• 한국정보통신학회논문지
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• 제13권9호
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• pp.1837-1844
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• 2009

본 논문에서는 전류모드 CMOS에 의한 2변수 3치 가산기 회로와 승산기 회로를 구현하였다. 제시된 전류모드 CMOS에 의한 3치 가산기 회로와 승산기 회로는 전압 레벨로 동작하며, HSpice 시뮬레이션을 통하여 이 회로들에 대하여 동작 특성을 보였다. 제시 된 회로들은 $0.180{\mu}m$ CMOS 표준 기술을 사용하여 HSpice로 시뮬레이션 하였다. 2 변수 3치 가산기 및 승산기 회로의 단위 전류 $I_u$는 $5{\mu}A$로 하였으며, NMOS의 길이와 폭 W/L는 $0.54{\mu}m/0.18{\mu}m$이고, PMOS의 길이와 폭 W/L는 $1.08{\mu}m/0.18{\mu}m$이다. VDD 전압은 2.5V를 사용하였으며 MOS 모델은 LEVEL 47으로 시뮬레이션 하였다. 전류모드 CMOS 3치 가산기 및 승산기 회로의 시뮬레이션 결과에서 전달 지연 시간이 $1.2{\mu}s$이며, 3치 가산기 및 승산기 회로가 안정하게 동작하여 출력 신호를 얻는 동작 속도가 300MHz, 소비 전력이 1.08mW임을 보였다.

• Journal of Power Electronics
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• 제18권2호
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• pp.640-650
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• 2018

A TRIAC dimmable LED driver with a wide tuning range and a two-stage uniform dimming scheme is proposed in this paper. To solve the restricted dimming range problem caused by the limited conduction ratio of TRIAC dimmers, a conduction ratio compensation technique is introduced, which can increase the output current up to the rated output current when the TRIAC dimmer turns to the maximum conduction ratio. For further optimization, a two-stage uniform dimming diagram with a rapid dimming curve and a slow dimming curve is designed to make the LED driver regulated visually uniform in the whole adjustable range of the TRIAC dimmer. The proposed control chip is fabricated in a TSMC $0.35{\mu}m$ 5V/650V CMOS/LDMOS process, and verified on a 21V/500mA circuit prototype. The test results show that, in the 90V/60Hz~132V/60Hz ac input range, the voltage linear regulation is 2.6%, the power factor is 99.5% and the efficiency is 83%. Moreover, in the dimming mode, the dimming rate is less than 1% when the maximum dimming current is 516mA and the minimum dimming current is only about 5mA.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -2
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• pp.755-758
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• 2002

This paper presents a second-generation CMOS current conveyor (CCII) consisting of a rail-to-rail complementary N- and P-channel differential input stage for the voltage input, a class AB push-pull stage for the current input, and current mirrors far the current outputs. The CCII was implemented using a double-poly triple-metal 0.6 ${\mu}$m n-well CMOS process, to confirm its operation experimentally. A prototype chip achieves a rail-to-rail swing ${\pm}$2.4 V under ${\pm}$2.5 V power supplies and shows the exact voltage and current following performances up to 100 MHz. Because of its high performances, the CCII proposed herein is quite useful for a building block of current-mode circuits. The applications of the proposed CCII to current-mode filters are also described.

• 대한전자공학회논문지SD
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• 제44권9호
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• pp.54-58
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• 2007

LTPS TFT의 개발과 성능 향상은 패널에 다양한 디지털 회로를 내장하는 SOP의 비약적 발전에 기여하였다. 본 논문에서는 일반적으로 적용되는 낮은 성능의 CMOS 논리게이트를 대체할 수 있는 전류모드 논리(CML) 게이트의 설계 방법을 소개한다. CML 인버터는 낮은 로직스윙, 빠른 응답 특성을 갖도록 설계할 수 있음을 보였으며 높은 소비전력의 단점도 동작 속도가 높아질수록 CMOS의 경우와 근사해졌다. 아울러 전류 구동능력을 키울 필요가 없는 까닭에 많은 수의 소자가 사용되지만 면적은 오히려 감소하는 것을 확인하였다. 특히 비반전 및 반전 출력이 동시에 생성되므로 noise immunity가 우수하다. 다수 입력을 갖는 NAND/AND 및 NOR/OR 게이트는 같은 회로에 입력신호를 바꾸어 구현할 수 있고 MUX와 XNOR/XOR 게이트도 같은 회로를 사용하여 구현할 수 있음을 보였다. 결론적으로 CML 게이트는 다양한 함수를 단순한 몇가지의 회로로 구성할 수 있으며 낮은 소비전력, 적은 면적, 개선된 동작속도 등을 동시에 추구할 수 있는 대안임을 확인하였다.

