• Title/Summary/Keyword: Circuits

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High Noise Margin LVDS I/O Circuits for Highly Parallel I/O Environments (다수의 병렬 입.출력 환경을 위한 높은 노이즈 마진을 갖는 LVDS I/O 회로)

  • Kim, Dong-Gu;Kim, Sam-Dong;Hwang, In-Seok
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.44 no.1
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    • pp.85-93
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    • 2007
  • This paper presents new LVDS I/O circuits with a high noise margin for use in highly parallel I/O environments. The proposed LVDS I/O includes transmitter and receiver parts. The transmitter circuits consist of a differential phase splitter and a output stage with common mode feedback(CMFB). The differential phase splitter generates a pair of differential signals which have a balanced duty cycle and $180^{\circ}$ phase difference over a wide supply voltage variation due to SSO(simultaneous switching output) noises. The CMFB output stage produces the required constant output current and maintains the required VCM(common mode voltage) within ${\pm}$0.1V tolerance without external circuits in a SSO environment. The proposed receiver circuits in this paper utilizes a three-stage structure(single-ended differential amp., common source amp., output stage) to accurately receive high-speed signals. The receiver part employs a very wide common mode input range differential amplifier(VCDA). As a result, the receiver improves the immunities for the common mode noise and for the supply voltage difference, represented by Vgdp, between the transmitter and receiver sides. Also, the receiver produces a rail-to-rail, full swing output voltage with a balanced duty cycle(50% ${\pm}$ 3%) without external circuits in a SSO environment, which enables correct data recovery. The proposed LVDS I/O circuits have been designed and simulated with 0.18um TSMC library using H-SPICE.

Study on the Design of S/PDIF BC which Can Operate without PLL (PLL없이 동작하는 S/PDIF IC 설계에 관한 연구)

  • Park Ju-Sung;Kim Suk-Chan;Kim Kyoung-Soo
    • The Journal of the Acoustical Society of Korea
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    • v.24 no.1
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    • pp.11-20
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    • 2005
  • In this paper, we deal with the research about a S/PDIF (Sony Philips Digital Interface) receiver which can operate without PLL (Phase Locked Loop) circuits. Although a S/PDIF receiver is used in most audio devices and audio processors in these days. yet there are only few domestic researches about S/PDIF. Currently used commercial DACs (Digital-to-Analog Converters) which can decode S/PDIF signals, have a PLL circuit inside them. The PLL makes it possible to extract clock information from S/PDIF digital signal and to synchronize a clock signal with input signals. But the PLL circuit makes many diffculties in designing the SOC (System On Chips) of VLSIs (Vew Large Scale Integrated Ciruits) because it is an "analog circuit". We proposed a S/PDIF receiver which doesn't have PLL circuits and only has Pure digital circuits. The key idea of the proposed S/PDIF receiver. is to use the ratio between a 16 MHz basic input clock and S/PDIF signals. After having decoded hundreds thousands S/PDIF inputs, it went to prove that a S/PDIF receiver can be designed with pure digital circuits and without any analog circuits such as PLL circuits. We have confidence that the proposed S/PDIF receiver can be used as an IP (Intellectual Property) for the SOC design of the digital circuits.

Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Pre-computation for Memories

  • Cha, Sanguhn;Yoon, Hongil
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.12 no.4
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    • pp.418-425
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    • 2012
  • In this paper, efficient implementation of error correction code (ECC) processing circuits based on single error correction and double error detection (SEC-DED) code with check bit pre-computation is proposed for memories. During the write operation of memory, check bit pre-computation eliminates the overall bits computation required to detect a double error, thereby reducing the complexity of the ECC processing circuits. In order to implement the ECC processing circuits using the check bit pre-computation more efficiently, the proper SEC-DED codes are proposed. The H-matrix of the proposed SEC-DED code is the same as that of the odd-weight-column code during the write operation and is designed by replacing 0's with 1's at the last row of the H-matrix of the odd-weight-column code during the read operation. When compared with a conventional implementation utilizing the odd-weight- column code, the implementation based on the proposed SEC-DED code with check bit pre-computation achieves reductions in the number of gates, latency, and power consumption of the ECC processing circuits by up to 9.3%, 18.4%, and 14.1% for 64 data bits in a word.

