• Journal of the Korean Data and Information Science Society
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• v.21 no.4
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• pp.813-818
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• 2010

The least squares estimation method for model parameters under failure step-stress accelerated life tests is studied and a numerical example will be given to illustrate the proposed inferential procedures under the compound linear plans proposed as an alternative to the optimal quadratic plan, assuming that the exponential distribution with a quadratic relationship between stress and log-mean lifetime. The proposed compound linear plan for constant stress accelerated life tests and 4:2:1 plan are compared for various situations. Even though the compound linear plan was proposed under constant stress accelerated life tests, we found that this plan did well relatively in failure step-stress accelerated life tests.

• International Journal of Reliability and Applications
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• v.10 no.2
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• pp.101-107
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• 2009

In the accelerated tests, the importance of correct failure analysis must be strongly emphasized. Understanding the failure mechanisms is requisite for designing and conducting successful accelerated life test. Under this presumption, a rational method must be identified to relate the results of accelerated tests quantitatively to the reliability or failure rates in use conditions, using a scientific acceleration transform. Most widely used models for relating the results of accelerated tests quantitatively to the reliability or failure rates in use conditions are an accelerated failure time model and a proportional hazards model. The purpose of this research is to compare the usability of the accelerated failure time model and proportional hazards model in the accelerated life tests.

• Journal of Applied Reliability
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• v.15 no.2
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• pp.84-89
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• 2015

Accelerated life tests are widely used to evaluate the product reliability within a resonable amount of time and cost. This article provides literature review about accelerated life test plans between 2006~2015. The literature on planning accelerated life tests are reviewed with respect to the test scenario, assumed accelerated model and estimation method and optimization criteria. Finally, recommendations for the future research are presented.

• Journal of Applied Reliability
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• v.7 no.3
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• pp.127-136
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• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1391-1393
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• 2008

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

• Proceedings of the Korean Statistical Society Conference
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• 2000.11a
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• pp.235-240
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• 2000

In this paper a test of fit for exponentiality and we propose the estimator of Kullback-Leibler Information functions using the data from accelerated life tests. This acceleration model is assumed to be a tampered random variable model. The procedure is applicable when the exponential parameter based on the data from accelerated life tests is or is not specified under null hypothesis. Using Simulations, the power of the proposed test based on use condition of accelerated life test under alternatives is compared with that of other standard tests in the small sample.

• Communications for Statistical Applications and Methods
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• v.26 no.2
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• pp.131-148
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• 2019

Constant stress partially accelerated life tests are studied according to exponentiated Weibull distribution. Grounded on multiple censoring, the maximum likelihood estimators are determined in connection with unknown distribution parameters and accelerated factor. The confidence intervals of the unknown parameters and acceleration factor are constructed for large sample size. However, it is not possible to obtain the Bayes estimates in plain form, so we apply a Markov chain Monte Carlo method to deal with this issue, which permits us to create a credible interval of the associated parameters. Finally, based on constant stress partially accelerated life tests scheme with exponentiated Weibull distribution under multiple censoring, the illustrative example and the simulation results are used to investigate the maximum likelihood, and Bayesian estimates of the unknown parameters.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.103-111
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• 2017

Purpose: Accelerated degradation tests can speed time to market and reduce the test time and costs associated with long term reliability tests to verify the required service life of a product or material. This paper proposes a service life prediction method for components or materials using an accelerated degradation tests based on the relationships between temperature and the rate of failure-causing chemical reaction. Methods: The relationship between performance degradation and the rate of a failure-causing chemical reaction is assumed and least square estimation is used to estimate model parameters from the degradation model. Results: Methods of obtaining acceleration factors and predicting service life using the degradation model are presented and a numerical example is provided. Conclusion: Service life prediction of a component or material is possible at an early stage of the degradation test by using the proposed method.

• International Journal of Reliability and Applications
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• v.1 no.2
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• pp.155-165
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• 2000

In this paper, we propose some estimators of Kullback- Leibler Information functions using the data from three step stress accelerated life tests. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

• Journal of Korean Institute of Industrial Engineers
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• v.20 no.1
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• pp.39-51
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• 1994

Almost all accelerated life tests assume that no basic failure mechanism changes within the test stresses. But accelerated life test, considering failure mechanism changes, is needed since failure mechanism changes when accelerating beyond the used stress. This paper studies the analysis when the failure mechanism changes within the test stresses. The piecewise linear regression, which the join point of two lines is estimated, is applied In particular, two accelerated life tests, with and without a change in failure mechanism are examined.