New Accelerated Life Test Plans for Weibull and Lognormal Lifetime Distributions

와이블과 대수정규 수명분포를 따를 때 새로운 가속수명시험 계획의 개발

  • Seo, Sun-Keun (Dept. of Industrial & Management Systems Engineering, Dong-A University)
  • 서순근 (동아대학교 산업경영공학과)
  • Received : 2014.06.11
  • Accepted : 2014.08.03
  • Published : 2014.09.25

Abstract

This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.

Keywords

References

  1. 서순근.정원기 (1997), 수명이 대수정규분포를 따를 때 연속 및 간헐적 검사하에서 가속수명 시험의 설계와 소표본 연구, 대한산업공학회지, 제23권, pp. 177-196.
  2. 서순근.조호성 (1996), 대수정규분포와 간헐적 검사하에서의 가속수명시험 방식의 설계, 품질경영학회지, 제24권, pp. 25-43.
  3. Kielpinski, T. and Nelson, W. (1975), Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distribution, IEEE Trans. on Reliability, R-24, pp. 310-320.
  4. Ma, H. and Meeker, W. Q. (2010), Strategy for Planning Accelerated Life Tests with Small Sample Sizes, IEEE Trans. on Reliability, R-59, pp. 610-619.
  5. Meeker, W. Q. (1984), A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring, Technometrics, Vol. 26, pp. 157-171. https://doi.org/10.1080/00401706.1984.10487941
  6. Meeker, W. Q. and Hahn, G. J. (1985), How to Plan an Accelerated Life Test-Some Practical Guidelines, ASQC Basic References in Quality Control : Statistical Techniques, Vol. 10.
  7. Meeker, W. Q. and Nelson, W. (1975), Optimum Accelerated Life Tests for the Weibull and Extreme Value Distribution, IEEE Trans. on Reliability, R-24, pp. 321-332. https://doi.org/10.1109/TR.1975.5214922
  8. Nelson, W. (1990), Accelerated Testing : Statistical Models, Test Plans, and Data Analysis, Wiley, New York.
  9. Nelson, W. and Kielpinski, T. J. (1976), Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distribution, Technometrics, Vol. 18, pp. 105-114. https://doi.org/10.2307/1267923
  10. Nelson, W. and Meeker, W. Q. (1978), Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions, Technometrics, Vol. 20, pp. 171-177. https://doi.org/10.1080/00401706.1978.10489643
  11. Seo, S. K. and Kim, K. S.(1996), Optimal Design of Accelerated Life Tests with Different Censoring Times, Journal of Korean Society for Quality Management, Vol. 24, pp. 44-58.
  12. Seo, S. K. and Yum, B. J. (1991), Accelerated Life Test Plans under Intermittent Inspection and Type I Censoring : The Case of Weibull Failure Distribution, Naval Research Logistics, Vol. 38, pp. 1-22. https://doi.org/10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3
  13. Yang, G. and Jin, L. (1994), Best Compromise Test Plans for Weibull Distributions with Different Censoring Times, Quality and Reliability Engineering International, Vol. 10, pp. 411-415. https://doi.org/10.1002/qre.4680100507