• Journal of Korean Society of Industrial and Systems Engineering
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• v.46 no.2
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• pp.1-12
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• 2023

To make semiconductor chips, a number of complex semiconductor manufacturing processes are required. Semiconductor chips that have undergone complex processes are subjected to EDS(Electrical Die Sorting) tests to check product quality, and a wafer bin map reflecting the information about the normal and defective chips is created. Defective chips found in the wafer bin map form various patterns, which are called defective patterns, and the defective patterns are a very important clue in determining the cause of defects in the process and design of semiconductors. Therefore, it is desired to automatically and quickly detect defective patterns in the field, and various methods have been proposed to detect defective patterns. Existing methods have considered simple, complex, and new defect patterns, but they had the disadvantage of being unable to provide field engineers the evidence of classification results through deep learning. It is necessary to supplement this and provide detailed information on the size, location, and patterns of the defects. In this paper, we propose an anomaly detection framework that can be explained through FCDD(Fully Convolutional Data Description) trained only with normal data to provide field engineers with details such as detection results of abnormal defect patterns, defect size, and location of defect patterns on wafer bin map. The results are analyzed using open dataset, providing prominent results of the proposed anomaly detection framework.

• Journal of information and communication convergence engineering
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• v.9 no.1
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• pp.21-26
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• 2011

In this paper, we suggest the object-oriented methodology for the design and implementation scheme for the program development in the application of control and instrumentation such as the detection system of RFID defective tags which needs the embedded programming. We apply the design methodology of UML in the system design phase, and suggest the implementation scheme of LabVIEW programs using LVOOP(LabVIEW Object Oriented Programming)in which make it possible to write the object-oriented programming. We design the class diagram and the sequence diagram using UML, and write the classes of LVOOP from the designed class diagram and the main VI from the sequence diagram, respectively. We show that it is possible to develop the embedded programs such as the RFID application through the implementation example of the detection system of RFID defective tags in this paper. And, we obtain the advantages based on the object-oriented design and implementation using the LVOOP approach such as the development of LabVIEW programs by adding the classes and the concept of object of the object-oriented language to LabVIEW.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.4
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• pp.55-62
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• 2007

This paper proposes a defective pixel detection algorithm and its hardware structure for CCD/CMOS image sensor. In previous algorithms, the characteristics of image have not been considered. Also, some algorithms need quite a time to detect defective pixels. In order to make up for those disadvantages, the proposed defective pixel detection method detects defective pixels efficiently by considering the edges in the image and verifies them using several frames while checking scene-changes. Whenever scene-change is occurred, potentially defective pixels are checked and confirmed whether it is defective or not. Test results showed that the correct detection rate in a frame was increased 6% and the defective pixel verification time was decreased 60%. The proposed algorithm was implemented with verilog HDL. The edge indicator in color interpolation block was reused. Total logic gate count was 5.4k using 0.25um CMOS standard cell library.

• Journal of the Korea Society of Computer and Information
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• v.16 no.2
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• pp.47-53
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• 2011

The detection process of defective tags in most of Korean domestic RFID manufacturing companies is treated by on-hand processing after the job of chip bonding, so it has been requested to reduce the time and cost for manufacturing of RFID tags. Therefore, in this paper, we implement the system to perform the detection of defective tags after the process of chip bonding, and so provide the basis of software to establish the foundation of automation system for the detection of defected RFID tags which is requested in the related Korean domestic industrial field. We have developed the system by using UML in modeling phase and JAVA in implementation phase to reduce the cost of development of program and make it easy to maintain. The developed system in this paper shows the very enhanced performance in processing speed and perfect detection rate of defective tags, comparing to the method of on-hand processing.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.9 no.3
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• pp.76-82
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• 2010

A laborer always watched a process of production carefully but defective manufactures were inspected after press process. These inspections made a waste of human power and defective manufactures could make a serious damage of press mold. Therefore, AE(Acoustic Emission) system was introduced to prevention of the damage of the press molds, to a real time detection of defective manufactures and to save human power. AE system was introduced to solve this problem which is a detecting defective manufacture on real time and to prevent the damage of the press mold. In this research we get acoustic emission signal in accordance with weight and processing method of press by using AE sensor, Preamplifier, AE board signal board which occurs press processing and it analyzed various signal through using CMD8 software on the time. From the result, we found that the intensity and shape of the signal were changed according to the weight and processing type of the press. By using this special algorithm, it can judge the acoustic signal which occurs from press on real time.

