References
- S.W. Tsao, et al. "Hydrogen-induced improvements in electrical characteristics of a-IGZO thin-film transistors." Solid-State Electronics, 54, 2010, pp.1497-1499. https://doi.org/10.1016/j.sse.2010.08.001
-
Chang, S. P. et al. "Efficient suppression of charge trapping in ZnO-based transparent thin film transistors with novel
$Al_2O_3/HfO_2/Al_2O_3$ structure," Appl. Phys. Lett. 92, 2008, pp.192104. https://doi.org/10.1063/1.2924769 - T. Oh, K. S. Kim, K. M. Lee, C. K. Choi, "Generation of SiOC films by the Thermal Induction," Jpn. J. Appl. Phys. 44, 2005, pp.1409-1413. https://doi.org/10.1143/JJAP.44.1409
- S. Akasaka, K. Tamura, K. Nakahara, T. Tanabe, A. Kamisawa, and M. Kawasaki1, "Transparent polymer Schottky contact for a high performance visible-blind ultraviolet photodiode based on ZnO," Appl. Phys. Lett. 93, 2008, pp.123309. https://doi.org/10.1063/1.2989125
-
Nomura, K. et al. "Defect passivation and homogenization of amorphous oxide thin-film transistor by wet
$O_2$ annealing," Appl. Phys. Lett. 93, 2008, pp.192107. https://doi.org/10.1063/1.3020714 - Toshio Kamiy, T., Nomura, K. Hosono, H. "Present status of amorphous In-Ga-Zn-O thin-film transistors," Technol. Adv. Mater. 11, 2010, pp.044305. https://doi.org/10.1088/1468-6996/11/4/044305
- A. Suresh, J. F. Muth, "Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors," Appl. Phys. Lett. 92, 2008, pp.033502. https://doi.org/10.1063/1.2824758
- Q. Mao, Z. Ji and J. Xi, "Realization of forming-free ZnO-based resistive switching memory by controlling film thickness," Appl. Phys. 43(39), 2010, pp.395104.
- Oleg Mitrofanov and Michael Mantra. "Poole-Frenkel electron emission from the traps in AlGaN/GaN transistors," J. Appl. Phys. 95, 2004, pp.6414-6419. https://doi.org/10.1063/1.1719264
-
J. Maserjian, N. Zamani, "Behavior of the
$Si/SiO_2$ interface observed by Fowler Nordheim tunneling," Appl. Phys. Lett. 53, 1982, pp.559-567. - John G. Ssmmons, "Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal Systems," Phys. Rev. 155, 1967, pp.657-660. https://doi.org/10.1103/PhysRev.155.657
- J. Maserjian, "Tunneling in thin MOS structures," J. Vac. Sci. Technol. 11, 1974, pp.996-1003. https://doi.org/10.1116/1.1318719
- S. D. Ganichev, et al. "Distinction between the Poole-Frenkel and tunneling models of electric-field-stimulated carrier emission from deep levels in semiconductors," Phys. Rev B, 61(15), 2000, pp.10361-10365. https://doi.org/10.1103/PhysRevB.61.10361
- T, Oh, C. H. Kim, "Study on Characteristic Properties of Annealed SiOC Film Prepared by Inductively Coupled Plasma Chemical Vapor Deposition," IEEE Trans. Plasma Science, 38, 2010, pp.1598-1602. https://doi.org/10.1109/TPS.2010.2049665
- T. Oh. IEEE Trans. Nanotechnology, 23, 2006, pp.5-10.