• Journal of IKEEE
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• v.25 no.2
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• pp.302-308
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• 2021

A 12-bit 10-MS/s pipeline analog-to-digital converter (ADC) is proposed for image processing applications. The proposed pipeline ADC consists of a sample and hold amplifier, three stages, a 3-bit flash analog-to-digital converter, and a digital error corrector. Each stage is operated by using a 4-bit flash ADC (FADC) and a multiplying digital-to-analog converter (MDAC). The proposed sample and hold amplifier increases the voltage gain using gain boosting for the ADC with high resolution. The proposed pipelined ADC is designed using a 180-nm CMOS process with a supply voltage of 1.8 and it has an effective number of bit (ENOB) of 10.52 bits at sampling rate of 10MS/s for a 1-V_pp differential sinusoidal analog input with frequency of 1 MHz. The measured ENOB is 10.12 bits when the frequency of the sinusoidal analog input signal is a Nyquist frequency of approximately 5 MHz.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.6
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• pp.567-572
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• 2004

This paper shudies an automatic gain control(AGC) algorithm used in wireless communication cellular systems. The AGC design includes the selection of the appropriate analog-to-digital converter(ADC) and keeping the input power to the ADC constant to minimize the quantization noise generated from the analog-to-digital conversion process. In this paper the process to determine the required precision or the An is illustrated and the method to set the design parameters of the AGC is proposed. And the validity of the proposed algorithm is verified by computer simulation.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.33 no.5C
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• pp.378-385
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• 2008

This paper has been designed with CMOS Analog-to-Digital Converter(ADC) to use a high speed embedded system. It used flash ADC with a voltage estimator and comparator for background developed autozeroing. The speed of this architecture is almost similar to conventional flash ADC but the die size are lower due to reduced numbers of comparators and associated circuity. This ADC is implemented in a $0.25{\mu}m$ pure digital CMOS technology.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.3
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• pp.300-311
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• 2016

The analog-to-digital-converter-based (ADC-based) backplane receivers that consist of a front-end ADC followed by a digital equalizer are gaining more popularity in recent years, as they support more sophisticated equalization required for high data rates, scale better with fabrication technology, and are more immune to PVT variations. Unfortunately, designing an ADC-based receiver that meets tight power and performance budgets of high-speed backplane link systems is non-trivial as both front-end ADC and digital equalizer can be power consuming and complex when running at high speed. This paper reviews the state of art designs for the front-end ADC and digital equalizers to suggest implementation choices that can achieve high speed while maintaining low power consumption and complexity. Design-space exploration using system-level models of the ADC-based receiver allows through analysis on the impact of design parameters, providing useful information in optimizing the power and performance of the receiver at the early stage of design. The system-level simulation results with newer device parameters reveal that, although the power consumption of the ADC-based receiver may not comparable to the receivers with analog equalizers yet, they will become more attractive as the fabrication technology continues to scale as power consumption of digital equalizer scales well with process.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.1
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• pp.28-35
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• 2007

This paper presents a high-speed flash analog-to-digital converter (ADC) for ultra wide band (UWB) receivers. In this flash ADC, the interpolating technique is adopted to reduce the number of the amplifiers and a linear and wide-bandwidth interpolating amplifier is presented. For this ADC, the transistor size for the cascaded stages is inversely scaled to improve the trade-off in bandwidth and power consumption. The active inductor peaking technique is also employed in the pre-amplifiers of comparators and the track-and-hold circuit to enhance the bandwidth. Furthermore, a digital-to-analog converter (DAC) is embedded for the sake of measurements. This chip has been fabricated in $0.13{\mu}m$ 1P8M CMOS process and the total power consumption is 113mW with 1V supply voltage. The ADC achieves 4-bit effective number of bits (ENOB) for input signal of 200MHz at 5-GSample/sec.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.110-113
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• 1998

An analysis of the relationship between a linear amplifier chain and an analog-to-digital converter(ADC) in a digital microwave widevand receiver, with respect to sensitivity and dynamic range issues, is presented. The effects of gain, third-order intermodulation products and ADC characteristics on the performance of the receiver are illustrated and design criteria for the linear amplifier chain given a specified ADC are developed. A computer program is used to calculate theretical receiver performance based on gain and third-order intermodulation product selections. Simulated results are also presented and compared with theoretical values.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.1 s.343
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• pp.65-70
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• 2006

