• JSTS:Journal of Semiconductor Technology and Science
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• v.4 no.3
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• pp.168-173
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• 2004

A low power CMOS receiver baseband analog circuit based on alternating filter and gain stage is reported. For the given specifications of the baseband analog block, optimum allocation of the gain, IIP3 and NF of the each block was performed to minimize current consumption. The fully integrated receiver BBA chain is fabricated in $0.18\;{\mu}m$ CMOS technology and IIP3 of 30 dBm with a gain of 55 dB and noise figure of 31 dB are obtained at 4.86 mW power consumption.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.13 no.1
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• pp.8-16
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• 2020

In this paper, a single-bit 2nd-order delta-sigma modulator with the architecture of cascaded-of-integrator feedforward (CIFF) is proposed for column-parallel analog-to-digital converter (ADC) array used in a low noise CMOS image sensor. The proposed modulator implements two switched capacitor integrators and a single-bit comparator within only 10-㎛ column-pitch for column-parallel ADC array. Also, peripheral circuits for driving all column modulators include a non-overlapping clock generator and a bias circuit. The proposed delta-sigma modulator has been implemented in a 110-nm CMOS process. It achieves 88.1-dB signal-to-noise-and-distortion ratio (SNDR), 88.6-dB spurious-free dynamic range (SFDR), and 14.3-bit effective-number-of-bits (ENOB) with an oversampling ratio (OSR) of 418 for 12-kHz bandwidth. The area and power consumption of the delta-sigma modulator are 970×10 ㎛2 and 248 ㎼, respectively.

• Journal of the Korean Institute of Telematics and Electronics
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• v.26 no.1
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• pp.62-68
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• 1989

In this paper, Analog/Digital BCDMOS technology that the bipolar devices for driver applications CMOS devices for logic applications, and DMOS devices for high voltage applications is pressented. An optimized poly-gate p-well CMOS process is chosen to fabricate the BCDMOS, and the basic concepts to desigh these devices are to improve the characteristics of bipolar, CMOS & DMOS with simple process technology. As the results, $h_{FE}$ value is 320 (Ib-$10{\mu}A$ for bipolar npn transistor, and there is no short channel effects for CMOS devices which have Leff to $1.25{\mu}m$ and $1.35{\mu}m$ for n-channel and p-channel, respectively. Finally, breakdown voltage is obtained higher than 115V for DMOS device.

• Journal of IKEEE
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• v.13 no.1
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• pp.41-48
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• 2009

This paper describes an implementation of the analog front end (AFE) incorporated with the image signal processing (ISP) unit in the SoC, dominating the performance of the CCD image sensor system. New schemes are exploited in the high-frequency sampling to reduce the sampling uncertainty apparently as the frequency increases, in the structure for the wide-range variable gain amplifier (VGA) capable of $0{\sim}36\;dB$ exponential gain control to meet the needed bandwidth and accuracy by adopting a new parasitic insensitive capacitor array. Moreover, the double cancellation of the black-level noise was efficiently achieved both in the analog and the digital domain. The proposed topology fabricated in a $0.35-{\mu}m$ CMOS process was proved in a full CCD camera system of 10-bit accuracy, dissipating 80 mA at 15 MHz with a 3.3 V supply voltage.

• The Transactions of the Korea Information Processing Society
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• v.2 no.1
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• pp.66-74
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• 1995

A 8-bit 15MHz CMOS subranging Analog-to-Digital converter for high-speed, low-power consumption applications is described. Subranging, 2 step flash, A/D converter used a new resistor string and a simple comparator architecture for the low power consumption and small chip area. Comparator exhibites 80dB loop gain, 50MHz conversion speed, 0.5mV offset and maximum error of voltage divider was 1mV. This Analog-to-Digital converter has been designed and fabricated in 1.2 m N-well CMOS technology. It consumed 150mW power at ＋5/-5V supply and delayed 65ns. The proposed Analog-to-Digital converter seems suitable for high- speed, low-power consumption, small area applications and one-chip mixed Analog- Digital system. Simulations are performed with PSPICE and a fabricated chip is tested.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.4
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• pp.32-42
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• 2007

The substrate resistance is modeled to estimate the performance degradation of analog circuits by substrate noise in a $0.35{\mu}m$ twin-well non-epitaxial CMOS process. The substrate resistance model equations are applied to the P+ guard-ring isolation structure and a good match was achieved between measurements and models. The substrate resistance is divided into four types and a semi-empirical model equation is obtained for each type of substrate resistance. The rms(root-mean-square) error of the substrate resistance model is below 10% compared with the measured resistance. To apply this substrate resistance model to the P+ guard ring structure, ADS(Advanced Design System) circuit simulation results are compared with the measurement results using Network Analyzer, and relatively good agreements are obtained between measurements and simulations.

• Journal of Sensor Science and Technology
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• v.26 no.3
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• pp.155-159
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• 2017

The analog-to-digital converter (ADC) is an important component in various fields of sensor signal processing. This paper presents an expandable flash analog-to-digital converter (E-flash ADC) for sensor signal processing using a comparator, a subtractor, and a multiplexer (MUX). The E-flash ADC was simulated and designed in $0.35-{\mu}m$ standard complementary metal-oxide semiconductor (CMOS) technology. For operating the E-flash ADC, input voltage is supplied to the inputs of the comparator and subtractor. When the input voltage is lower than the reference voltage, it is outputted through the MUX in its original form. When it is higher than the reference voltage, the reference voltage is subtracted from the input value and the resulting voltage is outputted through the MUX. Operation of the MUX is determined by the output of the comparator. Further, the output of the comparator is a digital code. The E-flash ADC can be expanded easily.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.609-612
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• 2002

In this paper, a 12-bit 100-MHz CMOS current steering digital-to-analog converter is designed. In the D/A converter, a driver circuit using a dynamic latch is implemented to obtain low glitch and thermometer decoder is used for low DNL errors, guaranteed monotonicity, reduced stitching noise. And a threshold voltage-compensated current source. The D/A converter is designed with 0.35-$\mu m$ CMOS technology at 3.3 V power supply and simulated with HSPICE. The maximum power dissipation of the designed DAC is 143 mW.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.6
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• pp.28-36
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• 1997

In this work, a highly linear video-speed CMOS current-mode digital-to-analog converter (DAC) is proposed. A newswitching scheme for the current cell matrix of the DAC simultaneously reduces graded and symmetrical errors to improve integral nonlinearities (INL). The proposed DAC is designed to operate at any supply voltage between 3V and 5V, and minimizes the glitch energy of analog outputs with degliching circuits developed in this work. The prototype dAC was implemented in a LG 0.8um n-well single-poly double-metal CMOS technology. Experimental results show that the differential and integral nonlinearities are less than .+-. LSB and .+-.0.8LSB respectively. The DAC dissipates 75mW at a 3V single power supply and occupies a chip area of 2.4 mm * 2.9mm.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.6
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• pp.37-43
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• 1997

In this paper, an analog-domain powr-reduction technique for a low-voltage CMOS operational amplifier and its application to clock-based VLSI systems are proposed. The proposed technique cuts off the bias current of the op amp during a half cycle of the clock in the sleeping mode and resumes the curent supply sequentially during the remaining cycle of the clock in the normal operating mode. The proposed sequential sbiasing technique reduces about 50% of the op amp power and improves the circuit performance through high phase margin and stable settling behavior of the output voltage. The power-reduction technique is applied to a sample-and-hold amplifier which is one of the critical circuit blocks used in the front-end stage of analog and/or digital integrated systems. The SHA was simulated and analyzed in a 0.8.mu.m n-well double-poly double-metal CMOS technology.