• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.3
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• pp.101-108
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• 2004

A 16-bit adiabatic ALU(arithmetic logic unit) is designed. A simplified four-phase clock generator is also designed to provide supply clocks for the adiabatic circuits. All the clock line charge on the capacitive interconnections is recovered to recycle energy. Adiabatic circuits are designed based on ECRL (efficient charge recovery logic) using a 0.35${\mu}{\textrm}{m}$ CMOS technology. The post-layout simulation results show that the power consumption of the adiabatic ALU including supply clock generator is reduced by a factor of 1.15-1.77 compared to the conventional CMOS ALU with the same structure.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.2
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• pp.63-75
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• 1993

As the CMOS technology becomes the most dominant circuit realization method, the cost problem for the test which includes both the transistor-level FET stuck-on and stuck-off faults and the gatelevel stuck-at faults becomes more and more serious. In accordance, this paper proposes a test set and its generation algorithm, which handles both the transistor-level faults and the gate-level faults, thus can unify the test steps during the IC design and fabrication procedure. This algorithm uses only the logic equation of the given logic function as the input resource without referring the transistor of gate circuit. Also, the resultant test set from this algorithm can improve in both the complexity of the generation algorithm and the time to apply the test as well as unify the test steps in comparing the existing methods.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.9
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• pp.1-9
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• 1994

This paper analyzes the faults and their mechanism of CMOS ICs using IDDQ testing technique and evalutes the reliability of the chips that fail this test. It is implemented by the three testing phases, initial test, burn-in and life test. Each testing phase includes the parametric test, functional test, IDDQ test and propagation delay test. It is shown that the short faults such as gate-oxide short, bridging can be only detected by IDDQ testing technique and the number of test patterns for this test technique is very few. After first burn-in, the IDDQ of some test chips is decreased, which is increased in conventional studies and in subsequent burn-in, the IDDQ of all test chips is stabilized. It is verified that the resistive short faults exist in the test chips and it is deteriorated with time and causes the logic fault. Also, the new testing technique which can easily detect the rsistive short fault is proposed.

• Proceedings of the KIEE Conference
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• 1988.07a
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• pp.278-281
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• 1988

This paper realizes the multi-output truncated difference circuits using current mode CMOS, and presents the algorithm designing multi - valued logic functions of a given multivalued truth tables. This algorithm divides the discrete valued functions and the interval functions, and transforms them into the truncated difference functions. The transformed functions are realized by current mode CMOS. The technique presented here is applied to MOD4 addition circuit and GF(4) multiplication circuit.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.176-186
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• 1996

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

• Proceedings of the IEEK Conference
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• 2002.06b
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• pp.165-168
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• 2002

As the demand for higher data-rate chip-to-chip communication such as memory-to-controller, processor-to-processor increases, low cost high-speed serial links\ulcorner become more attractive. This paper describes a 0.25-fm CMOS 1.6Gbps/pin 4-level transceiver using Stub Series Terminated Logic for high Bandwidth. For multi-gigabit/second application, the data rate is limited by Inter-Symbol Interference (ISI) caused by channel low pass effects, process-limited on-chip clock frequency, and serial link distance. The proposed transceiver uses multi-level signaling (4-level Pulse Amplitude Modulation) using push-pull type, double data rate and flash sampling. To reduce Process-Voltage-Temperature Variation and ISI including data dependency skew, the proposed high-speed calibration circuits with voltage swing controller, data linearity controller and slew rate controller maintains desirable output waveform and makes less sensitive output. In order to detect successfully the transmitted 1.6Gbps/pin 4-level data, the receiver is designed as simultaneous type with a kick - back noise-isolated reference voltage line structure and a 3-stage Gate-Isolated sense amplifier. The transceiver, which was fabricated using a 0.25 fm CMOS process, performs data rate of 1.6 ~ 2.0 Gbps/pin with a 400MHB internal clock, Stub Series Terminated Logic ever in 2.25 ~ 2.75V supply voltage. and occupied 500 * 6001m of area.

• IEIE Transactions on Smart Processing and Computing
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• v.2 no.4
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• pp.248-254
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• 2013

The size and power consumption of digital circuits including the dimming circuit part will increase for high-performance solid state lighting (SSL) systems in the future. This study examined the low-power consumption of adiabatic dynamic CMOS logic (ADCL) due to the principles of adiabatic charging. Furthermore, the designed low-power ADCL digital pulse width modulation (PWM) was optimized for SSL dimming systems. For this purpose, an ADCL digital 3-bit PWM was optimized in two steps. In the first step, the architecture of the ADCL digital 3-bit PWM was miniaturized. In the second step, the clock cut-off circuit was designed and added to the ADCL PWM. As a result, compared to the original configuration, 60 transistors and 15 capacitors of ADCL digital 3-bit PWM were reduced for miniaturization. Moreover, the clock cut-off circuit, which controls wake-up and sleep mode of ADCL D-FFs, was designed. The power consumption of an optimized ADCL digital PWM for all bit patterns decreased by 54 %.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.10
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• pp.173-184
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• 1994

BiCMOS circuits mixed with CMOS and bipolar technologies show peculiar fault characteristics that are different from those of other technoloties. It has been reported that because most of short faults in BiCMOS circuits cause logically intermediate level at outputs, current monitoring method is required to detect these faluts. However current monitoring requires additional hardware capabilities in the testing equipment and evaluation of test responses can be more difficult. In this paper, we analyze the characteristics of faults in BiCMOS circuit together with their test methods and propose a new design technique for testability to detect the faults by logic monitoring. An effective method to detect the transition delay faults induced by performance degradation by the open or short fault of bipolar transistors in BiCMOS circuits is presented. The proposed design-for-testability methods for BiCMOS circuits are confirmed by the SPICE simulation.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.28B no.11
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• pp.859-865
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• 1991

The paper proposes a design of high-speed dynamic CMOS PLA (Programmable Logic Array) which performs stable circuit operation. The race problem which nay occur in a NOR-NOR implementation of PLA is free in the proposed dynamic CMOS PLA by delaying time between the clocks to the AND- and to the OR-planes. The delay element has the same structure as the product line of the longest delay in the AND p`ane. Therefore it is unnecessary to design the delay element or to calculate correct delay time. The correct delay generated by the delay element makes the dynamic CMOS PLA to perform correct and stable circuit operation. Theproposed dynamic CMOS PLA has few variation of switching delay with the increasing number of inputs or outputs in PLA. It is verified by SPICE circuit simulation that the proposed dynamic CMOS PLA has the better performance over existing dynamic CMOS PLA's.