• Journal of IKEEE
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• v.22 no.2
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• pp.514-517
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• 2018

In sensor systems, ADC (analog-to-digital converter) demands high resolution, low power consumption, and high signal bandwidth. Sigma-delta ADC achieves high resolution by high order structure and high over-sampling ratio, but it suffers from high power consumption and low signal bandwidth. SAR (successive-approximation-register) ADC achieves low power consumption, but there is a limitation to achieve high resolution due to process mismatch. This paper surveys architecture improvement of ADC to overcome these problems.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.18 no.1
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• pp.129-134
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• 2014

This paper presents a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) which consists of a digital-to-analog converter (DAC), a SAR logic, and a comparator. The designed asynchronous SAR ADC with a rail-to-rail input range uses a binary weighted DAC using metal-oxide-metal (MOM) capacitor to improve sampling rate. The proposed 10-bit 10-MS/s asynchronous SAR ADC is fabricated using a 0.18-${\mu}m$ CMOS process and its active area is $0.103mm^2$. The power consumption is 0.37 mW when the voltage of supply is 1.1 V. The measured SNDR are 54.19 dB and 51.59 dB at the analog input frequency of 101.12 kHz and 5.12 MHz, respectively.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.20 no.12
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• pp.2317-2325
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• 2016

This paper presents a 10 bit successive approximation register (SAR) analog-to-digital converter (ADC) with a reference driver. The proposed SAR ADC consists of a capacitive digital-to-analog converter (CDAC), a comparator, a SAR logic, and a reference driver which improves the immunity to the power supply noise. The reference driver generates the reference voltages of 0.45 V and 1.35 V for the SAR ADC with an input voltage range of ${\pm}0.9V$. The SAR ADC is implemented using a $0.18-{\mu}m$ CMOS technology with a 1.8-V supply. The proposed SAR ADC including the reference driver almost maintains an input voltage range to be ${\pm}0.9V$ although the variation of supply voltage is +/- 200 mV. It consumes 5.32 mW at a sampling rate of 10 MS/s. The measured ENOB, DNL, and INL of the ADC are 9.11 bit, +0.60/-0.74 LSB, and +0.69/-0.65 LSB, respectively.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.7
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• pp.42-48
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• 1994

In this paper, a low power and high speed flash Analog-to-Digital Converter using current-mode concept is proposed. Current-mode approach offers a number of advantages over conventional voltage-mode approach, such as lower power consumption small chip area improved accuracy etc. Rescently this concept was applied to algorithmic A/D Converter. But, its conversion speed is limited to medium speed. Consequently this converter is not applicable to the high speed signal processing system. This ADC is fabricated in 1.2um double metal CMOS standard process. This ADC's conversion time is measured to be 7MHz, and power consumption is 2.0mW, and differential nonlinearity is less than 1.14LSB and total harmonic distortion is -50dB. The active area of analog chip is about 350 x 550u$m^2$. The proposed ADC seems suitable for a single chip design of digital signal processing system required high conversion speed, high resolution small chip area and low power consumption.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.220-228
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• 1995

An optimized 4-stage 12-bit pipelined CMOS analog-to-digital converter (ADC) architecture is proposed to obtain high linearity and high yield. The ADC based on a multiplying digital-to-analog converter (MDAC) selectively employs a binary-weighted-capacitor (BWC) array in the front-end stage and a unit-capacitor (UC) array in the back-end stages to improve integral nonlinearity (INL) and differential nonlinearity (DNL) simultaneously whil maintaining high yield. A digital-domain nonlinear error calibration technique is applied in the first stage of the ADC to improve its accuracy to 12-bit level. The largest DNL error in the mid-point code of the ADC is reduced by avoiding a code-error symmetry observed in a conventional digitally calibrated ADC is reduced by avoiding a code-error symmetry observed in a conventional digitally calibrated ADC is simulated to prove the effectiveness of the proposed ADC architecture.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.8
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• pp.1255-1259
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• 1990

A new ripple analog-to-digital converter (ADC) has been developed. It consists of two parallel ADCs and a switching network. The circuit operates on the analog input signal in two serial steps. First, a coarse conversion is made to determine the most significant bits by the first parallel ADC. The resultant bits control the switching network to connect a series resistor segment, within which the analog signal is contained, to the second parallel ADC. At second step, a fine conversion is made to determine the least significant bits by the second parallel ADC. The circuit requires 2(2\ulcorner\ulcorner1) comparators, 2(2\ulcorner\ulcorner resistors, and 2(2\ulcorner\ulcorner swithches for N-bit resolution.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.88-90
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• 2012

