Aphid and mite are the major insects that harm corn. These insects are difficult to control because they are very sensitive to environmental conditions. The purpose of this experiment was to information the loss in quantity of corn and to select inbred lines with resistance after exposing corn to aphid and mite. When exposed to aphid, the average loss in grain yield, ear length, ear diameter, 100 kernel weight, kernel length, kernel width, and kernel thickness were 18.4, 10.9, 1.7, 5.4, 2.3, 1.5 and -0.2%, respectively. When exposed to mite, the average loss in grain yield, ear length, ear diameter, 100 kernel weight, kernel length, kernel width, and kernel thickness were 49.7, 16.5, 20.7, 18.9, 9.5, and -3.4, respectively. Mite had more significant impact on the loss than aphid. Among these factors, grain yield and ear dimater were most significantly correlated on the loss to aphid ($r=0.83^{**}$), while kernel length and thickness were most significantly correlated on the loss to mite ($r=0.83^{**}$). However, ear length was not related to loss to the two insects. The inbred lines that were often used for $F_1$ hybrid which was lower than the average loss by aphid, were KS7, B68, 61B3, 70A1, and KS5, while the inbred lines that were often used for $F_1$ hybrid which was lower than the average decrease by mite, were KS7, B68, 61B3, 66B2-4, 70A1, 72B2, and KS5. These inbred lines could be used to breed inbred lines, hybrid, and open pollination variety that confer resistant to aphid and mite.