2)$ without toxic gas such as H2S or CS2. The prepared phosphor shows a higher luminescent efficiency (about 120%) than that of $YAG:Ce^{3+}$ phosphor. Consequently, this phosphor is possible to be applicable to white LED lamp because of the high luminescent efficiency.

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Properties of GZO thin films prepared by oxygen gas flow rate (산소 분압비에 따라 제작된 GZO 박막의 특성)

  • Jung, Yu-Sup;Kim, Kyung-Hwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.336-336
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    • 2010
  • Ga doped ZnO (GZO) transparent conductive films were deposited on the glass substrates at room temperature by facing target sputtering (FTS) method. The sputtering targets were 100 mm diameter disks of GZO($Ga_2O_3$ 3.w.t%) and Zn metal. The GZO thin films were deposited as a various $PO_2$ (oxygen gas content). Base pressure was $2{\times}10^{-6}$torr, and a working pressure was 1mTorr. The properties of thin films on the electrical and optical properties of the deposited films were investigated by using a four-point probe, a Hall Effect measurement and an UV/VIS spectrometer. The minimum resistivity of film was $6.5{\times}10^{-4}$[$\Omega$-cm] and the average transmittance of over 80% was seen in the visible range.

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