• Journal of the Society of Naval Architects of Korea
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• v.52 no.1
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• pp.88-95
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• 2015

For the frequency-domain spectral fatigue analysis, the probability density function of stress range needs to be estimated based on the stress spectrum only, which is a frequency domain representation of the response. The probability distribution of the stress range of the narrow-band spectrum is known to follow the Rayleigh distribution, however the PDF of wide-band spectrum is difficult to define with clarity due to the complicated fluctuation pattern of spectrum. In this paper, efforts have been made to figure out the links between the probability density function of stress range to the structural response of wide-band Gaussian random process. An artificial neural network scheme, known as one of the most powerful system identification methods, was used to identify the multivariate functional relationship between the idealized wide-band spectrums and resulting probability density functions. To achieve this, the spectrums were idealized as a superposition of two triangles with arbitrary location, height and width, targeting to comprise wide-band spectrum, and the probability density functions were represented by the linear combination of equally spaced Gaussian basis functions. To train the network under supervision, varieties of different wide-band spectrums were assumed and the converged probability density function of the stress range was derived using the rainflow counting method and all these data sets were fed into the three layer perceptron model. This nonlinear least square problem was solved using Levenberg-Marquardt algorithm with regularization term included. It was proven that the network trained using the given data set could reproduce the probability density function of arbitrary wide-band spectrum of two triangles with great success.

• The Korean Journal of Nuclear Medicine
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• v.28 no.3
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• pp.364-370
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• 1994

The purpose of this study is to evaluate the clinical application of the no carrier added $[^{51}Cr]Cr(III)$-EDTA complexes, produced at Korea Cancer Center Hospital. The $[^{51}Cr]Cr(III)$-EDTA complexes, usefut for measurement of GFR were prepared at room temperature in the presence of bicarbonate catalysts. The radiochemical purity of $[^{51}Cr]Cr(III)$-EDTA was over 99% by paper electrophoresis. The time activity curves were obtained by counting the blood samples from 5 volunteers and counting the head and neck regions with whole body counter after injection of the $^{51}Cr$-EDTA, respectively. After the nonlinear regression, the area under curve was obtained. The plasma clearance of the $^{51}Cr$-EDTA was calculated with injected dose/AUC. The clearance rate calculated with the head and neck counting data was in good agreement with the result from the plasma sample radioactivity at 1-3 hrs after injection. From this result, the counting of head and neck region and the nonlinear regression by 2-compartment model could be applied for the measurement of the clearance rate. Using MIRD system, the absorbed radiation dose was calculated by residence $time{\times}S$. The absorbed whole body radiation dose was negligibly small.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.26 no.8
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• pp.1487-1494
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• 2002

In this study, to propose the prediction method of the crack growth under flight-simulation loading, crack growth tests are conducted on 2124-7851 aluminum alloy specimens. The prediction of crack growth under flight-simulation loading is performed by the stochastic crack growth model which was developed in previous study. First of all, to reduce the complex load history into a number of constant amplitude events, rainflow counting is applied to the flight-simulation loading wave. The crack growth, then, is predicted by the stochastic crack growth model that can describe the load interaction effect as well as the variability in crack growth process. The material constants required in this model are obtained from crack growth tests under constant amplitude loading and single tensile overload. The curves predicted by the proposed model well describe the crack growth behavior under flight-simulation loading and agree with experimental data. In addition, this model well predicts the variability of fatigue lives.

• Journal of the Ergonomics Society of Korea
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• v.26 no.2
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• pp.15-20
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• 2007

The purpose of this study is to compare assessment techniques for Korean characters entry methods of mobile phones. This study was performed based on survey of relevant existing studies. The assessment techniques were classified into three: 1) predicting entry time using conceptual models such as Fitts' law, Hick-Hyman's law and KLM-GOMS model (conceptual model); 2) counting the number of pressing button(number of pressing button); and 3) measuring performance or rating subjective measures using real mobile phones(real mobile phone). The comparison revealed that the assessment results were different depending upon the techniques used. The results from the conceptual model using only Fitts' law and the number of pressing button were opposite to those from techniques of the real mobile phone and conceptual model using Fitts' and Hick-Hyman's laws. Based on this result and suggestions provided by the literature, it is recommended that for more precisely assessing interfaces of mobile phones such as Korean characters entry method, real mobile phones be used instead of the conceptual models.

