• Journal of Korea Multimedia Society
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• v.18 no.12
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• pp.1519-1527
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• 2015

TFT-LCD automatic defect inspection system for detecting defects in place of the visual tester does pre-processing, candidate defect pixel detection, and recognition and classification through a blob analysis. An over-detection result of defects acts as an undue burden of blob analysis for recognition and classification. In this paper, we propose defect detection method based on the histogram distribution modeling of TFT-LCD image to minimize over-detection of candidate defective pixels. Primary defect candidate pixels are detected estimating the skewness of the luminance distribution histogram of the background pixels. Based on the detected defect pixels, the defective pixels other than noise pixels are detected using the distribution histogram model of the local area. Experimental results confirm that the proposed method shows an excellent defect detection result on the image containing the various types of defects and the reduction of the degree of over-detection as well.

• Journal of the Semiconductor & Display Technology
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• v.21 no.2
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• pp.68-73
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• 2022

In this study, we produced the surface defect detection model to automatically detect defect bone plates using a deep learning algorithm. Bone plates with a width and a length of 50 mm are most used for fracture treatment. Normal bone plates and defective bone plates were printed on the 3d printer. Normal bone plates and defective bone plates were photographed with 1,080 pixels using the webcam. The total quantity of collected images was 500. 300 images were used to learn the defect detection model. 200 images were used to test the defect detection model. The mAP(Mean Average Precision) method was used to evaluate the performance of the surface defect detection model. As the result of confirming the performance of the surface defect detection model, the detection accuracy was 96.3 %.

• Journal of IKEEE
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• v.27 no.3
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• pp.345-349
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• 2023

In this paper, we propose a study on the development of deep learning structure for defective pixel detection of next-generation smart LED display board using imaging device. In this research, a technique utilizing imaging devices and deep learning is introduced to automatically detect defects in outdoor LED billboards. Through this approach, the effective management of LED billboards and the resolution of various errors and issues are aimed. The research process consists of three stages. Firstly, the planarized image data of the billboard is processed through calibration to completely remove the background and undergo necessary preprocessing to generate a training dataset. Secondly, the generated dataset is employed to train an object recognition network. This network is composed of a Backbone and a Head. The Backbone employs CSP-Darknet to extract feature maps, while the Head utilizes extracted feature maps as the basis for object detection. Throughout this process, the network is adjusted to align the Confidence score and Intersection over Union (IoU) error, sustaining continuous learning. In the third stage, the created model is employed to automatically detect defective pixels on actual outdoor LED billboards. The proposed method, applied in this paper, yielded results from accredited measurement experiments that achieved 100% detection of defective pixels on real LED billboards. This confirms the improved efficiency in managing and maintaining LED billboards. Such research findings are anticipated to bring about a revolutionary advancement in the management of LED billboards.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.13 no.2
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• pp.95-101
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• 2020

In this paper, we consider a group testing (GT) framework which is to find a set of defective samples out of a large number of samples. To handle this framework, we propose a maximum product detection algorithm (MPDA) which is based on maximum a posteriori probability (MAP). The key idea of this algorithm exploits iterative detection to propagate belief to neighbor samples by exchanging marginal probabilities between samples and output results. The belief propagation algorithm as a conventional approach has been used to detect defective samples, but it has computational complexity to obtain the marginal probability in the output nodes which combine other marginal probabilities from the sample nodes. We show that the our proposed MPDA provides a benefit to reduce computational complexity up to 12% in runtime, while its performance is only slightly degraded compared to the belief propagation algorithm. And we verify the simulations to compare the difference of performance.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2009.05a
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• pp.321-325
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• 2009

The detection process of defective tags in most of Korean domestic RFID manufacturing companies is handled or treated by on-hand processing after the job of chip bonding, so it has been requesting to reduce the time and cost for manufacturing of RFID tags. Therefore, in this paper, we design and implement the system to perform the functionality of detection of defective tags after the process of chip bonding, and so provide the basis of a related software to establish the foundation of a automation system for the detection of defected RFID tags which is requested in the related Korean domestic industrial field. The developed system in this paper shows the enhancement of 700% in processing speed and 100% in detection rate of defective tags, comparing to the method of on-hand processing.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.23 no.10
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• pp.1195-1200
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• 2019

