• The Journal of Korean Institute of Communications and Information Sciences
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• v.31 no.9A
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• pp.868-877
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• 2006

Sensor network applications need synchronized time to the highest degree such as object tracking, consistent state updates, duplicate detection, and temporal order delivery. In addition, reliability issues and fault tolerance in sophisticated sensor networks have become a critical area of research today. In this paper, we proposed a fault tolerant clock management scheme in sensor networks considering two cases of fault model such as network faults and clock faults. The proposed scheme restricts the propagation of synchronization error when there are clock faults of nodes such as rapid fluctuation, severe changes in drift rate, and so on. In addition, it handles topology changes. Simulation results show that the proposed method has about $1.5{\sim}2.0$ times better performance than TPSN in the presence of faults.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.6
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• pp.199-208
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• 1994

This paper proposes a delay fault test technique for ICs and PCBs with the boundary-scan architectures supporting ANSI/IEEE Std 1149.1-1990. The hybrid delay fault model, which comprises both of gate delay faults and path delay faults, is selected. We developed a procedure for testing delay faults in the circuits with typical boundary scan cells supporting the standard. Analyzing it,we concluded that it is impractical because the test clock must be 2.5 times faster than the system clock with the cell architect-ures following up the state transition of the TAP controller and test instruction set. We modified the boundary-scan cell and developed test instructions and the test procedure. The modified cell and the procedure need test clock two times slower than the system clock and support the ANSI/IEEE standard perfectly. A 4-bit ALU is selected for the circuits under test. and delay tests are simulated by the SILOS simulator. The simulation results ascertain the accurate operation and effectiveeness of the modified mechanism.

• Journal of Electrical Engineering and information Science
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• v.2 no.3
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• pp.14-21
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• 1997

In delay-optimized designs, timing failures due to manufacturing delay defects are more likely to occur because the average timing slacks of paths decrease and the system becomes more sensitive to smaller delay defect sizes. In this paper, the impact of delay optimized logic circuits on delay fault testing will be discussed and compared to the case for non-optimized designs. First, we provide a timing optimization procedure and show that the resultant density function of path delays is a delta function. Next we also discuss the impact of timing optimization on the yield of a manufacturing process and the defect level for delay faults. Finally, we will give some recommendations on the determination of the system clock time so that the delay-optimized design will have the same manufacturing yield as the non-optimized design and on the determination of delay fault coverage in the delay-optimized design in order to have the same defect-level for delay faults as the non-optimized design, while the system clock time is the same for both designs.

• The Transactions of the Korea Information Processing Society
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• v.6 no.11
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• pp.3124-3130
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• 1999

A duplex system enhances reliability by tolerating faults through spatial redundancy. Faults can be detected by duplicating identical tasks in pairs of modules. However, this kind of systems cannot even detect the fault if it occurs coincidently due to either malfunctions of common component such as power supply and clock or due to such environmental disruption as EMI. In the paper, we propose a method to reduce those effects of coincident faults in the duplex controller computer. Specifically, a duplex system tolerates coincident faults by using a sophistication sequencing of scheduling technique with certain timing redundancy. In particular when all tasks should be completed in the sense of real-time, the suggested scheduling method works properly to minimize the probability of faulty tasks due to coincident fault without missing the timing constraints.

• ETRI Journal
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• v.30 no.3
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• pp.403-411
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• 2008

This paper introduces an interconnect delay fault test (IDFT) controller on boards and system-on-chips (SoCs) with IEEE 1149.1 and IEEE 1500 wrappers. By capturing the transition signals launched during one system clock, interconnect delay faults operated by different system clocks can be simultaneously tested with our technique. The proposed IDFT technique does not require any modification on boundary scan cells. Instead, a small number of logic gates needs to be plugged around the test access port controller. The IDFT controller is compatible with the IEEE 1149.1 and IEEE 1500 standards. The superiority of our approach is verified by implementation of the controller with benchmark SoCs with IEEE 1500 wrapped cores.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.32B no.11
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• pp.1434-1444
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• 1995

Current test has recently been known to be a promising testing method in CMOS VLSI because conventional voltage test can not make sure of the complete detection of bridging, gate-oxide shorts, stuck-open faults and etc. This paper presents a new BIC(built-in current sensor) for the internal current test in CMOS logic circuit. A single phase clock is used in the BIC to reduce the control circuitry of it and to perform a self- testing for a faulty current. The BIC is designed to detect the faulty current at the end of the clock period, so that it can test the CUT(circuit under test) with much longer critical propagation delay time and larger area than conventional BICs. The circuit is composed of 18 devices and verified by using the SPICE simulator.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.2
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• pp.168-176
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• 2015

Due to the reduction in device feature size, transient faults (soft errors) in logic circuits induced by radiations increase dramatically. Many researches have been done in modeling and analyzing the susceptibility of sequential circuit elements caused by soft errors. However, to the best knowledge of the authors, there is no work which has well considerated the feedback characteristics and the multiple clock cycles of sequential circuits. In this paper, we present a new method for evaluating the susceptibility of sequential circuit elements to soft errors. The proposed method uses four Error Propagation Probability Matrixs (EPPMs) to represent the error propagation probability of logic gates and flip-flops in current clock cycle. Based on the predefined matrix union operations, the susceptibility of circuit elements in multiple clock cycles can be evaluated. Experimental results on ISCAS'89 benchmark circuits show that our method is more accurate and efficient than previous methods.

