Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Optical Characteristics of Transparent Privacy Film with SiO2/SiON Multi-Layer

SiO2/SiON 다층박막 적용 투명보안필름의 광특성 연구

  • Sung, Hyeong Seok (Department of Materials Engineering, Korea Polytechnic University) ;
  • Kwon, Jin Gu (Department of Materials Engineering, Korea Polytechnic University) ;
  • Chae, Hee Il (Department of Materials Engineering, Korea Polytechnic University) ;
  • Han, Hyeon Seong (Department of Materials Engineering, Korea Polytechnic University) ;
  • Lee, Seong Eui (Department of Materials Engineering, Korea Polytechnic University)
  • 성형석 (한국산업기술대학교 신소재공학과) ;
  • 권진구 (한국산업기술대학교 신소재공학과) ;
  • 채희일 (한국산업기술대학교 신소재공학과) ;
  • 한현성 (한국산업기술대학교 신소재공학과) ;
  • 이성의 (한국산업기술대학교 신소재공학과)
  • Received : 2019.04.04
  • Accepted : 2019.05.20
  • Published : 2019.07.01
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Abstract

Privacy films are typically manufactured by combining black resin and transparent louver-shaped patterns. The use of black resin results in excellent light-shielding. However, black resin can reduce the transmittance of privacy films at the front viewing angle. In this study, we applied $SiO_2/SiON$ multi-layer thin films on a privacy film to maintain transmittance at the front viewing angle and improve light-shielding at the side viewing angle. We determined the optimum combination of thicknesses of the $SiO_2/SiON$ multi-layer stacks to increase the overall transmittance; the light shielding could be maximized at the side viewing angle.

Keywords

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Fig. 1. Manufacturing process of micro louver patterns.

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Fig. 2. Viewing angle of micro louver patterns.

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Fig. 3. SEM image of micro louver patterns.

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Fig. 4. Viewing angle calculation of privacy film.

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Fig. 5. Transmittance simulation results of privacy film at top viewing angle.

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Fig. 6. Transmittance simulation results of privacy film at 13.24° viewing angle.

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Fig. 7. SEM image of deposited SiO2/SiON multi-layer.

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Fig. 8. Measurement results with Hamamatsu spectrometer at 13.24° viewing angle (550 nm).

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Fig. 9. Anglar characteristic measurement process with spectrometer.

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Fig. 10. Measurement results with Hamamatsu spectrometer at top viewing angle (550 nm).

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Fig. 11. Variation of display effect of SiO2/SiON applied privacy film with varying viewing angle.

Table 1. SiO2/SiON multi-layer deposition condition.

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Table 2. Conditions for the thickness of SiO2/SiON multi-layer.

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