• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.151-154
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• 2002

AP/RPCVD를 이용하여 $650^{\circ}C$의 저온에서 실리콘-게르마늄의 선택적 단결정 성장 (Selective Epitaxy Growth: SEG) 을 수행하였다. 본 실험에서는 $SiH_4$, $GeH_4$ 그리고 HCl 가스를 사용하여 잠입시간 동안 실리콘-게르마늄막을 성장시키고 연속해서 HCI 가스만을 주입하여 산화막 위에 형성되어진 작은 결정입자들을 식각하는 공정을 반복적으로 수행하였다. HCl 의 식각에 의해 한 주기의 잠입기 후에도 다시 잠입기가 존재함을 확인하였고, 이 성장법을 통하여 한 주기의 잠업시간 동안 증착할 수 있는 두께 이상으로 실리콘-게르마늄막의 선택적 성장이 가능하였다. 이는 저온 선택적 실리콘-게르마늄 성장 시 RPCVD에서 보이는 낮은 선택성과 $SiH_4$의 짧은 장입시간으로 인해 원하는 두께까지 확보하기 힘든 단점을 극복한 것이다. 선택성을 향상시키기 위해 실리콘-게르마늄 증착중 주입된 HCI의 유량에 따라 잠입시간과 증착속도에 영향을 주었으며, 연속공정을 위한 식각공정은 20sccm의 HCI을 20초간 주입하여 선택성을 유지하였다. 또한 보론 불순물의 첨가가 선택적으로 성장되는 박막의 결정성에 미치는 영향도 분석되었다.

• Transactions on Electrical and Electronic Materials
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• v.11 no.2
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• pp.49-53
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• 2010

Microstructural origins of leakage current and physical degradation during operation in product-quality AlGaN/GaN high electron mobility transistor (HEMT) devices were investigated using photon emission microscopy (PEM) and transmission electron microscopy (TEM). AlGaN/GaN HEMTs were fabricated with metal organic chemical vapor deposition on semi-insulating SiC substrates. Photon emission irregularity, which is indicative of gate leakage current, was measured by PEM. Site specific TEM analysis assisted by a focused ion beam revealed the presence of threading dislocations in the channel below the gate at the position showing strong photon emissions. Observation of electrically degraded devices after life tests revealed crack/pit shaped defects next to the drain in the top AlGaN layer. The morphology of the defects was three-dimensionally investigated via electron tomography.

• Proceedings of the KIEE Conference
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• 1997.07e
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• pp.1715-1717
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• 1997

This paper deals with the dead operation characteristics of the earth leakage circuit breaker(ELB) caused by impulse voltages. The surge protective devices for electronic circuit and AC power lines are becoming more widely used. It is possible to give rise to the malfunction of ELB due to the operation of surge protective devices, and the interruption of AC power lines brings about several disadvantages such as low reliability of electronic and informational systems, economical loss, and etc. The dead operation characteristics of the ELB from impulse voltages were measured under the conditions of KS C 4613 and the test circuit with a varistor. As a result, the peak current value of the zero-phase sequence circuit of the ELB is increased as the surge voltage and stray capacitance increase. All of the ELBs used in this work were satisfied with the lightning impulse dead operation test condition defined in KS C 4613. However one specimen only did not cause dead operation in the condition of the test circuit with a varistor. There is high possibility that a large portion of the ELBs connected with the AC power lines having the surge protective devices bring about the dead operation.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.25 no.3
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• pp.170-175
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• 2012

Power MOSFET is develop in power savings, high efficiency, small size, high reliability, fast switching, low noise. Power MOSFET can be used high-speed switching transistors devices. Recently attention to the motor and the application of various technologies. Power MOSFET is devices the voltage-driven approach switching devices are design to handle on large power, power supplies, converters, motor controllers. In this paper, design the 600 V Planar type, and design the trench type for realization of low on-resistance. For both structures, by comparing and analyzing the results of the simulation and characterization.

• Proceedings of the Korea Crystallographic Association Conference
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• 2002.11a
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• pp.54-55
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• 2002

The fabrication, characterization and manipulation of nanoparticle system brings together physics, chemistry, materials science and biology in an unprecedented way. Phenomena occurring in such systems are fundamental to the workings of electronic devices, but also to living organisms. The ability to fabricate the surface of nanoparticles Is essential in the further development of functional devices that incorporate nanoscale features. Even more essential is the ability to introduce a wide range of chemical and materials flexibility into these structures to build up more complex nanostructures that can ultimately rival biological nanosystems. In this respect, polymers are potentially ideal nanoscale building blocks because of their length scale, well-defined architecture, controlled synthesis, ease of processing and wide range of chemical functionality that can be incorporated. In this presentation, we will look at a number of promising polymer-based nanoparticle fabrication strategies that have been developed recently, with an emphasis on those techniques that incorporate nanostructured polymeric particles into electronic devices or biomedical applications. And functional nanoparticles deliberately designed using several powerful process methods and their application will be discussed. Nanostructured nanoparticles, what we called, implies dispersed colloids with the size ranged from several nanometers to hundreds of nanometer. They have extremely large surface area, thus it is very important to control the morphology or surface functionality fitted for adequate objectives and properties. Their properties should be controlled for various kind of bio-related technologies, such as immunomagnetic cell separation, drug delivery systems, labeling and identification of lymphocyte populations, extracorporeal and hemoperfusion systems, etc. Well-defined polymeric nanoparticles can be considered as smart bomb or MEMS.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.427-428
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• 2008

