• Journal of Applied Reliability
• /
• v.15 no.3
• /
• pp.170-175
• /
• 2015

Reliability demonstration tests (RDT's) are widely employed in design verification and process validation stages of industry. New mixed attribute-variable RDT plans that compromise demerits of the corresponding zero and zero or one failure plans which are common in practice are developed for the exponential distribution. The proposed mixed plans are compared with the typical RDT plans in terms of probability of acceptance and expected test termination time. A numerical example is provided to illustrate the mixed plans and a procedure to extend these plans to the Weibull distribution with known shape parameter is also presented.

• Journal of Applied Reliability
• /
• v.14 no.4
• /
• pp.262-266
• /
• 2014

In this paper, we consider the problem of determining the confidence level in zero-failure reliability sampling plans when the life distribution is Weibull distribution with a shape parameter m and a scale parameter ${\eta}$. We introduce zero-failure reliability sampling plans for Weibull distribution and investigate some characteristics of zero-failure reliability sampling plans. Finally, We propose new guideline for determining the confidence level in zero-failure reliability sampling plans for assuring $B_x-life$.

• Journal of Applied Reliability
• /
• v.17 no.2
• /
• pp.112-121
• /
• 2017

Purpose: The most previous works on designing accelerated life tests (ALTs) are focused on the application of a single stress. Because of the difficulty to obtain the sufficient information in a reasonable duration using single stress only, there is needed in practice to use multiple-stress ALTs frequently. This paper presents new practical plans with two stresses for Weibull distribution. Methods: The four-level practical plans based on rectangle test region are proposed and compared with the corresponding three-level statistically optimal plans. Sensitivity analyses for assumed design parameters and life-stress relationship are conducted. Results: A procedure to choose practical ALT plans is illustrated with a numerical example and guidelines for planning two-stress ALTs are provided. Conclusion: The proposed two-stress ALT plans on practical constraints to assess a quantile of Weibull lifetime distribution at the use condition are efficient and robust.

• Journal of Applied Reliability
• /
• v.14 no.3
• /
• pp.182-190
• /
• 2014

This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.

• Journal of Applied Reliability
• /
• v.3 no.2
• /
• pp.137-143
• /
• 2003

Sequential test plans are characterized by decision rules for accepting or rejecting compliance, or continuing the test at my test time. They are determined by selected values of risks and discrimination ratio. The sequential test plans in the international standard such as MIL-HDBK-781A are based on the assumption that the underlying distribution of times between failures is exponential. In this paper, sequential test plans are extended to the Weibull distribution case. Simulation studies are performed to examine the reasonability in this extension.

• Journal of Korean Institute of Industrial Engineers
• /
• v.43 no.2
• /
• pp.147-153
• /
• 2017

In order to demonstrate a target reliability with a specified confidence level, a new two-stage Bayesian Reliability Demonstration Test (RDT) plans that is known to be more effective than a corresponding single-stage one is proposed and developed by Bayesian framework with beta prior distribution for Weibull life time distribution. A numerical example is provided to illustrate the proposed RDT plans and compared with other non-Bayesian and Bayesian plans. Comparative results show that the proposed Bayesian two-stage plans have some merits in terms of required and expected testing time and probability of acceptance.

• Proceedings of the Korean Operations and Management Science Society Conference
• /
• 2005.05a
• /
• pp.922-926
• /
• 2005

Progressively censored variables sampling plans are proposed for the lot acceptance of parts whose life follows Weibull distribution with known shape parameter. Progressive type-II censoring gives us not only time to failure but also degradation information. So, one can construct more flexible and more cost effective sampling plans. Design parameters of our sampling plan are determined by using the usual two-point approach.

• Communications for Statistical Applications and Methods
• /
• v.12 no.1
• /
• pp.11-18
• /
• 2005

Assume that the life times of the units under test follow the Rayleigh distribution and the test is terminated at a pre assigned time. Acceptance sampling plans are developed for this situation. The minimum sample size necessary to ensure the specified average life are obtained and the operating characteristic values of the sampling plans and producer's risk are given. An example is given to illustrate the methodology.

• Industrial Engineering and Management Systems
• /
• v.15 no.3
• /
• pp.231-238
• /
• 2016

Traditional acceptance sampling plans have focused on the proportion of nonconforming items as an attribute criterion for quality. In today's modern quality management under high quality production environments, the reduction of the deviation from a target value in a quality characteristic has become the most important purpose. In consequence, various inspection plans for the purpose of reducing the deviation from the target value in the quality characteristic have been investigated. In this case, a concept of the quality loss evaluated by the deviation from the target value has been accepted as the variable evaluation criterion of quality. Further, some quality measures based on the quality loss have been devised; e.g. the process loss and the process capability index. Then, as one of inspection plans based on the quality loss, the rigorous design procedure for the variable sampling plan having desired operating characteristics (VS-OC plan) indexed by the quality loss has been proposed by Yen and Chang in 2009. By the way, since the estimator of the quality loss obeys the non-central chi-square distribution, the rigorous design procedure for the VS-OC plan indexed by the quality loss is complicated. In particular, the rigorous design procedure for the VS-OC plan requires a large number of the repetitive and complicated numerical calculation about the non-central chi-square distribution. On the other hand, an approximate design procedure for the VS-OC plan has been proposed before the proposal of the above rigorous design procedure. The approximate design procedure for the VS-OC plan has been constructed by combining Patnaik approximation relating the non-central chi-square distribution to the central chi-square distribution and Wilson-Hilferty approximation relating the central chi-square distribution to the standard normal distribution. Then, the approximate design procedure has been devised as a convenient procedure without complicated and repetitive numerical calculations. In this study, through some comparisons between the rigorous and approximate design procedures, the applicability of the approximate design procedure has been confirmed.

• Journal of the Korean Statistical Society
• /
• v.23 no.2
• /
• pp.421-444
• /
• 1994

Reliability acceptance sampling is concerned with whether to accept or reject a collection of items based upon the information obtained from life testing. Although various reliability acceptance sampling plans have been developed, little is known about their relatvie performances. This paper compares reliability acceptance sampling plans under Type II censoring, Hybrid censoring, and Time-Truncated Type II censoring assuming that the lifetimes of items in a lot follow an exponential distribution. The three plans are compared in terms of the power, the expected number of failures, and the expected time required to reach a decision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.