• International Journal of Reliability and Applications
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• v.4 no.1
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• pp.1-12
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• 2003

Many software reliability growth models (SRGM's) based on a nonhomogeneous Poisson process (NHPP) have been proposed by many researchers. Most of the SRGM's which have been proposed up to the present treat the event of software fault-detection in the testing and operational phases as a counting process. However, if the size of the software system is large, the number of software faults detected during the testing phase becomes large, and the change of the number of faults which are detected and removed through debugging activities becomes sufficiently small compared with the initial fault content at the beginning of the testing phase. Therefore, in such a situation, we can model the software fault-detection process as a stochastic process with a continuous state space. In this paper, we propose a new software reliability growth model describing the fault-detection process by applying a mathematical technique of stochastic differential equations of an Ito type. We also compare our model with the existing SRGM's in terms of goodness-of-fit for actual data sets.

• Bulletin of the Korean Mathematical Society
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• v.50 no.2
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• pp.611-626
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• 2013

In the paper we study the finite-time ruin probability in a general risk model with constant interest force, in which the claim sizes are pairwise quasi-asymptotically independent and arrive according to an arbitrary counting process, and the premium process is a general stochastic process. For the case that the claim-size distribution belongs to the consistent variation class, we obtain an asymptotic formula for the finite-time ruin probability, which holds uniformly for all time horizons varying in a relevant infinite interval. The obtained result also includes an asymptotic formula for the infinite-time ruin probability.

• IEIE Transactions on Smart Processing and Computing
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• v.5 no.5
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• pp.358-365
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• 2016

We propose a novel application of random forest, a machine learning-based general classification algorithm, to analyze the influence of design attributes on the silicon-to-SPICE (S2S) gap. To improve modeling accuracy, we introduce magnification of learning data as well as randomization for the counting of design attributes to be used for each tree in the forest. From the automatically generated decision trees, we can extract the so-called importance and impact indices, which identify the most significant design attributes determining the S2S gap. We apply the proposed method to actual silicon data, and observe that the identified design attributes show a clear trend in the S2S gap. We finally unveil 10nm key fin-shaped field effect transistor (FinFET) structures that result in a large S2S gap using the measurement data from 10nm test vehicles specialized for model-hardware correlation.

• Tribology and Lubricants
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• v.21 no.3
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• pp.136-141
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• 2005

Analytical model to calculate the contact fatigue life of rough surface is presented in this paper. The effect of surface roughness can be calculated by this model. Computational method and the theoretical basis are also discussed. Contact stresses are obtained by contact analysis of a semi-infinite solid based on the use of influence functions; the subsurface stress field is obtained using rectangular patch solutions. Mesoscopic multiaxial fatigue criterion which can yield satisfactory results for non-proportional loading is then applied to predict fatigue damage. Suitable counting method and damage rule were used to calculate the fatigue life of random loading caused by rough surface. As a result of analysis the relationship between the life and the roughness as well as the most probable depth of the crack initiation is calculated.

• Journal of the Korean Society for Precision Engineering
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• v.20 no.3
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• pp.194-201
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• 2003

This study presents the comparative filtration performance evaluation of automotive fuel filters based on the theory of Beta ratio. For the experiments, the fuel component's test stand incorporating the multi-pass filtration test circuit was developed. A mathematical description of filtration process in general was derived. And the theoretical basis of multi-pass test and the test procedure were described in detail. Experimental results revealed that domestic fuel filter tested could not maintain consistent Beta ratio, that is filtration efficiency, although it had the holding capacity of contaminants close to the specification at maximum pressure drop across the filter assembly. The results of experiments and simulations also showed that filtration system model could be refined including desorption ratio to estimate the variable Beta ratio in service life.

• The Transactions of the Korean Institute of Power Electronics
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• v.24 no.1
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• pp.16-24
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• 2019

The performance of the battery management system (BMS) algorithm is important for ensuring the stability and efficient operation of battery packs. Such a performance is determined by the internal parameters of the electrical equivalent circuit model (EECM). This study proposes a performance improvement and verification of battery parameters for the BMS algorithm using electrical experiments and tools. The parameters were extracted through electrical characteristic experiments, and an EECM based on Ah counting was designed. Simulation results using the EECM were compared with actual experimental data to determine the best parameter extraction method.