Static Corrective Controllers for Implementing Fault Tolerance in Asynchronous Sequential Circuits (정적 교정 제어기를 이용한 비동기 순차 회로의 내고장성 구현)

  • Yang, Jung-Min;Kwak, Seong Woo
    • Journal of the Korean Institute of Intelligent Systems
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    • v.26 no.2
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    • pp.135-140
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    • 2016
  • Corrective controllers enable fault diagnosis and tolerance for various faults in asynchronous sequential circuits without resort to redesign. In this paper, we propose a static corrective controller in order to decrease the size of the controller. Compared with dynamic controllers, static controllers can be made using only combinational circuits, as they need no inner states. We address the existence condition and design procedures for static corrective controllers that overcome state transition faults. To show the validity and advantage, the proposed controller is applied to an SEU error counter implemented on FPGA.

Path Delay Testing for Micropipeline Circuits (마이크로파이프라인 회로를 위한 지연 고장 테스트)

  • Kang, Yong-Seok;Huh, Kyung-Hoi;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.8
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    • pp.72-84
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    • 2001
  • The timings of all computational elements in the micropipeline circuits are important. The previous researches on path delay testing using scan methods make little account of the characteristic of the path delay tests that the second test pattern must be more controllable. In this paper, a new scan latch is proposed which is suitable to path delay testing of the micropipelines and has small area overhead. Results show that path delay faults in the micropipeline circuits using the new scan are testable robustly and the fault coverage is higher than the previous researches. In addition, the new scan latch for path delay faults testing in the micropipeline circuits can be easily expanded to the applications such as BIST for stuck-at faults.

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A New Ac-to-Dc Power Converter for a Load with Frequent Short Circuits (부하단락이 빈번히 발생하는 경우에 적합한 교류-직류 전력변환기)

  • No, Ui-Cheol;Kim, In-Dong
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.48 no.7
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    • pp.384-390
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    • 1999
  • This paper describes a new ac-to-dc power converter using a multilevel converter. A conventional multilevel ac-to-dc converter has large output dc filter capacitors. When a short circuit happens in a load, the stored energy in the capacitors should be discharged through the load with a high short circuit current. The high current may cause considerable damage to the capacitors and the load. The output dc capacitors of the proposed converter do not discharge even under load short circuit condition. In the case of a load short circuit, the capacitors become a floating state immediately and remain in the state. Then the stored capacitor energy is supplied to the load again as soon as the short circuit has been cleared. Therefore, the rising time of the load voltage can be significantly reduced. This feature satisfies the requirement of a power supply for a load with frequent short circuits. The proposed converter has the characteristics of a simplified structure, a reduced cost, weight, and volume compared with conventional power supplies with frequent output short circuits. Experimental results are presented to verify the usefulness of the proposed converter.

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An Efficient 5-Input Exclusive-OR Circuit Based on Carbon Nanotube FETs

  • Zarhoun, Ronak;Moaiyeri, Mohammad Hossein;Farahani, Samira Shirinabadi;Navi, Keivan
    • ETRI Journal
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    • v.36 no.1
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    • pp.89-98
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    • 2014
  • The integration of digital circuits has a tight relation with the scaling down of silicon technology. The continuous scaling down of the feature size of CMOS devices enters the nanoscale, which results in such destructive effects as short channel effects. Consequently, efforts to replace silicon technology with efficient substitutes have been made. The carbon nanotube field-effect transistor (CNTFET) is one of the most promising replacements for this purpose because of its essential characteristics. Various digital CNTFET-based circuits, such as standard logic cells, have been designed and the results demonstrate improvements in the delay and energy consumption of these circuits. In this paper, a new CNTFET-based 5-input XOR gate based on a novel design method is proposed and simulated using the HSPICE tool based on the compact SPICE model for the CNTFET at the 32-nm technology node. The proposed method leads to improvements in performance and device count compared to the conventional CMOS-style design.