This paper proposes a detection algorithm for group testing. Group testing is a problem of finding a very small number of defect samples out of a large number of samples, which is similar to the problem of Compressed Sensing. In this paper, we define a noiseless group testing and propose a probabilistic algorithm for detection of defective samples. The proposed algorithm is constructed such that the extrinsic probabilities between the input and output signals exchange with each other so that the posterior probability of the output signal is maximized. Then, defective samples are found in the group testing problem through a simulation on the detection algorithm. The simulation results for this study are compared with the lower bound in the information theory to see how much difference in failure probability over the input and output signal sizes.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.9 no.4
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• pp.14-25
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• 2010

Small cracks or chips of a product appear very frequently in the course of continuous production of an automatic press process system. These phenomena became the cause of not only defective product but also damage of a press mold. In order to solve this problem AE(Acoustic emission) system was introduced. AE system was expected to be very effective to real time detection of the defective product and for the prevention of the damage in the press molds In this study, for the pick and analysis of AE signals generated from the press process, AE sensors/pre-amplifier/analysis and processing board were used as frequently found in the other similar cases. For the analysis and processing the AE signals picked in real time from the normal or the detective products, specialized software called AE-win(software for processing AE signal from Physical Acoustics Corporation) was used. As a result of this work it was conformed that intensity and shape of the various AE signals differ depending on the weight of the press and thickness of sheet and process type.

• 한국정보디스플레이학회:학술대회논문집
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• 2002.08a
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• pp.856-859
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• 2002

A system for high-resolution analysis of defective elementary cell (R, G or B) on Flat Panel Display (FPD) is described. Based on multiple acquisitions of low-resolution shifted images of the display, our system doesn't require a high-resolution sensor neither tedious alignment of the display, and will remain up to date even facing an important increase of the display dimensions. Our process, highly automated and thus flexible and robust, is expected to perform a full analysis in less than 60s. It is mainly intended for production tests and display classification by manufacturers.

• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.2059-2064
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• 2004

Texture analysis is an important role for automatic visual insfection. This paper presents an application of wavelet extension and Gray level co-occurrence matrix (GLCM) for detection of defect encountered in textured images. Texture characteristic in low quality images is not to easy task to perform caused by noise, low frequency and small dimension. In order to solve this problem, we have developed a procedure called wavelet image extension. Wavelet extension procedure is used to determine the frequency bands carrying the most information about the texture by decomposing images into multiple frequency bands and to form an image approximation with higher resolution. Thus, wavelet extension procedure offers the ability to robust feature extraction in images. Then the features are extracted from the co-occurrence matrices computed from the sub-bands which performed by partitioning the texture image into sub-window. In the detection part, Mahalanobis distance classifier is used to decide whether the test image is defective or non defective.

• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.34 no.6
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• pp.619-627
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• 2016

Cells of a PV (photovoltaic) module can suffer defects due to various causes resulting in a loss of power output. As a malfunctioning cell has a higher temperature than adjacent normal cells, it can be easily detected with a thermal infrared sensor. A conventional method of PV cell inspection is to use a hand-held infrared sensor for visual inspection. The main disadvantages of this method, when applied to a large-scale PV power plant, are that it is time-consuming and costly. This paper presents an algorithm for automatically detecting defective PV panels using images captured with a thermal imaging camera from an UAV (unmanned aerial vehicle). The proposed algorithm uses statistical analysis of thermal intensity (surface temperature) characteristics of each PV module to verify the mean intensity and standard deviation of each panel as parameters for fault diagnosis. One of the characteristics of thermal infrared imaging is that the larger the distance between sensor and target, the lower the measured temperature of the object. Consequently, a global detection rule using the mean intensity of all panels in the fault detection algorithm is not applicable. Therefore, a local detection rule was applied to automatically detect defective panels using the mean intensity and standard deviation range of each panel by array. The performance of the proposed algorithm was tested on three sample images; this verified a detection accuracy of defective panels of 97% or higher. In addition, as the proposed algorithm can adjust the range of threshold values for judging malfunction at the array level, the local detection rule is considered better suited for highly sensitive fault detection compared to a global detection rule. In this study, we used a panel area extraction method that we previously developed; fault detection accuracy would be improved if panel area extraction from images was more precise. Furthermore, the proposed algorithm contributes to the development of a maintenance and repair system for large-scale PV power plants, in combination with a geo-referencing algorithm for accurate determination of panel locations using sensor-based orientation parameters and photogrammetry from ground control points.