New high efficiency green light emitting phosphorescent devices with emission layers of [TCTA/TCTA:TAZ/TAZ]:Ir$(ppy)_3$ have been fabricated and evaluated in this paper. Among the devices having different thicknesses of TCTA:TAZ mixed layer in the total 300$\AA$-thick host of TCTA(80$\AA$)/TCTA:TAZ (50~100$\AA$)/TAZ, the device with host of TCTA(80$\AA$)/TCTA:TAZ(90$\AA$)/TAZ(130$\AA$) showed the best electroluminescent characteristics with the current density of 95 mA/$cm^2$ and luminance of 25,000 cd/$m^2$ at an applied voltage of 10V. The maximum current efficiency was 52 cd/A under the luminance of 400 cd/$m^2$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.193-196
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• 1999

Organic electroluminescent devices have attracted a great deal of attention due to thier potential application to full-color flat-panel displays. The 8-hydroxyquinollne Zinc(Znq$_2$) were synthesized successfully from zinc chloride(ZnCl$_2$) and zinc acetate(Zn(C$_2$H$_3$O$_3$)$_2$) as green omitting material. A double-layer ELD consist of an emitting layer of B-hydroxyquinoline Zinc(Znq$_2$) and a hole-transport layer of tai-phenylene diamine(TPD) derivatives sandwiched between an Aluminium(Al) and Indium-Tin-Oxide(ITO) electrodes omitted green light resulting from Znq$_2$. The electroluminescent devices (ELD) exhibited a maximum luminance of 1000cd/$\textrm{cm}^2$ at a driving voltage of 8V and a driving current density of 0.4mA/$\textrm{cm}^2$.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.9
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• pp.757-761
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• 2001

We studied emitting properties of organic electroluminescent devices fabricated using the spin-coating and Langmuir-Blodgett(LB) technique. The LB technique has the advantage of precise control of the thickness better than spin-coating method. LB monolayer of poly(3-hexylthiophene)(P3HT) was deposited 27 layers onto the indium-tin-oxide(ITO) substrate as Y-type films by the vertical dipping method. In the absorption spectra, the λ$\_$max/ of P3HT-AA LB films and of spin-coating films showed about at 510, 545 and 590 nm corresponding to 2.43, 2.28, 2.10eV. And we observed that the turn-on voltage of devices deposited by LB method(10V) was higher than that of spin-coating method(8.5V) in voltage-current-luminance characteristic. In the logV-logJ characteristics of ITO/P3HT-AA LB/Al device, we confirmed that El device fabricated by LB method follows three conduction mechanisms: ohmic, space-charge-limited current(SCLC) conduction and trapped-carrier-limited space-charge current(TCLC) conduction.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.17-20
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• 1999

The retention and fatigue properties of ferroelectric LiNbO$_3$ thin films were studied. Metal-ferroelectric-semiconductor(MFS) devices by using rapid thermal annealed LiNbO$_3$/Si structures were successfully fabricated and demonstrated nonvolatile memory operations of the MFS devices. The I$_{D}$-V$_{G}$ characteristics of MFSFET\`s showed a hysteresis loop due to the ferroelectric nature of the LiNbO$_3$ thin film. The ferroelectric capacitors showed practically no polarization degradation up to about 10$^{10}$ switching cycles when subjected to symmetric bipolar voltage pulse (peak-to-peak 6V, 50% duty cycle) in the 500kHz. The retention properties of the LiNbO$_3$ thin films were quite good up to about 10$^{3}$ s . s .

• Transactions on Electrical and Electronic Materials
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• v.8 no.4
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• pp.174-177
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• 2007

We fabricated organic field-effect transistors (OFETs) based a fluorinated copper phthalocyanine ($F_{16}CuPC$) and copper phthalocyanine (CuPc) as an active layer. And we observed the surface morphology of the $F_{16}CuPC$ thin film. The $F_{16}CuPC$ thin film thickness was 40 nm, and the channel length was $50{\mu}m$, channel width was 3 mm. And we also fabricated the $F_{16}CuPc/CuPc$ double layer FET and with different $F_{16}CuPc$ film thickness devices. We observed the typical current-voltage (I-V) characteristics and capacitance-voltage (C-V) in $F_{16}CuPc$ FET and we calculated the effective mobility. From the double layer FET devices, we observed the higher drain current more than single layer FET devices.