Design of Ultra Low-Voltage NCL Circuits in Nanoscale MOSFET Technology (나노 MOSFET 공정에서의 초저전압 NCL 회로 설계)

  • Hong, Woo-Hun;Kim, Kyung-Ki
    • Journal of Korea Society of Industrial Information Systems
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    • v.17 no.4
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    • pp.17-23
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    • 2012
  • Ultra low-power design and energy harvesting applications require digital systems to operate under extremely low voltages approaching the point of balance between dynamic and static power consumption which is attained in the sub-threshold operation mode. Delay variations are extremely large in this mode. Therefore, in this paper, a new low-power logic design methodology using asynchronous NCL circuits is proposed to reduce power consumption and not to be affected by various technology variations in nanoscale MOSFET technology. The proposed NCL is evaluated using various benchmark circuits at 0.4V supply voltage, which are designed using 45nm MOSFET predictive technology model. The simulation results are compared to those of conventional synchrouns logic circuits in terms of power consumption and speed.

A Study on Fault Detection Scheme on TMRed Circuits (삼중화된 회로에서의 결함 감지를 위한 방법에 관한 연구)

  • Kang, Dong-Soo;Lee, Jong-Kil;Jhang, Kyoung-Son
    • Proceedings of the Korean Information Science Society Conference
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    • 2011.06b
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    • pp.313-316
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    • 2011
  • SRAM-based FPGAs are very sensitive to single event upset(SEU) induced by space irradiation. To mitigate SEU effects, space applications employ some mitigation schemes. The triple modular redundancy(TMR) is a well-known mitigation scheme. It uses one or three voters as well as three identical blocks performing the same work. The voters can mask out one error in the outputs from the three replicated blocks. One SEU error in TMRed circuits can be masked but it needs to be detected for some reasons such as to analyze the SEU effects in the satellite or to recover the circuits from the error before additional error occur. In this paper, we developed a fault detection circuit and reporting system to detect a fault on the TMRed circuits. To verify our error detection circuit and reporting circuit, we performed an irradiation test at MC-50 Cyclotron. Experimental results showed that error detection circuit can detect a fault on the TMRed test circuit in radiation environment.

DDS를 이용한 중단파대 국ㆍ영문용 DSC/NBDP 개발에 관한 연구

  • 유형열;김기문
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.3 no.4
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    • pp.805-817
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    • 1999
  • In this paper, the needs for introduction and adoption of MㆍHF DSC/NBDP system and for developments of its circuits and call sequences for use in the maritime mobile services for small-ships, leisure-ships and fishing ships are analyzed, discussed. Also design and implement for MㆍHF(1.6-4MHz) DSC/NBDP system is discussed. Most of casualties have been arisen from small-ships and fishing ships during last 5 years. So, the SAR schematic plans should been prepared to prevent casualties and facilitate the activities of SAR for those ships. DSC/NBDP for MㆍHF system is able to fulfill the roles of efficient SAR communication functions, and to advance the SAR system to small ships and fishing ships. This study is focused on the techniques of processing the DSC call sequences and the ARQ sequences of NBDP system. Especially ARQ sequences are expanded into processing of Korean letters, designed the call sequences and code conversion algorithm for Korean-code. It will be evaluated the availability of Korean-NBDP system. In designing the Transmitting circuits and Receiving circuits, for the carrier generation, DDS(Direct Digital Synthesizer) is used in stead of the Phase Locked Loop and frequency conversion by the mixer, BPF. And PSK modulation signals are directly generated by the controls of DDS, which show the characteristics of Spurious Free Dynamic Range are below -62dBc. Also, the monolithic U subsystem IC which provides various functional components, AD608 is used for designing the receiving circuitsㆍAnd the algorithm of Phasing methode for FSK demodulation are devised to process IF frequency 455kHz in the IF circuits.

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