한국정보과학회:학술대회논문집 (Proceedings of the Korean Information Science Society Conference)

한국정보과학회 (Korean Institute of Information Scientists and Engineers)
권호 표지

삼중화된 회로에서의 결함 감지를 위한 방법에 관한 연구

A Study on Fault Detection Scheme on TMRed Circuits

  • 강동수 (충남대학교 컴퓨터 공학과) ;
  • 이종길 (충남대학교 컴퓨터 공학과) ;
  • 장경선 (충남대학교 컴퓨터 공학과)
  • Kang, Dong-Soo (Dept. of Computer Engineering ChungNam National University) ;
  • Lee, Jong-Kil (Dept. of Computer Engineering ChungNam National University) ;
  • Jhang, Kyoung-Son (Dept. of Computer Engineering ChungNam National University)
  • 발행 : 2011.06.29

⟨ 이전 논문 다음 논문 ⟩

초록

SRAM-based FPGAs are very sensitive to single event upset(SEU) induced by space irradiation. To mitigate SEU effects, space applications employ some mitigation schemes. The triple modular redundancy(TMR) is a well-known mitigation scheme. It uses one or three voters as well as three identical blocks performing the same work. The voters can mask out one error in the outputs from the three replicated blocks. One SEU error in TMRed circuits can be masked but it needs to be detected for some reasons such as to analyze the SEU effects in the satellite or to recover the circuits from the error before additional error occur. In this paper, we developed a fault detection circuit and reporting system to detect a fault on the TMRed circuits. To verify our error detection circuit and reporting circuit, we performed an irradiation test at MC-50 Cyclotron. Experimental results showed that error detection circuit can detect a fault on the TMRed test circuit in radiation environment.

키워드

과제정보

연구 과제 주관 기관 : National Research Foundation of Korea(NRF)