New Accelerated Life Test Plans for Weibull and Lognormal Lifetime Distributions

와이블과 대수정규 수명분포를 따를 때 새로운 가속수명시험 계획의 개발

  • Seo, Sun-Keun (Dept. of Industrial & Management Systems Engineering, Dong-A University)
  • 서순근 (동아대학교 산업경영공학과)
  • Received : 2014.06.11
  • Accepted : 2014.08.03
  • Published : 2014.09.25


This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.



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