• ETRI Journal
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• 제37권6호
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• pp.1154-1164
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• 2015

This paper proposes a fully sensorless driver for a permanent magnet synchronous motor (PMSM) integrated with a digital motor controller and an analog pre-driver, including sensing circuits and estimators. In the motor controller, a position estimator estimates the back electromotive force and rotor position using a sliding-mode observer. In the pre-driver, drivers for the power devices are designed with a level shifter and isolation technique. In addition, a current sensing circuit measures a three-phase current. All of these circuits are integrated in a single chip such that the driver achieves control of the speed with high accuracy. Using an IC fabricated using a $0.18{\mu}m$ BCDMOS process, the performance was verified experimentally. The driver showed stable operation in spite of the variation in speed and load, a similar efficiency near 1% compared to a commercial driver, a low speed error of about 0.1%, and therefore good performance for the PMSM drive.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2003년도 ICCAS
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• pp.921-926
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• 2003

This paper describes a new type of the spatial filter detector (SFD) with variable and multi-valued weighting function. This SFD called variable spatial filter detector with multi-valued weighting function (VSFDwMWF) uses current-mode circuits for noise resistance and high-resolution weighting values. Total weighting values consist of 7bit, 6-signal bit and 1-sign bit. We fabricate VSFDwMWF chip using Rohm 0.35${\mu}$m CMOS process. VSFDwMWF chip includes two-dimensional 10${\times}$13 photodiode array and current-mode weighting control circuit. Simulation shows the weighting values are varied and multi-valued by external switching operation. The layout of VSFDwMWF chip is shown.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2004년도 하계학술대회 논문집 B
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• pp.1214-1216
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• 2004

Conventional Switched Mode Power Supplies(SMPS) with diode-capacitor rectifier have distorted input current waveform with high harmonic contents. Typically, these SMPS have a power factor lower than 0,65. To improve with this problem the power factor correction(PFC) circuit of power supplies has to be introduced. PFC circuit have tendency to be applied in new power supply designs. The input active power factor correction circuits can be implemented using either the two-stage or the single-stage approach. In this paper, the comparative analysis of power factor correction circuit using feedforward control with average current mode single-stage flyback method converter and two-stage converter which is combination of boost and flyback converter. The two prototypes of 50W were designed and tested a laboratory experimental. Also, the comparative analysis is confirmed by simulation and experimental results.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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• pp.1254-1257
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• 2004

This paper presents a built-in current sensor(BICS) that can detect defects in CMOS integrated circuits through current testing technique - Iddq test. Current test has recently been known to a complementary testing method because traditional voltage test cannot cover all kinds of bridging defects. So BICS is widely used for current testing. but there are some critical issues - a performance degradation, low speed test, area overhead, etc. The proposed BICS has a two operating mode- normal mode and test mode. Those methods minimize the performance degradation in normal mode. We also used a current-mode differential amplifier that has a input as a current, so we can realize higher speed current testing. Furthermore, only using 10 MOSFETS and 3 inverters, area overhead can be reduced by 6.9%. The circuit is verified by HSPICE simulation with 0.25 urn CMOS process parameter.

• 전자공학회논문지SC
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• 제44권1호
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• pp.85-93
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• 2007

본 논문에서는 다수의 병렬 입.출력 환경을 위한 높은 노이즈 마진을 갖고 있는 LVDS I/O 회로를 소개한다. 제안된 LVDS I/O회로는 송신단과 수신단으로 구성되어 있으며 송신단 회로는 차동위상 분할기와 공통모드 피드백(common mode feedback)을 가지고 있는 출력단으로 이루어져 있다. 차동위상 분할기는 SSO(simultaneous switching output) 노이즈에 의해 공급전압이 변하더라도 안정된 듀티 싸이클(duty cycle)과 $180^{\circ}$의 위상차를 가진 두 개의 신호를 생성한다. 공통모드 피로백을 가지고 있는 출력단 회로는 공급전압의 변화에 상관없이 일정한 출력전류를 생성하고 공통모드 전압(common mode voltage)을 ${\pm}$0.1V 이내로 유지한다. LVDS 수신단 회로는 VCDA(very wide common mode input range differential amplifier)구조를 사용하여 넓은 공통 입력전압 범위를 확보하고 SSO 노이즈에 의한 공급 전압의 변화에도 안정된 듀티 싸이클(50% ${\pm}$ 3%)을 유지하여 정확한 데이터 복원이 가능하다. 본 논문에서 제안한 LVDS I/O 회로는 0.18um TSMC 라이브러리를 기본으로 하여 설계 되었으며 H-SPICE를 이용하여 시뮬레이션 하였다.

• 한국전기전자재료학회논문지
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• 제18권5호
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• pp.431-438
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• 2005

In this paper, we propose the built-in current testing circuit for improving reliability As the integrated CMOS circuits in a chip are increased, the testability on design and fabrication should be considered to reduce the cost of testing and to guarantee the reliability In addition, the high degree of integration makes more failures which are different from conventional static failures and introduced by the short between transistor nodes and the bridging fault. The proposed built-in current testing method is useful for detecting not only these failures but also low current level failures and faster than conventional method. In normal mode, the detecting circuit is turned off to eliminate the degradation of CUT(Circuits Under Testing). The differential input stage in detecting circuit prevents the degradation of CUT in test mode. It is expected that this circuit improves the quality of semiconductor products, the reliability and the testability.