• Journal of KIISE:Computer Systems and Theory
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• v.26 no.10
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• pp.1264-1274
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• 1999

본 논문에서는 분산된 클록들을 주기적으로 동기화 시키는 분산 실시간 시스템에서 시간적 제약을 만족시키기 위한 정적/동적 시간 제약(timing constraint) 변환 기법을 제안한다. 전형적인 이산클록동기화(discrete clock synchronization) 알고리즘은 클록의 값을 순간적으로 조정하여 클록의 시간이 불연속적으로 진행한다. 이러한 시간상의 불연속성은 시간적 이벤트를 잃어버리거나 다시 발생시키는 오류를 범하게 한다.클록 시간의 불연속성을 피하기 위해 일반적으로 연속클록동기화(continuous clock synchronization) 기법이 제안되고 있지만 소프트웨어적으로 구현되면 많은 오버헤드를 유발시키는 문제점이 있다. 본 논문에서는 시간적 제약을 동적으로 변환시키는 DCT (Dynamic Constraint Transformation) 기법을 제안하였으며, 이를 통해 기존의 이산클록동기화 알고리즘을 수정하지 않고서도 클록 시간의 불연속성에 의한 문제점들을 해결할 수 있도록 하였다. 아울러 DCT에 의해 이산클록동기화 하에서 생성된 태스크 스케쥴이 연속클록동기화에 의해 생성된 스케쥴과 동일함을 증명하여 DCT의 동작이 이론적으로 정확함을 증명하였다.또한 분산 실시간 시스템에서 지역 클록(local clock)이 기준 클록과 완벽하게 일치하지 않아서 발생하는 스케쥴링상의 문제점을 다루었다. 이를 위해 먼저 두 가지의 스케쥴링 가능성, 지역적 스케쥴링 가능성(local schedulability)과 전역적 스케쥴링 가능성(global schedulability)을 정의하고, 이를 위해 시간적 제약을 정적으로 변환시키는 SCT (Static Constraint Transformation) 기법을 제안하였다. SCT를 통해 지역적으로 스케쥴링 가능한 태스크는 전역적으로 스케쥴링이 가능하므로, 단지 지역적 스케쥴링 가능성만을 검사하면 스케쥴링 문제를 해결할 수 있도록 하였고 이를 수학적으로 증명하였다.Abstract In this paper, we present static and dynamic constraint transformation techniques for ensuring timing requirements in a distributed real-time system possessing periodically synchronized distributed local clocks. Traditional discrete clock synchronization algorithms that adjust local clocks instantaneously yield time discontinuities. Such time discontinuities lead to the loss or the gain of events, thus raising serious run-time faults.While continuous clock synchronization is generally suggested to avoid the time discontinuity problem, it incurs too much run-time overhead to be implemented in software. We propose a dynamic constraint transformation (DCT) technique which can solve the problem without modifying discrete clock synchronization algorithms. We formally prove the correctness of the DCT by showing that the DCT with discrete clock synchronization generates the same task schedule as the continuous clock synchronization.We also investigate schedulability problems that arise when imperfect local clocks are used in distributed real-time systems. We first define two notions of schedulability, global schedulability and local schedulability, and then present a static constraint transformation (SCT) technique. The SCT ensures that it is sufficient to check the schedulability of a task locally in a node with a local clock, since the global schedulability of the task is derived from its local schedulability through SCT. We formally prove the correctness of SCT.

• Proceedings of the Korea Society for Industrial Systems Conference
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• 2001.05a
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• pp.209-216
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• 2001

A key advantage of boundary scan technology is the ability to observe data at device inputs and control data at device outputs, independent of on-chip system logic. But, this method has a disadvantage for detecting of faults that changes their states very fast. We present a method to solve this problem and make it possible to detect the signals. We shown the simulation results of testing a circuit that has fast signal above the clock speed.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.14 no.4
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• pp.219-225
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• 2014

The New efficient Mux-based scan latch cell design and scan test of LOS/LOC modes are proposed for detection of delay faults in digital logic circuits. The proposed scan cell design can support LOS(Launch-off-Shift) and LOC(Launch-off-Capture) tests with high fault coverage and low scan power and it can alleviate the problem of the slow selector enable signal and hold signal by supporting the logic capable of switching at the operational clock speeds. Also, it efficiently controls the power dissipation of the scan cell design during scan testing. Functional operation and timing simulation waveform for proposed scan hold cell design shows improvement in at-speed test timing in both test modes.