High Resolution Analysis for Defective Pixels Detection using a Low Resolution Camera

A system for high-resolution analysis of defective elementary cell (R, G or B) on Flat Panel Display (FPD) is described. Based on multiple acquisitions of low-resolution shifted images of the display, our system doesn't require a high-resolution sensor neither tedious alignment of the display, and will remain up to date even facing an important increase of the display dimensions. Our process, highly automated and thus flexible and robust, is expected to perform a full analysis in less than 60s. It is mainly intended for production tests and display classification by manufacturers.