• Journal of IKEEE
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• v.25 no.2
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• pp.302-308
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• 2021

A 12-bit 10-MS/s pipeline analog-to-digital converter (ADC) is proposed for image processing applications. The proposed pipeline ADC consists of a sample and hold amplifier, three stages, a 3-bit flash analog-to-digital converter, and a digital error corrector. Each stage is operated by using a 4-bit flash ADC (FADC) and a multiplying digital-to-analog converter (MDAC). The proposed sample and hold amplifier increases the voltage gain using gain boosting for the ADC with high resolution. The proposed pipelined ADC is designed using a 180-nm CMOS process with a supply voltage of 1.8 and it has an effective number of bit (ENOB) of 10.52 bits at sampling rate of 10MS/s for a 1-V_pp differential sinusoidal analog input with frequency of 1 MHz. The measured ENOB is 10.12 bits when the frequency of the sinusoidal analog input signal is a Nyquist frequency of approximately 5 MHz.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.1
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• pp.28-35
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• 2007

This paper presents a high-speed flash analog-to-digital converter (ADC) for ultra wide band (UWB) receivers. In this flash ADC, the interpolating technique is adopted to reduce the number of the amplifiers and a linear and wide-bandwidth interpolating amplifier is presented. For this ADC, the transistor size for the cascaded stages is inversely scaled to improve the trade-off in bandwidth and power consumption. The active inductor peaking technique is also employed in the pre-amplifiers of comparators and the track-and-hold circuit to enhance the bandwidth. Furthermore, a digital-to-analog converter (DAC) is embedded for the sake of measurements. This chip has been fabricated in $0.13{\mu}m$ 1P8M CMOS process and the total power consumption is 113mW with 1V supply voltage. The ADC achieves 4-bit effective number of bits (ENOB) for input signal of 200MHz at 5-GSample/sec.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.18 no.1
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• pp.129-134
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• 2014

This paper presents a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) which consists of a digital-to-analog converter (DAC), a SAR logic, and a comparator. The designed asynchronous SAR ADC with a rail-to-rail input range uses a binary weighted DAC using metal-oxide-metal (MOM) capacitor to improve sampling rate. The proposed 10-bit 10-MS/s asynchronous SAR ADC is fabricated using a 0.18-${\mu}m$ CMOS process and its active area is $0.103mm^2$. The power consumption is 0.37 mW when the voltage of supply is 1.1 V. The measured SNDR are 54.19 dB and 51.59 dB at the analog input frequency of 101.12 kHz and 5.12 MHz, respectively.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.33 no.5C
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• pp.378-385
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• 2008

This paper has been designed with CMOS Analog-to-Digital Converter(ADC) to use a high speed embedded system. It used flash ADC with a voltage estimator and comparator for background developed autozeroing. The speed of this architecture is almost similar to conventional flash ADC but the die size are lower due to reduced numbers of comparators and associated circuity. This ADC is implemented in a $0.25{\mu}m$ pure digital CMOS technology.

• Journal of Sensor Science and Technology
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• v.26 no.3
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• pp.155-159
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• 2017

The analog-to-digital converter (ADC) is an important component in various fields of sensor signal processing. This paper presents an expandable flash analog-to-digital converter (E-flash ADC) for sensor signal processing using a comparator, a subtractor, and a multiplexer (MUX). The E-flash ADC was simulated and designed in $0.35-{\mu}m$ standard complementary metal-oxide semiconductor (CMOS) technology. For operating the E-flash ADC, input voltage is supplied to the inputs of the comparator and subtractor. When the input voltage is lower than the reference voltage, it is outputted through the MUX in its original form. When it is higher than the reference voltage, the reference voltage is subtracted from the input value and the resulting voltage is outputted through the MUX. Operation of the MUX is determined by the output of the comparator. Further, the output of the comparator is a digital code. The E-flash ADC can be expanded easily.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.6
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• pp.567-572
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• 2004

This paper shudies an automatic gain control(AGC) algorithm used in wireless communication cellular systems. The AGC design includes the selection of the appropriate analog-to-digital converter(ADC) and keeping the input power to the ADC constant to minimize the quantization noise generated from the analog-to-digital conversion process. In this paper the process to determine the required precision or the An is illustrated and the method to set the design parameters of the AGC is proposed. And the validity of the proposed algorithm is verified by computer simulation.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.110-113
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• 1998

An analysis of the relationship between a linear amplifier chain and an analog-to-digital converter(ADC) in a digital microwave widevand receiver, with respect to sensitivity and dynamic range issues, is presented. The effects of gain, third-order intermodulation products and ADC characteristics on the performance of the receiver are illustrated and design criteria for the linear amplifier chain given a specified ADC are developed. A computer program is used to calculate theretical receiver performance based on gain and third-order intermodulation product selections. Simulated results are also presented and compared with theoretical values.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.7
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• pp.42-48
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• 1994

In this paper, a low power and high speed flash Analog-to-Digital Converter using current-mode concept is proposed. Current-mode approach offers a number of advantages over conventional voltage-mode approach, such as lower power consumption small chip area improved accuracy etc. Rescently this concept was applied to algorithmic A/D Converter. But, its conversion speed is limited to medium speed. Consequently this converter is not applicable to the high speed signal processing system. This ADC is fabricated in 1.2um double metal CMOS standard process. This ADC's conversion time is measured to be 7MHz, and power consumption is 2.0mW, and differential nonlinearity is less than 1.14LSB and total harmonic distortion is -50dB. The active area of analog chip is about 350 x 550u$m^2$. The proposed ADC seems suitable for a single chip design of digital signal processing system required high conversion speed, high resolution small chip area and low power consumption.

• Journal of IKEEE
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• v.22 no.2
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• pp.514-517
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• 2018

In sensor systems, ADC (analog-to-digital converter) demands high resolution, low power consumption, and high signal bandwidth. Sigma-delta ADC achieves high resolution by high order structure and high over-sampling ratio, but it suffers from high power consumption and low signal bandwidth. SAR (successive-approximation-register) ADC achieves low power consumption, but there is a limitation to achieve high resolution due to process mismatch. This paper surveys architecture improvement of ADC to overcome these problems.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.20 no.12
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• pp.2317-2325
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• 2016

This paper presents a 10 bit successive approximation register (SAR) analog-to-digital converter (ADC) with a reference driver. The proposed SAR ADC consists of a capacitive digital-to-analog converter (CDAC), a comparator, a SAR logic, and a reference driver which improves the immunity to the power supply noise. The reference driver generates the reference voltages of 0.45 V and 1.35 V for the SAR ADC with an input voltage range of ${\pm}0.9V$. The SAR ADC is implemented using a $0.18-{\mu}m$ CMOS technology with a 1.8-V supply. The proposed SAR ADC including the reference driver almost maintains an input voltage range to be ${\pm}0.9V$ although the variation of supply voltage is +/- 200 mV. It consumes 5.32 mW at a sampling rate of 10 MS/s. The measured ENOB, DNL, and INL of the ADC are 9.11 bit, +0.60/-0.74 LSB, and +0.69/-0.65 LSB, respectively.