플래시 EEPROM 셀에서 ONON(oxide-nitride-oxide-nitride) Inter-Poly 유전체막의 신뢰성 연구 (Study of the Reliability Characteristics of the ONON(oxide-nitride-oxide-nitride) Inter-Poly Dielectrics in the Flash EEPROM cells)
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- 전자공학회논문지D
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- 제36D권10호
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- pp.17-22
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- 1999