This paper describes a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with a rail-to-rail input range. The proposed SAR ADC consists of a capacitor digital-analog converter (DAC), a SAR logic and a comparator. To reduce the frequency of an external clock, the internal clock which is asynchronously generated by the SAR logic and the comparator is used. The time-domain comparator with a offset calibration technique is used to achieve a high resolution. To reduce the power consumption and area, a split capacitor-based differential DAC is used. The designed asynchronous SAR ADC is fabricated by using a 0.18 um CMOS process, and the active area is $420{\times}140{\mu}m^2$. It consumes the power of 0.818 mW with a 1.8 V supply and the FoM is 91.8 fJ/conversion-step.

• International Journal of Internet, Broadcasting and Communication
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• v.5 no.2
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• pp.11-14
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• 2013

This paper describes the sigma-delta ADC/DAC digital block with two channels. The ADC block has comb filter and three half band filters. And the DAC block has 5th Cascaded-of-Integrators Feedback DSM. The ADC and DAC support I2S, RJ, LJ and selectable input data modes of 24bit, 20bit, and 16bit. It is fabricated with 0.35um Hynix standard CMOS cell library. The chip size is 3700*3700um. It has been verified using NC Verilog Simulator and Matlab Tool.

• Journal of information and communication convergence engineering
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• v.10 no.1
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• pp.85-90
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• 2012

A 40-MS/sec 10-bit pipelined analog to digital converter (ADC) with a 1.2 Vpp differential input signal is proposed. The implemented pipelined ADC consists of eight stages of 1.5 bit/stage, one stage of 2 bit/stage, a digital error correction block, band-gap reference circuit & reference driver, and clock generator. The 1.5 bit/stage consists of a sub-ADC, digital to analog (DAC), and gain stage, and the 2.0 bit/stage consists of only a 2-bit sub-ADC. A bootstrapped switch with a constant resistance is proposed to improve the linearity of the input switch. It reduces the maximum VGS variation of the conventional bootstrapped switch by 67%. The proposed bootstrapped switch is used in the first 1.5 bit/stage instead of a sample-hold amplifier (SHA). This results in the reduction of the hardware and power consumption. It also increases the input bandwidth and dynamic performance. A reference voltage for the ADC is driven by using an on-chip reference driver without an external reference. A digital error correction with a redundancy is also used to compensate for analog noise such as an input offset voltage of a comparator and a gain error of a gain stage. The proposed pipelined ADC is implemented by using a 0.18-${\mu}m$ 1- poly 5-metal CMOS process with a 1.8 V supply. The total area including a power decoupling capacitor and the power consumption are 0.95 $mm^2$ and 51.5 mW, respectively. The signal-to-noise and distortion ratio (SNDR) is 56.15 dB at the Nyquist frequency, resulting in an effective number of bits (ENOB) of 9.03 bits.

• IEIE Transactions on Smart Processing and Computing
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• v.4 no.3
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• pp.189-193
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• 2015

This paper provides the design techniques of a successive approximation register (SAR) type 12b analog-to-digital converter (ADC) for distributed maximum power point tracking (DMPPT) control in a photovoltaic system. Both a top-plate sampling technique and a $V_{CM}$-based switching technique are applied to the 12b capacitor digital-to-analog converter (CDAC). With these techniques, we can implement a 12b SAR ADC with a 10b capacitor array digital-to-analog converter (DAC). To enhance the accuracy of the ADC, a single-to-differential converted DAC is exploited with the dual sampling technique during top-plate sampling. Simulation results show that the proposed ADC can achieve a signal-to-noise plus distortion ratio (SNDR) of 70.8dB, a spurious free dynamic range (SFDR) of 83.3dB and an effective number of bits (ENOB) of 11.5b with bipolar CMOS LDMOD (BCDMOS) $0.35{\mu}m$ technology. Total power consumption is 115uW under a supply voltage of 3.3V at a sampling frequency of 1.25MHz. And the figure of merit (FoM) is 32.68fJ/conversion-step.