• Journal of information and communication convergence engineering
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• v.21 no.1
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• pp.24-31
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• 2023

The solid-state drive (SSD) possesses higher input and output speeds, more resistance to physical shock, and lower latency compared with regular hard disks; hence, it is an increasingly popular storage device. However, tiny components on an internal printed circuit board (PCB) hinder the manual detection of malfunctioning components. With the rapid development of artificial intelligence technologies, automatic detection of components through convolutional neural networks (CNN) can provide a sound solution for this area. This study proposes applying the YOLOv5 model to SSD PCB component detection, which is the first step in detecting defective components. It achieves pioneering state-of-the-art results on the SSD PCB dataset. Contrast experiments are conducted with YOLOX, a neck-and-neck model with YOLOv5; evidently, YOLOv5 obtains an mAP@0.5 of 99.0%, essentially outperforming YOLOX. These experiments prove that the YOLOv5 model is effective for tiny object detection and can be used to study the second step of detecting defective components in the future.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.18 no.12
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• pp.38-44
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• 2019

Various automation studies have been conducted to detect defective products based on product images. In the case of machine vision-based studies, size and color error are detected through a preprocessing process. A situation may arise in which the main features are removed during the preprocessing process, thereby decreasing the accuracy. In addition, complex systems are required to detect various kinds of defects. In this study, we designed and developed a system to detect errors by analyzing various conditions of defective products. We designed the deep learning algorithm to detect the defective features from the product images during the automation process using a convolution neural network (CNN) and verified the performance by applying the algorithm to the checker-switch failure detection system. It was confirmed that all seven error characteristics were detected accurately, and it is expected that it will show excellent performance when applied to automation systems for error detection.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2006.11a
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• pp.392-395
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• 2006

In this paper, Maharanobis distance was used to distinguish defective motors from good motors. Maharanobis distance was calculated from the noise data of good motors and the test motor that were measured in 1/3 octave hand from 25 Hz to 20 kHz frequency range. The suggested method was applied to the detection of defective air-conditioner motors.

• Proceedings of the KSRS Conference
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• 2005.10a
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• pp.130-133
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• 2005

This paper presents the efficient method to detect the defective detectors of the SWIR band of SPOT 4. The key of this method are to flatten the baseline of the data using high pass band filter instead of differentiation. This method is made up six steps. First step is to apply image enhancement techniques to enhance the lines imaged by defective detector and improve the quality of an image. Second step is processed by summing the enhanced image in line direction. These summed data have the peaks that represent the defective detectors and the curved baseline characterized by the reflectivity of Earth surface. In order to exactly detect these peaks, third step is to flatten the curved baseline using high pass filtering in the frequency domain. In fourth step, the data with flat baseline is normalized to have zero mean and unity standard deviation. In fifth step, the defective detectors are detected using $99.9\%$ confidence interval. Finally, after removing the detected ones in summed data, the steps from third to five are iterated. Three SPOT 4 images, which have different reflectivity of Earth surface and different sensor, were used to validate this method. The overall accuracy of detection for three images was $97.9\%$. This result shows that this method can detect efficiently the lines made by defective detectors.

• Smart Media Journal
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• v.11 no.4
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• pp.46-55
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• 2022

It is very important to first detect and remove defective fruits with scratches or bruised areas in the automatic fruit quality screening system. This paper proposes a method of detecting defective areas in fruits using the latest artificial intelligence technology, the Yolo V4 deep learning model in order to overcome the limitations of the method of detecting fruit's defective areas using the existing image processing techniques. In this study, a total of 2,400 defective fruits, including 1,000 defective apples and 1,400 defective fruits with scratch or decayed areas, were learned using the Yolo V4 deep learning model and experiments were conducted to detect defective areas. As a result of the performance test, the precision of apples is 0.80, recall is 0.76, IoU is 69.92% and mAP is 65.27%. The precision of pears is 0.86, recall is 0.81, IoU is 70.54% and mAP is 68.75%. The method proposed in this study can dramatically improve the performance of the existing automatic fruit quality screening system by accurately selecting fruits with defective areas in real time rather than using the existing image processing techniques.