An image sensor has limited dynamic range while the human eye has logarithmic response over wide range of light intensity. Although the sensor gain can be set high to identify details in darker area on the image, this results in saturation in brighter area. The gamma correction is essential to fit the human eye response. However, the digital gamma correction degrades image quality especially for darker area on the image due to the limited ADC resolution and the dynamic range. This Paper proposes a CMOS image sensor (CIS) with a nonlinear analog-to-digital converter (AU) which performs analog gamma correction. The CIS with the proposed nonlinear analog-to-digital conversion scheme was fabricated with a $0.35{\mu}m$ CMOS process. The analog gamma correction using the proposed nonlinear ADC CIS provides the 2.2dB peak-signal-to-noise-ratio(PSM) improved image qualify than conventional digital gamma correction. The PSNR of the image obtain from the digital gamma correction is 25.6dB while it is 27.8dB for analog gamma correction. The PSNR improvement over digital gamma correction is about $28.8\%$.

• Journal of Sensor Science and Technology
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• v.26 no.3
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• pp.155-159
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• 2017

The analog-to-digital converter (ADC) is an important component in various fields of sensor signal processing. This paper presents an expandable flash analog-to-digital converter (E-flash ADC) for sensor signal processing using a comparator, a subtractor, and a multiplexer (MUX). The E-flash ADC was simulated and designed in $0.35-{\mu}m$ standard complementary metal-oxide semiconductor (CMOS) technology. For operating the E-flash ADC, input voltage is supplied to the inputs of the comparator and subtractor. When the input voltage is lower than the reference voltage, it is outputted through the MUX in its original form. When it is higher than the reference voltage, the reference voltage is subtracted from the input value and the resulting voltage is outputted through the MUX. Operation of the MUX is determined by the output of the comparator. Further, the output of the comparator is a digital code. The E-flash ADC can be expanded easily.

• Journal of Korea Society of Digital Industry and Information Management
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• v.13 no.3
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• pp.35-42
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• 2017

This paper presents hardware implementation of background timing-skew calibration technique for time-interleaved analog-to-digital converters (TI ADCs). The timing skew between any two adjacent analog-digital (A/D) channels is detected by using pure digital Finite Impulse Response (FIR) delay filter. This paper includes hardware architecture of the system, main units and small sub-blocks along with control logic circuits. Moreover, timing diagrams of logic simulations using ModelSim are provided and discussed for further understanding about simulations. Simulation process in MATLAB and Verilog is also included and provided with basic settings need to be done. For hardware implementation it not practical to work with all samples. Hence, the simulation is conducted on 512 TI ADC output samples which are stored in the buffer simultaneously and the correction arithmetic is done on those samples according to the time skew algorithm. Through the simulated results, we verified the implemented hardware is working well.

• Journal of the Institute of Electronics and Information Engineers
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• v.54 no.6
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• pp.30-39
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• 2017

A digital calibration technique based on digital-domain averaging for cyclic ADC is proposed. The proposed calibration compensates for nonlinearity of ADC due to capacitance mismatch of capacitors in 1.5-bit/stage MDAC. A 1.5-bit/stage MDAC with non-matched capacitors has symmetric residue plots with respect to the ideal residue plot. This intrinsic characteristic of residue plot of MDAC is reflected as symmetric A/D transfer functions. A corrected A/D transfer function can be acquired by averaging two transfer functions with non-linearity, which are symmetric with respect to the ideal analog-digital transfer function. In order to implement the aforementioned averaging operation of analog-digital transfer functions, a 12-bit cyclic ADC of this work defines two operational modes of 1.5-bit/stage MDAC. By operating MDAC as the first operational mode, the cyclic ADC acquires 12.5-bits output code with nonlinearity. For the same sampled input analog voltage, the cyclic ADC acquires another 12.5-bits output code with nonlinearity by operating MDAC as the second operational mode. Since analog-digital transfer functions from each of operational mode of 1.5-bits/stage MDAC are symmetric with respect to the ideal analog-digital transfer function, a corrected 12-bits output code can be acquired by averaging two non-ideal 12.5-bits codes. The proposed digital calibration and 12-bit cyclic ADC are implemented by using a $0.18-{\mu}m$ CMOS process in the form of full custom. The measured SNDR(ENOB) and SFDR are 65.3dB (10.6bits) and 71.7dB, respectively. INL and DNL are measured to be -0.30/-0.33LSB and -0.63/+0.56LSB, respectively.